EP-4740127-A1 - TECHNIQUES FOR USING INVERSE DESIGN FOR COMBINED OPTIMIZATION OF OPTICAL AND ELECTRICAL COMPONENTS IN AN OPTOELECTRONIC RECEIVER

Abstract

In some embodiments, a computer-implemented method of creating a design for an optoelectronic detector device is provided. A computing system determines an initial design that includes circuit parameters for at least one photodetector region and for conductors that couple the photodetector region to circuitry. The computing system simulates performance of an optically active region to generate a plurality of field values, and simulates performance of the at least one photodetector region based on the plurality of field values to generate charge values. The computing system simulates performance of at least the conductors based on the charge values to generate a performance loss value, and determines a loss metric based on the performance loss value. The computing system backpropagates the loss metric to determine a circuit parameter gradient, and revises the circuit parameters based at least in part on the circuit parameter gradient to create an updated initial design

Inventors

• ADOLF, BRIAN
• WU, Yi-Kuei, Ryan
• WILLIAMSON, IAN

Assignees

• X Development LLC

Dates

Publication Date

20260513

Application Date

20240923

Claims (20)

1. CLAIMS What is claimed is: 1. A non-transitory computer-readable medium having computer-executable instructions stored thereon that, in response to execution by one or more processors of a computing system, cause the computing system to perform actions for creating a design for an optoelectronic detector device, the actions comprising: determining, by the computing system, an initial design that includes structural parameters for an optically active region and circuit parameters for at least one photodetector region and for conductors that couple the photodetector region to circuitry; simulating, by the computing system, performance of the optically active region to generate a plurality of field values; simulating, by the computing system, performance of the at least one photodetector region based on the plurality of field values to generate charge values; simulating, by the computing system, performance of at least the conductors based on the charge values to generate a performance loss value; determining, by the computing system, a loss metric based on the performance loss value; backpropagating, by the computing system, the loss metric to determine at least a circuit parameter gradient; and revising, by the computing system, the circuit parameters based at least in part on the circuit parameter gradient to create an updated initial design.
2. 2. The non-transitory computer-readable medium of claim 1, wherein the actions further comprise: repeating the simulating performance of the optically active region, simulating performance of the at least one photodetector region, simulating performance of at least the conductors, determining the loss metric, backpropagating the loss metric, and revising the circuit parameters to further update the updated initial design.
3. 3. The non-transitory computer-readable medium of claim 1, wherein the circuit parameters include a shape and a location of at least one doped region; and wherein revising the circuit parameters includes changing at least one of the shape and the location of the at least one doped region. 4119-P248WO 41
4. 4. The non-transitory computer-readable medium of claim 1, wherein the circuit parameters include a shape and a location of at least one conductor; and wherein revising the circuit parameters includes changing at least one of the shape and the location of the at least one conductor.
5. 5. The non-transitory computer-readable medium of claim 1, wherein simulating performance of at least the conductors based on the charge values includes determining a parasitic inductance of at least one contact point, via, bond wire, ball grid, trace, or wire.
6. 6. The non-transitory computer-readable medium of claim 1, wherein the performance loss value includes a measurement of a simulated charge value received by the circuitry.
7. 7. The non-transitory computer-readable medium of claim 6, wherein the measurement of the simulated charge value received by the circuitry includes a characteristic of an eye diagram; and wherein determining the loss metric based on the performance loss value includes comparing the characteristic of the eye diagram to a desired characteristic of the eye diagram.
8. 8. The non-transitory computer-readable medium of claim 7, wherein the characteristic of the eye diagram represents an amount of time to transition between logical states.
9. 9. The non-transitory computer-readable medium of claim 7, wherein the characteristic of the eye diagram represents a signal-to-noise ratio.
10. 10. The non-transitory computer-readable medium of claim 1, wherein simulating performance of the at least one photodetector region includes simulating the performance of the at least one photodetector region over time.
11. 11. A computer-implemented method of creating a design for an optoelectronic detector device, the method comprising: determining, by a computing system, an initial design that includes structural parameters for an optically active region and circuit parameters for at least one 4119-P248WO 42 photodetector region and for conductors that couple the photodetector region to circuitry; simulating, by the computing system, performance of the optically active region to generate a plurality of field values; simulating, by the computing system, performance of the at least one photodetector region based on the plurality of field values to generate charge values; simulating, by the computing system, performance of at least the conductors based on the charge values to generate a performance loss value; determining, by the computing system, a loss metric based on the performance loss value; backpropagating, by the computing system, the loss metric to determine at least a circuit parameter gradient; and revising, by the computing system, the circuit parameters based at least in part on the circuit parameter gradient to create an updated initial design.
12. 12. The computer-implemented method of claim 11, further comprising: repeating the simulating performance of the optically active region, simulating performance of the at least one photodetector region, simulating performance of at least the conductors, determining the loss metric, backpropagating the loss metric, and revising the circuit parameters to further update the updated initial design.
13. 13. The computer-implemented method of claim 11, wherein the circuit parameters include a shape and a location of at least one doped region; and wherein revising the circuit parameters includes changing at least one of the shape and the location of the at least one doped region.
14. 14. The computer-implemented method of claim 11, wherein the circuit parameters include a shape and a location of at least one conductor; and wherein revising the circuit parameters includes changing at least one of the shape and the location of the at least one conductor.
15. 15. The computer-implemented method of claim 11, wherein simulating performance of at least the conductors based on the charge values includes determining a parasitic inductance of at least one contact point, via, bond wire, ball grid, trace, or wire. 4119-P248WO 43
16. 16. The computer-implemented method of claim 11, wherein the performance loss value includes a measurement of a simulated charge value received by the circuitry.
17. 17. The computer-implemented method of claim 16, wherein the measurement of the simulated charge value received by the circuitry includes a characteristic of an eye diagram; and wherein determining the loss metric based on the performance loss value includes comparing the characteristic of the eye diagram to a desired characteristic of the eye diagram.
18. 18. The computer-implemented method of claim 17, wherein the characteristic of the eye diagram represents an amount of time to transition between logical states.
19. 19. The computer-implemented method of claim 17, wherein the characteristic of the eye diagram represents a signal-to-noise ratio.
20. 20. The computer-implemented method of claim 11, wherein simulating performance of the at least one photodetector region includes simulating the performance of the at least one photodetector region over time. 4119-P248WO 44

Description

TECHNIQUES FOR USING INVERSE DESIGN FOR COMBINED OPTIMIZATION OF OPTICAL AND ELECTRICAL COMPONENTS IN AN OPTOELECTRONIC RECEIVER CROSS-REFERENCE TO RELATED APPLICATION [0001] This application claims the benefit of U.S. Application No. 18/479,724, filed October 2, 2023, the contents of which are incorporated herein by reference. TECHNICAL FIELD [0002] This disclosure relates generally to photonic devices, and in particular but not exclusively, relates to optoelectronic photodetectors. BACKGROUND [0003] Fiber-optic communication is typically employed to transmit information from one place to another via light that has been modulated to carry the information. For example, many telecommunication companies use optical fiber to transmit telephone signals, internet communication, and cable television signals. At a transmitting side, information is modulated onto a carrier beam that is transmitted via the optical fiber. At a receiving side, an optoelectronic photodetector and related circuitry is used to detect the signal and decode the information. BRIEF SUMMARY [0004] In some embodiments, a non-transitory computer-readable medium having computer-executable instructions stored thereon is provided. The instructions, in response to execution by one or more processors of a computing system, cause the computing system to perform actions for creating a design for an optoelectronic detector device, the actions comprising: determining, by the computing system, an initial design that includes structural parameters for an optically active region and circuit parameters for at least one photodetector region and for conductors that couple the photodetector region to circuitry; simulating, by the computing system, performance of the optically active region to generate a plurality of field values; simulating, by the computing system, performance of the at least one photodetector region based on the plurality of field values to generate charge values; simulating, by 4119-P248WO 1 the computing system, performance of at least the conductors based on the charge values to generate a performance loss value; determining, by the computing system, a loss metric based on the performance loss value; backpropagating, by the computing system, the loss metric to determine at least a circuit parameter gradient; and revising, by the computing system, the circuit parameters based at least in part on the circuit parameter gradient to create an updated initial design. [0005] In some embodiments, a computer-implemented method of creating a design for an optoelectronic detector device is provided. A computing system determines an initial design that includes structural parameters for an optically active region and circuit parameters for at least one photodetector region and for conductors that couple the photodetector region to circuitry. The computing system simulates performance of the optically active region to generate a plurality of field values. The computing system simulates performance of the at least one photodetector region based on the plurality of field values to generate charge values. The computing system simulates performance of at least the conductors based on the charge values to generate a performance loss value. The computing system determines a loss metric based on the performance loss value. The computing system backpropagates the loss metric to determine at least a circuit parameter gradient. The computing system revises the circuit parameters based at least in part on the circuit parameter gradient to create an updated initial design. BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS [0006] Non-limiting and non-exhaustive embodiments of the invention are described with reference to the following figures, wherein like reference numerals refer to like parts throughout the various views unless otherwise specified. Not all instances of an element are necessarily labeled so as not to clutter the drawings where appropriate. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating the principles being described. To easily identify the discussion of any particular element or act, the most significant digit or digits in a reference number refer to the figure number in which that element is first introduced. [0007] FIG. 1 is a functional block diagram illustrating a non-limiting example embodiment of a system for optical communication between two optical communication devices via an optical signal, according to various aspects of the present disclosure. 4119-P248WO 2 [0008] FIG.2A - FIG.2D illustrate different views of a non-limiting example embodiment of a photonic demultiplexer, according to various aspects of the present disclosure. [0009] FIG. 3A and FIG. 3B illustrate a more detailed cross-sectional view of a dispersive region of a non-limiting example embodiment of a photonic demultiplexer, according to various aspects of the present disclosure. [0010] FIG. 4 is a schematic illustratio