APPARATUS AND METHOD FOR X-RAY FLUORESCENCE ANALYSIS

Abstract

There is provided an X-ray fluorescence analysis apparatus for analysing a sample, and a method of X-ray fluorescence analysis. The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

Inventors

Xiao, Youhong
Vrebos, Bruno
Kempenaers, Lieven

Assignees

Malvern Panalytical B.V.

Dates

Publication Date: 20260506
Application Date: 20220512