EP-4741083-A1 - INFORMATION PROCESSING APPARATUS, DEFECT DETECTION METHOD, AND THREE-DIMENSIONAL POWDER BED FUSION ADDITIVE MANUFACTURING APPARATUS

EP4741083A1EP 4741083 A1EP4741083 A1EP 4741083A1EP-4741083-A1

Abstract

An information processing apparatus includes: a defect candidate specifying unit (72) configured to specify a plurality of defect candidates positioned at substantially the same positions in a plurality of layers adjacent to each other in a stacking direction; a defect detection unit (73) configured to detect a defect remaining in a manufactured object based on a size of the plurality of defect candidates positioned at the substantially same positions and specified in the plurality of layers in the stacking direction and a size of each of the plurality of defect candidates in the layer, and to determine the defect as any one of a first defect which is not allowed to remain in the manufactured object and a second defect which is allowed to remain in the manufactured object based on a maximum length of the defect; and a display control unit (74) configured to create a visualized image obtained by visualizing defect information including at least one of the first defect and the second defect and to perform control such that the visualized image is displayable on a display unit (90) during powder bed fusion additive manufacturing.

Inventors

TSUTAGAWA, NARI
KANEKO, YUHEI
ASANUMA, YUJI
TSUDA, TAKASHI
Suwa, Kento
Ohara, Shuma
SHIBATA, KOHEI

Assignees

JEOL Ltd.

Dates

Publication Date: 20260513
Application Date: 20251030

Claims (18)

An information processing apparatus comprising: a defect candidate specifying unit (72) configured to detect a defective portion of a layer as a defect candidate for each layer based on layer data obtained for each layer of a manufactured object manufactured by powder bed fusion additive manufacturing, and to specify a plurality of the defect candidates positioned at substantially the same positions in a plurality of the layers adjacent to each other in a stacking direction; a defect detection unit (73) configured to detect a defect remaining in the manufactured object based on a size of the plurality of defect candidates positioned at the substantially same positions and specified in the plurality of layers in the stacking direction and a size of each of the plurality of defect candidates in the layer, and to determine the defect as any one of a first defect which is not allowed to remain in the manufactured object and a second defect which is allowed to remain in the manufactured object based on a maximum length of the defect; and a display control unit (74) configured to edit defect information including at least one of the first defect and the second defect into a visualized image and to perform control such that the visualized image is displayable on a display unit (90) during the powder bed fusion additive manufacturing.
The information processing apparatus according to claim 1, wherein the display control unit (74) generates, as the visualized image, a two-dimensional defect display screen (100) including a first defect display section (101) that displays the defect information detected in the stacking direction by the defect detection unit (73), and the first defect and the second defect, which are subjected to highlighting processing, and a first stacking number designation section (103) that designates a stacking number of the layer, based on the layer data for the layer instructed by an input unit (60), and includes, in the two-dimensional defect display screen (100), the first defect and the second defect of the layer corresponding to the stacking number designated by the first stacking number designation section (103).
The information processing apparatus according to claim 2, wherein the layer, and the first defect and the second defect, which are subjected to the highlighting processing, are displayed as two-dimensional images on the first defect display section (101), the first stacking number designation section (103) is a scroll bar displayed at an end of the two-dimensional defect display screen (100), and the display control unit (74) increases the stacking number of the layer to be displayed on the first defect display section (101) when a knob of the scroll bar is moved in a first direction by the input unit (60), and decreases the stacking number of the layer to be displayed on the first defect display section (101) when the knob is moved in a second direction.
The information processing apparatus according to claim 1, wherein the display control unit (74) acquires the layer data associated with identification information of the manufactured object instructed by the input unit (60), generates, as the visualized image, a three-dimensional defect display screen (110) including a second defect display section (111) that displays the defect information detected in the stacking direction by the defect detection unit (73), the first defect and the second defect, which are subjected to highlighting processing, and a three-dimensional image of the manufactured object, and a second stacking number designation section (114) that designates a stacking number of the layer, based on the layer data for the layer instructed by the input unit (60), and includes, in the three-dimensional defect display screen (110), the first defect and the second defect of the layer corresponding to the stacking number designated by the second stacking number designation section (114).
The information processing apparatus according to claim 4, wherein the manufactured object, the layer, and the first defect and the second defect, which are subjected to the highlighting processing, are displayed as three-dimensional images on the second defect display section (111), the second stacking number designation section (114) is a transverse image that traverses the manufactured object displayed on the second defect display section (111) at a position corresponding to the stacking number designated by the second stacking number designation section (114), and the display control unit (74) increases the stacking number of the layer to be displayed on the second defect display section (111) when the transverse image is moved in a first direction by the input unit (60), and decreases the stacking number of the layer to be displayed on the second defect display section (111) when the transverse image is moved in a second direction.
The information processing apparatus according to claim 5, wherein when identification information of the manufactured object is instructed by the input unit (60), the display control unit (74) acquires the layer data associated with the instructed identification information, and generates the second defect display section (111) and the three-dimensional defect display screen (110) as the visualized image again based on the layer data.
The information processing apparatus according to claim 1, wherein the display control unit (74) generates a two-dimensional defect display screen (100) including a first defect display section (101) that displays the defect information detected in the stacking direction by the defect detection unit (73), and the first defect and the second defect, which are subjected to highlighting processing, a first stacking number designation section (103) that designates a stacking number of the layer, and the first defect and the second defect of the layer corresponding to the stacking number designated by the first stacking number designation section (103), based on the layer data for the layer instructed by an input unit (60), acquires the layer data associated with identification information of the manufactured object instructed by the input unit (60), generates a three-dimensional defect display screen (110) including a second defect display section (111) that displays the defect information detected in the stacking direction by the defect detection unit (73), the first defect and the second defect, which are subjected to the highlighting processing, and a three-dimensional image of the manufactured object, and a second stacking number designation section (114) that designates a stacking number of the layer, based on the layer data for the layer instructed by the input unit (60), and generates, as the visualized image, a first parallel display screen including the two-dimensional defect display screen (100) and the three-dimensional defect display screen (110).
The information processing apparatus according to claim 1, wherein the display control unit (74) generates a result table including the defect information determined for each layer and information including a progress status of powder bed fusion additive manufacturing processing of the manufactured object for each manufactured object based on the layer data, and edits the result table into the visualized image including the result table, and the information including the progress status of the powder bed fusion additive manufacturing processing includes any one of information indicating that a fatal defect has occurred in the powder bed fusion additive manufacturing processing and information indicating that the powder bed fusion additive manufacturing processing has been normally performed.
The information processing apparatus according to claim 1, wherein the display control unit (74) edits a histogram representing a relationship between the maximum length determined for each layer based on the layer data and the number of defects into the visualized image including the histogram for each manufactured object.
The information processing apparatus according to claim 1, wherein the display control unit (74) edits at least one graph of the number of defects, a defect area, and an area defect ratio determined for each layer based on the layer data for each manufactured object into the visualized image including the at least one graph.
The information processing apparatus according to claim 1, wherein the display control unit (74) generates a two-dimensional defect display screen (100) including a first defect display section (101) that displays the defect information detected in the stacking direction by the defect detection unit (73), and the first defect and the second defect, which are subjected to highlighting processing, a first stacking number designation section (103) that designates a stacking number of the layer, and the first defect and the second defect of the layer corresponding to the stacking number designated by the first stacking number designation section (103), based on the layer data for the layer instructed by an input unit (60), acquires the layer data associated with identification information of the manufactured object instructed by the input unit (60), generates a three-dimensional defect display screen (110) including a second defect display section (111) that displays the defect information detected in the stacking direction by the defect detection unit (73), the first defect and the second defect, which are subjected to the highlighting processing, and a three-dimensional image of the manufactured object, and a second stacking number designation section (114) that designates a stacking number of the layer, based on the layer data for the layer instructed by the input unit (60), generates a result table including the defect information determined for each layer and information including a progress status of powder bed fusion additive manufacturing processing of the manufactured object for each manufactured object based on the layer data, and generates a second parallel display screen (150) including at least one of the two-dimensional defect display screen (100) and the three-dimensional defect display screen (110), the result table, a histogram representing a relationship between the maximum length determined for each layer based on the layer data and the number of defects, and at least one graph of the number of defects, a defect area, and an area defect ratio determined for each layer based on the layer data.
The information processing apparatus according to any one of claims 1 to 11, wherein the defect detection unit (73) integrates the plurality of defect candidates positioned at the substantially same positions in the stacking direction, measures a stacking direction length (Lz) of the integrated defect candidate and a first direction length (Lx) and a second direction length (Ly) in the layer in directions intersecting the stacking direction of the integrated defect candidate for each layer, sets a largest length among the first direction length (Lx) and the second direction length (Ly) as a maximum layer length (Lxy), sets a larger one of the stacking direction length (Lz) and the maximum layer length (Lxy) as the maximum length, detects the integrated defect candidate as the defect in a case where the maximum length exceeds a maximum length threshold, determines the defect whose maximum length exceeds a maximum allowable length as the first defect, and determines the defect whose maximum length does not exceed the maximum allowable length as the second defect.
The information processing apparatus according to claim 12, wherein the defect candidate specifying unit (72) measures an area of an N-th layer defect candidate specified in an N-th layer, and an area of an N+1-th layer defect candidate specified in an N+1-th layer among the plurality of defect candidates overlapping each other in a plurality of layers adjacent to each other in the stacking direction, N being an integer of 1 or more, calculates an overlapping area of an overlapping portion where the N-th layer defect candidate and the N+1-th layer defect candidate overlap each other in the stacking direction, and specifies that the N-th layer defect candidate and the N+1-th layer defect candidate are at the substantially same positions in a case where a ratio of the overlapping area to the area of the N-th layer defect candidate is equal to or exceeds a first area threshold and in a case where a ratio of the overlapping area to the area of the N+1-th layer defect candidate is equal to or exceeds a second area threshold.
The information processing apparatus according to claim 13, wherein the defect detection unit (73) sets a longer one of the stacking direction length (Lz) and the maximum layer length (Lxy) as the maximum length, and detects the integrated defect candidate as the defect in a case where the maximum length is the stacking direction length (Lz) and the stacking direction length (Lz) exceeds the maximum length threshold in the stacking direction, or in a case where the maximum length is the maximum layer length (Lxy) and the maximum layer length (Lxy) exceeds a maximum layer length threshold in the layer.
The information processing apparatus according to any one of claims 1 to 11, wherein the defect detection unit (73) integrates the plurality of defect candidates positioned at the substantially same positions in the stacking direction, prepares a stacking direction length threshold for the integrated defect candidate and a maximum layer length threshold in the layer, and detects the integrated defect candidate as the defect in a case where a stacking direction length (Lz) of the integrated defect candidate is equal to or larger than the stacking direction length threshold and a maximum layer length (Lxy) of the integrated defect candidate in the layer is equal to or larger than the maximum layer length threshold.
The information processing apparatus according to any one of claims 1 to 11, wherein the defect detection unit (73) integrates the plurality of defect candidates positioned at the substantially same positions in the stacking direction, prepares a stacking direction length threshold for the integrated defect candidate and a maximum layer length threshold in the layer, and detects the integrated defect candidate as the defect in a case where a stacking direction length (Lz) of the integrated defect candidate is equal to or larger than the stacking direction length threshold or a maximum layer length (Lxy) of the integrated defect candidate in the layer is equal to or larger than the maximum layer length threshold.
A defect detection method performed by a defect candidate specifying unit (72), a defect detection unit (73), and a display control unit (74) included in an information processing apparatus, the defect detection method comprising: detecting, by the defect candidate specifying unit (72), a defective portion of a layer as a defect candidate for each layer based on layer data obtained for each layer of a manufactured object manufactured by powder bed fusion additive manufacturing, and specifying a plurality of the defect candidates positioned at substantially the same positions in a plurality of the layers adjacent to each other in a stacking direction; detecting, by the defect detection unit (73), a defect remaining in the manufactured object based on a size of the plurality of defect candidates positioned at the substantially same positions and specified in the plurality of layers in the stacking direction and a size of each of the plurality of defect candidates in the layer, and determining the defect as any one of a first defect which is not allowed to remain in the manufactured object and a second defect which is allowed to remain in the manufactured object based on a maximum length of the defect; and editing, by the display control unit (74), defect information including at least one of the first defect and the second defect into a visualized image and performing control such that the visualized image is displayable on a display unit (90) during the powder bed fusion additive manufacturing.
A three-dimensional powder bed fusion additive manufacturing apparatus comprising: a build plate (22) on which a powder bed obtained by spreading a powder material is formed; a powder supply system (16) configured to spread the powder material over the powder bed; a beam irradiation unit (2) configured to irradiate the powder material spread over the powder bed with a beam for manufacturing; an electron optical system configured to perform scanning with the beam for manufacturing according to a melting condition for melting the powder material to melt the powder material spread over the powder bed; a defect candidate specifying unit (72) configured to detect a defective portion of a layer as a defect candidate for each layer based on layer data obtained for each layer of a manufactured object manufactured by powder bed fusion additive manufacturing, and to specify a plurality of the defect candidates positioned at substantially the same positions in a plurality of the layers adjacent to each other in a stacking direction; a defect detection unit (73) configured to detect a defect remaining in the manufactured object based on a size of the plurality of defect candidates positioned at the substantially same positions and specified in the plurality of layers in the stacking direction and a size of each of the plurality of defect candidates in the layer, and to determine the defect as any one of a first defect which is not allowed to remain in the manufactured object and a second defect which is allowed to remain in the manufactured object based on a maximum length of the defect; and a display control unit (74) configured to edit defect information including at least one of the first defect and the second defect into a visualized image and to perform control such that the visualized image is displayable on a display unit (90) during the powder bed fusion additive manufacturing.

Description

BACKGROUND Technical Field The present invention relates to an information processing apparatus, a defect detection method, and a three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus. Related Art In recent years, a three-dimensional powder bed fusion additive manufacturing (PBF-AM) technology in which layers obtained by thinly spreading a metal powder material are stacked one by one is in the limelight, and many types of three-dimensional PBF-AM technologies have been developed based on differences in powder material and manufacturing method. In a manufacturing method of a three-dimensional PBF-AM apparatus according to a related art, for example, the powder material is spread layer by layer on a base plate installed on an upper surface of a stage. Next, for the powder material spread on the base plate, only a two-dimensional structure portion corresponding to one cross section of a manufactured object is melted by a heating mechanism including an electron beam or a laser. Then, such layers of the powder material are stacked one by one in a height direction (Z direction) to form the manufactured object. At the time of manufacturing each layer of the manufactured object, a powder bed is formed on the base plate. Therefore, such a manufacturing method is also referred to as a powder bed method. In the formation of the manufactured object, the powder material cannot be completely melted at a portion where a sintering defect occurs, and unevenness occurs on the surface of the manufactured object in the middle of manufacturing. Since such unevenness can become a defect, in the three-dimensional PBF-AM apparatus, defect detection is performed based on data acquired from the surface of the manufactured object by performing camera imaging or backscattered electron (BSE) imaging. The camera imaging is, for example, a method of imaging the surface of the manufactured object with visible light. The BSE imaging is a method of imaging the surface of the manufactured object by detecting backscattered electrons of an electron beam with which the surface of the manufactured object is irradiated. Layer data obtained by the camera imaging or the BSE imaging is displayed on a monitor as an XY cross-sectional view per layer of the manufactured object in the middle of manufacturing. A user can confirm a state of an XY cross section immediately after melting of the powder material by using the layer data. Furthermore, the user has been able to specify a portion (referred to as a defect candidate) that can become a defect based on the unevenness on the surface of the manufactured object in the middle of manufacturing. Examples of the defect candidate include a portion with unevenness occurring in the layer, and a portion insufficiently melted and thus formed with a space. As a technology related to such defect detection, a technology disclosed in Patent Literature 1 has been known. Patent Literature 1 discloses that "the determination unit calculates a height of a protrusion and at least one of a total area of a region where the protrusion is generated and an occupation ratio of the protrusion in a sintered region based on a state of the protrusion measured by a surface state measurement unit, and compares the calculated value with a corresponding threshold to determine whether a manufacturing state of a sintered layer is good or poor". Citation List Patent Literature Patent Literature 1: JP 2020-200501 A SUMMARY Even if the user can confirm the state of the XY cross section immediately after melting for each layer by using the defect detection function according to the related art as described above, it is difficult for the user to visually confirm the states of all the layers since PBF-AM is performed on hundreds to thousands of layers until the completion of the manufactured object. After the PBF-AM is completed, information necessary for defect detection cannot be obtained unless the manufactured object is inspected by another measuring device (for example, a device using X-ray computed tomography (CT)). For this reason, it has usually been impossible to know whether or not a problematic defect has occurred during the PBF-AM until after the completion of the PBF-AM. With the defect detection function according to the related art, for example, a position of the defect could not be obtained as defect information. The present invention has been made in view of such a circumstance, and an object of the present invention is to enable confirmation as to whether or not a problematic defect has occurred in a manufactured object during PBF-AM. An information processing apparatus according to the present invention includes: a defect candidate specifying unit (72) configured to detect a defective portion of a layer as a defect candidate for each layer based on layer data obtained for each layer of a manufactured object manufactured by powder bed fusion additive manufacturing (PBF-AM), and to specify a plurality