EP-4701397-A3 - EDGE DEFECT MONITOR SYSTEM AND METHOD FOR MULTICHIP DEVICE
EP4701397A3EP 4701397 A3EP4701397 A3EP 4701397A3EP-4701397-A3
Abstract
An electronic product (50) includes a number of die (100, 101A, 101B) and an interposer (52). The die (100, 101A, 101B) are coupled to the interposer (52). Each respective die (100, 101A, 101B) includes an edge integrity detection structure (163A, 163B) extending along at least part of an edge of the respective die (100, 101A, 101B). The interposer (52) includes at least one pad coupled to at least one edge integrity detection structure (163A, 163B) of the die.
Inventors
- ZHAO, SAM ZIQUN
- LI, XIAOMING
- TSAU, LIMING
- TAN, TECK YANG
- SHARIFI, REZA
Assignees
- Avago Technologies International Sales Pte. Limited
Dates
- Publication Date
- 20260513
- Application Date
- 20250729