EP-4641133-B1 - ELECTRONIC DEVICE, PARAMETER CALIBRATION METHOD, AND NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM

EP4641133B1EP 4641133 B1EP4641133 B1EP 4641133B1EP-4641133-B1

Inventors

CHEN, WEI-FAN

Dates

Publication Date: 20260506
Application Date: 20240524

Claims (13)

An electronic device (100), comprising: a plurality of sensing circuits (110A, 110B, 110C), configured to obtain a plurality of sensing values so as to locate the electronic device, the plurality of sensing circuits (110A, 110B, 110C) comprising cameras; a plurality of strain sensing circuits (130A, 130B), configured to obtain a plurality of strain sensing values in correspondence to a deformation of the electronic device; a memory (170), configured to store a linking database, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups and a plurality of testing external parameter groups in correspondence; and a processor (150), coupled to the plurality of sensing circuits, the plurality of strain sensing circuits and the memory, configured to: update a plurality of external parameters between the plurality of sensing circuits according to the plurality of strain sensing values and the linking database, characterised in that the processor is further configured to: update the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and re-construct the linking database with the cameras of the sensing circuits (110A, 110B, 110C) when the deformation of the electronic device is not within the elastic range.
The electronic device of claim 1, wherein the processor is further configured to: obtain a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values; obtain a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and update the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.
The electronic device of claim 1, wherein the processor is further configured to: establish the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.
The electronic device of claim 3, wherein the processor is further configured to: obtain a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits; obtain a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by the cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and establish the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.
The electronic device of claim 1, wherein the processor is further configured to: perform a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device; wherein the plurality of strain sensing circuits are set at the plurality of representative positions.
The electronic device of claim 1, wherein the processor is further configured to: determine whether the deformation of the electronic device is within the elastic range according to the linking database.
A parameter calibration method, suitable for an electronic device (100), comprising: obtaining a plurality of sensing values so as to locate the electronic device by a plurality of sensing circuits (110A, 110B, 110C) of the electronic device, the plurality of sensing circuits (110A, 110B, 110C) comprising cameras; obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits (130A, 130B) of the electronic device; storing a linking database by a memory (170) of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups and a plurality of testing external parameter groups in correspondence; updating a plurality of external parameters between the plurality of sensing circuits by a processor (150) of the electronic device according to the plurality of strain sensing values and the linking database; characterised by updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and re-constructing the linking database with the cameras of the sensing circuits (110A, 110B, 110C) when the deformation of the electronic device is not within the elastic range.
The parameter calibration method of claim 7, further comprising: obtaining a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values; obtaining a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and updating the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.
The parameter calibration method of claim 7, further comprising: establishing the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.
The parameter calibration method of claim 9, further comprising: obtaining a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits; obtaining a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by the cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and establishing the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.
The parameter calibration method of claim 7, further comprising: performing a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device; wherein the plurality of strain sensing circuits are set at the plurality of representative positions.
The parameter calibration method of claim 7, further comprising: determining whether the deformation of the electronic device is within the elastic range according to the linking database.
A non-transitory computer readable storage medium, wherein the non-transitory computer readable storage medium comprises one or more computer programs stored therein, and the one or more computer programs can be executed by one or more processors so as to be configured to operate a parameter calibration method using the electronic device of claim 1, wherein the parameter calibration method comprises: obtaining the plurality of sensing values so as to locate the electronic device by the plurality of sensing circuits of the electronic device; obtaining the plurality of strain sensing values in correspondence to the deformation of the electronic device by the plurality of strain sensing circuits (110A, 110B, 110C) of the electronic device; storing the linking database by the memory (170) of the electronic device, wherein the linking database comprises the linking relationship between a plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence; updating the plurality of external parameters between the plurality of sensing circuits by the processor (150) of the electronic device according to the plurality of strain sensing values and the linking database; characterised by updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within the elastic range; and re-constructing the linking database with the cameras of the sensing circuits (110A, 110B, 110C) when the deformation of the electronic device is not within the elastic range.

Description

BACKGROUND FIELD OF INVENTION The present application relates to an electronic device, a parameter calibration method, and a non-transitory computer readable storage medium. More particularly, the present application relates to an electronic device, a parameter calibration method, and a non-transitory computer readable storage medium with a self-tracking function. DESCRIPTION OF RELATED ART In the future, the development trend of the electronic devices, such as the head-mounted display devices, will inevitably develop in the direction of thinness and lightness. It will be more obvious to use elastic design instead of rigidity in the structural design of the electronic devices such as the HMD devices. However, the opportunity for structural elastic deformation will also be greater. The sensing devices or the sensing circuits set on the electronic devices would become unfixed with the deformation of the electronic devices. The relative positions and the relative rotations between the sensing devices or the sensing circuits of the electronic devices will no longer be fixed values, and corrections for the relative positions and the relative rotations need to be more immediate, faster, and more flexible, so as to maintain the operational performances of the electronic devices. Several methods are proposed to calibrate the external parameters, including the relative positions and the relative rotations between the sensing devices or the sensing circuits. However, these calibration methods must be carried out through the image captured by the cameras. It requires a long time to collect and analyze data based on the captured images, making it difficult to respond in real time. Moreover, in the previous methods, only the external parameters between the cameras can be corrected, while other non-image capture devices such as depth sensors and gyroscopes cannot be corrected in real time, which can easily cause positioning errors of the electronic devices during long-term use. Therefore, how to calibrate the extrinsic parameters between the sensing devices or the sensing circuits of the electronic device in real time when the electronic device is structural elastic deformed is a problem to be solved. Attention is drawn to WO 2023/031633 A1 describing a computer-implemented method for online calibration based on deformable body mechanics may include (i) detecting, via at least one sensor, deformation of a wearable frame that houses at least one component of a display system, (ii) determining how the deformation changes a position of the component of the display system, and (iii) compensating for the changed position of the component of the display system when processing an image to be displayed to a user of the wearable frame. The sensor includes a simultaneous location and mapping ("SLAM") sensor gathering SLAM data and the detection of the deformation of the wearable frame is based at least in part on the SLAM data. SUMMARY The present invention is set forth in the independent claims, respectively. Further embodiments of the invention are described in the dependent claims. The disclosure provides an electronic device according to claim 1. The electronic device includes, inter alia, several sensing circuits, several strain sensing circuits, a memory and a processor. The several sensing circuits are configured to obtain several sensing values so as to locate the electronic device. The several strain sensing circuits are configured to obtain several strain sensing values in correspondence to a deformation of the electronic device. The memory is configured to store a linking database. The linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence. The processor is coupled to the several sensing circuits, the several strain sensing circuits and the memory. The processor is configured to update several external parameters between the several sensing circuits according to the several strain sensing values and the linking database. The disclosure provides a parameter calibration method according to claim 7 suitable for an electronic device. The parameter calibration method includes, inter alia, the following operations: obtaining several sensing values so as to locate the electronic device by several sensing circuits of the electronic device; obtaining several strain sensing values in correspondence to a deformation of the electronic device by several strain sensing circuits of the electronic device; storing a linking database by a memory of the electronic device, in which the linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence; and updating several external parameters between the several sensing circuits by a processor of the electronic device according to the several strain sensing values and the linking datab