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DE-102024132609-A1 - Method for testing at least one electrical insulating device

DE102024132609A1DE 102024132609 A1DE102024132609 A1DE 102024132609A1DE-102024132609-A1

Abstract

Method for testing at least one electrical insulating device (2), in particular for a high-voltage storage device, comprising the steps: - Providing at least one electrical insulating device (2) between two electrical conductor elements (3, 4) which are coupled to a load device (5) of a test apparatus (1); - Applying an electrical test voltage between the conductor elements (3, 4); - dynamic, in particular cyclic, loading of at least one of the conductor elements (3, 4); - Monitoring of a fault current between the conductor elements (3, 4).

Inventors

  • Leon Veliu
  • Gunter Schröter
  • Lara Ozan

Assignees

  • BAYERISCHE MOTOREN WERKE AKTIENGESELLSCHAFT

Dates

Publication Date
20260513
Application Date
20241108

Claims (12)

  1. A method for testing at least one electrical insulating device (2), in particular for a high-voltage storage device, comprising the steps of: - providing at least one electrical insulating device (2) between two electrical conductor elements (3, 4) that are coupled to a load device (5) of a test apparatus (1); - applying an electrical test voltage between the conductor elements (3, 4); - dynamically, in particular cyclically, loading at least one of the conductor elements (3, 4); - monitoring a fault current between the conductor elements (3, 4).
  2. Procedure according to Claim 1 , characterized in that the loading device (5) is designed to transmit a force, in particular a tensile force and/or a compressive force, to the at least one conductor element (3, 4).
  3. Procedure according to Claim 1 or 2 , characterized in that the loading device (5) is designed to transmit a vibration to the at least one conductor element (3, 4).
  4. Method according to one of the preceding claims, characterized in that the loading device (5) is designed to transmit a torsion to the at least one conductor element (3, 4).
  5. Method according to one of the preceding claims, characterized in that the loading device (5) is designed to transfer a load to the conductor elements (3, 4) at a defined angle to a surface of the insulating device (2) facing one of the conductor elements (3, 4), in particular horizontally or vertically.
  6. Method according to one of the preceding claims, characterized in that the loading device (5) is designed to cyclically transfer a load with a defined cycle frequency, in particular 50Hz, to the at least one conductor element (3, 4).
  7. Method according to one of the preceding claims, characterized in that the loading device (5) is configured to transfer a load based on a defined load path to the at least one conductor element (3, 4).
  8. Method according to one of the preceding claims, characterized in that a test particle (10), in particular a metallic one, is introduced between the insulating device (2) and at least one of the conductor elements (3, 4), in particular is pressed into the insulating device (2) with a defined test force.
  9. Method according to one of the preceding claims, characterized in that the fault current is compared with a threshold value and/or that a change in the fault current is determined over a number of cycles.
  10. Method according to one of the preceding claims, characterized in that a test force, in particular detected by means of a force detection device (13), is applied to the conductor elements (3, 4).
  11. Method according to one of the preceding claims, characterized in that at least two insulating devices (2) are received on opposite mountings in a holder device (14).
  12. Test device (1) for testing at least one electrical insulating device (2), in particular for a high-voltage storage device, wherein the test device is used to carry out the method according to is formed according to one of the preceding claims.

Description

The invention relates to a method for testing at least one electrical insulating device, in particular for a high-voltage storage device. The use of electrical insulating devices, for example in high-voltage storage systems used in motor vehicles to store or supply electrical energy, is generally known from the prior art. It is further known that such insulating devices must meet certain requirements. For example, the insulating devices, with respect to a specific voltage of the high-voltage storage system, should electrically isolate components, such as the cells of the high-voltage storage system, from other components, such as a cooling plate or a housing. For this purpose, it is necessary that the insulating device, or any insulating material incorporated into the insulating device, be tested beforehand to ensure that it possesses sufficient insulating properties. During the manufacturing and assembly of the high-voltage storage system, as well as throughout its service life, the insulation can be subjected to mechanical stresses that may impair its performance. For example, dynamic tensile and compressive loads, torsional loads, or vibrations can act on the insulation, or on the conductor elements and be transmitted to the insulation. This can lead to changes in the insulation, causing it to no longer be in its tested or approved condition. In particular, such loads, especially dynamic ones, can weaken the insulation or create a current path, potentially preventing it from adequately meeting the given requirements. It is therefore essential to ensure that the insulation can provide sufficient electrical insulation for the various components of the high-voltage storage system, even under such mechanical stresses occurring throughout its service life. The invention is based on the objective of providing a method for testing at least one electrical insulating device which is improved in comparison, in particular taking into account dynamic loads of the insulating device. The problem is solved by a method according to claim 1. The dependent claims relate to possible embodiments. As described, the invention relates to a method for testing at least one electrical insulating device, in particular for a high-voltage storage device. The method comprises the following steps: - Providing at least one electrical insulating device between two electrical conductor elements coupled to a load device of a test apparatus; - Applying an electrical test voltage between the conductor elements; - dynamic, especially cyclic, loading of at least one of the conductor elements; - Monitoring of a fault current between the conductor elements. Accordingly, in a first process step, an electrical insulating device is provided or arranged between two electrical conductor elements, which are coupled to a loading device of a test fixture. The loading device is fundamentally designed to load the electrical insulating device, for example by applying a force to the conductor elements, or at least one of the conductor elements, to which the insulating device is coupled. An electrical test voltage is applied between the electrical conductor elements. This test voltage can be defined, for example, based on a specific high-voltage storage device. The test voltage can be several hundred volts, specifically 2150 V. While the test voltage is applied between the two electrical conductor elements, a load is dynamically, and in particular cyclically, introduced into at least one of the conductor elements, namely via the previously described load device of the test apparatus, by means of which the insulation device is to be tested. For example, it is possible to transfer dynamic tensile and/or compressive loads, vibrations, or other stresses to the at least one conductor element that, as described, is coupled to the electrical insulating device. For instance, the electrical insulating device is arranged between the two conductor elements and is thus mechanically connected to them. Therefore, if one of the conductor elements is subjected to a mechanical load, the mechanical load is transferred to the insulating device. The procedure also monitors a fault current between the conductor elements. This allows, for example, the determination of whether the electrical insulation device sufficiently isolates the two conductor elements from each other, or whether, for example, due to dynamic factors, a fault current may occur. Under dynamic loads acting on the electrical insulation device, an impermissible fault current can flow between the conductor elements. In particular, it is thus possible to monitor whether the dynamic load impairs the electrical insulation device or damages it over the course of the test procedure. Specifically, cyclic loading of the electrical insulation device can be performed, allowing its behavior over its service life to be simulated and thereby determining whether the electrical insulation device can withstand the loads in a rea