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EP-3627520-B1 - FLEXIBLE APERTURE X-RAY INSPECTION

EP3627520B1EP 3627520 B1EP3627520 B1EP 3627520B1EP-3627520-B1

Inventors

  • SAFAI, MORTEZA

Dates

Publication Date
20260506
Application Date
20190701

Claims (15)

  1. A system (100) for x-ray inspection, the system (100) comprising: an x-ray emitter (102) comprising an x-ray emission port (103) and configured to generate an x-ray emission (104) that passes through the x-ray emission port (103); a first flexible chain (106) movably aligned with the x-ray emitter (102) and comprising a plurality of links (302, 304, 308, 310) pivotably coupled together, in an end-to-end manner, wherein the plurality of links (302, 304, 308, 310) comprises: two or more links configured to block an x-ray emission (104); and an aperture (110) that is configured to allow only a portion (112) of the x-ray emission (104) to pass through the aperture (110) for forming an x-ray beam (112); and a drive system (109) coupled to the x-ray emitter (102) in engagement with the first flexible chain (106), wherein the drive system (109) is configured to advance the aperture (110) of the first flexible chain (106) along the x-ray emission port (103) such that a relative position of the aperture (110) is changed, thereby rastering the x-ray beam (112) along a scanning path (113), characterized in that the aperture (110) is formed in two adjacent links (110A/110B).
  2. The system according to claim 1, wherein the plurality of links (302, 304, 308, 310) are pivotably coupled together at corresponding pivot axes (306) and the aperture (110) has a central axis that is perpendicular to the pivot axis (306).
  3. The system according to claim 1, wherein the plurality of links (302, 304, 308, 310) are pivotably coupled together at corresponding pivot axes (306) and the aperture (110) has a central axis that is parallel to the pivot axis (306).
  4. The system according to any of claims 1-3, wherein one or more of the plurality of links (302, 304, 308, 310) comprises interface structures to facilitate interaction between the one or more of the plurality of links (302, 304, 308, 310) and a drive or support feature.
  5. The system according to any of claims 1-4, wherein one or more of the plurality of links (302, 304, 308, 310) comprises an x-ray shielding layer (804).
  6. The system according to claim 5, wherein one or more of the plurality of links (302, 304, 308, 310) comprises a wear layer (802).
  7. The system according to any of claims 1-6, further comprising a plurality of apertures (110), wherein one or more of the plurality of apertures (110) is separated from an adjacent aperture of the plurality of apertures (110) by at least two links of the plurality of links (302, 304, 308, 310).
  8. The system according to any of claims 1-8, wherein the first flexible chain (106) is advancable in a single direction or in multiple directions to move the x-ray beam (112) along the scanning path (113).
  9. The system according to claim 8, arranged such that the movement of the first flexible chain (106) is controlled based on a scanning command or in response to another scanning input received at the system (100).
  10. The system according to any of claims 1-9, wherein the system further comprises a second flexible chain, wherein the second flexible chain is configured to align with the first flexible chain (106) at the x-ray emission port (103) to form a compound aperture.
  11. A method of x-ray manipulation for x-ray inspection, the method comprising: generating an x-ray emission (104); receiving the x-ray emission (104) at a first flexible chain (106); advancing the flexible chain (106) along the x-ray emission (104) to align an aperture (110) of the first flexible chain (106) with the x-ray emission (104); passing only a portion (112) of the x-ray emission (104) through the aperture (110) to form an x-ray beam (112); and blocking the x-ray emission (104) not passed through the aperture (110) with the first flexible chain (106); wherein advancing the first flexible chain (106) comprises advancing the aperture (110) of the first flexible chain (106) along an x-ray emission port (103) such that a relative position of the aperture (110) is changed, thereby rastering the portion (112) of the x-ray emission (104) along a scanning path (113), wherein the aperture (110) is formed in two adjacent links (110A/110B).
  12. The method according to claim 11, wherein advancing the first flexible chain (106) comprises driving with the flexible chain (106) in a continuous loop.
  13. The method according to any of claims 11-12, wherein advancing the flexible chain (106) further comprises aligning the aperture (110) with the x-ray emission port (103), the x-ray emission port (103) forming part of ) of an x-ray emitter (102).
  14. The method according to any of claims 11-13, further comprising: directing the x-ray beam (112) to an inspection target; detecting a portion of the x-ray beam affected by the inspection target; and determining a characteristic of the inspection target based on the detected portion of the x-ray beam.
  15. The method according to claim 14, wherein the detected portion of the x-ray beam (112) comprises: x-ray energy backscattered by the inspection target, or x-ray energy passed-through the inspection target.

Description

FIELD This disclosure relates generally to the non-destructive inspection of parts, and more particularly to beam forming for inspection of parts using x-ray apparatuses, systems, and methods. BACKGROUND Some inspection techniques, such as non-destructive testing, foreign object detection, non-line-of-site examination, etc., are employed when destruction of a part to be inspected is not desirable or practical. Certain x-ray inspection techniques provide a penetrating scan or examination of a part. Such x-ray inspection techniques are used in a variety of applications, such as homeland security, oil and gas mining and refining, pipeline inspection, transportation, automotive, aerospace, marine, mining, shipping, and storage, among others. Some x-ray inspection techniques utilize the detection of x-rays that pass through a part, from one side of the part to the opposite side of the part. In other inspection techniques, such as x-ray backscattering techniques, the x-rays reflected back from the part (e.g., backscattered x-rays) are detected and then used to produce images or an analysis of the part. The pattern and intensity of the x-rays depends upon the materials and organization of the part. Accordingly, the pattern and intensity of the detected x-rays can be used to generate an image, which is relied upon to determine a quality, characteristic, or anomaly of the part. Traditionally, an x-ray beam useful for inspection requires using a relatively large and heavy shield sufficient to block unwanted x-rays. The heavy shield includes one or more apertures. The shield is moved (e.g., rotated) to allow some of the x-rays to pass through the aperture, thus generating an x-ray beam shaped by the aperture to inspect a part or other inspection target. Because of the size and weight of the shield, applications are limited and considerable effort is required to transport and position the equipment needed for an x-ray inspection test. US 2009/141858 A1, in accordance with its abstract, states a beam admission unit. In at least one example, the beam admission unit includes a plurality of admission segments having at least one admission slit for admitting radiation emanating from a radiation source onto a predetermined admission region. So as to implement a particularly space-saving, robust and reliable design, in at least one embodiment the admission segments are interconnected in an articulated fashion to form an admission plate chain which can be rolled up. SUMMARY The subject matter of the present application has been developed in response to the present state of the art, and in particular, in response to the shortcomings of traditional x-ray inspection devices, that have not yet been fully solved by currently available techniques. Accordingly, the subject matter of the present application has been developed to provide an x-ray inspection device, and associated apparatuses, systems, and methods, with a flexible aperture chain, that overcomes at least some of the above-discussed shortcomings of prior art techniques. Therefore, there are provided a system and a method according to the independent claims. Disclosed herein is an apparatus for forming an x-ray beam. The apparatus comprises a plurality of links pivotably coupled together, in an end-to-end manner, to form a continuous loop. The plurality of links comprises two or more links configured to block an e-ray emission. The plurality of links also comprises one or more links comprising an aperture that is configured to allow only a portion of the x-ray emission to pass through the aperture. The preceding subject matter of this paragraph characterizes example 1 of the present disclosure. An entirety of the aperture is formed in one link. The preceding subject matter of this paragraph characterizes example 2 of the present disclosure, wherein example 2 also includes the subject matter according to example 1, above. The aperture is formed in two adjacent links. The preceding subject matter of this paragraph characterizes example 3 of the present disclosure, wherein example 3 also includes the subject matter according to any one of examples or 1 or 2, above. The plurality of links are pivotably coupled together at corresponding pivot axes and the aperture has a central axis that is perpendicular to the pivot axis. The preceding subject matter of this paragraph characterizes example 4 of the present disclosure, wherein example 4 also includes the subject matter according to any one of examples or 1-3, above. The plurality of links are pivotably coupled together at corresponding pivot axes and the aperture has a central axis that is parallel to the pivot axis. The preceding subject matter of this paragraph characterizes example 5 of the present disclosure, wherein example 5 also includes the subject matter according to any one of examples or 1-4, above. One or more of the plurality of links comprises interface structures to facilitate interaction between the one or more