JP-2023514814-A5 -

Dates

Publication Date

20230522

Application Date

20200826

Description

The contact attachment according to the present invention allows for the selective extension and adaptation of the test pin device to the contact surface under test. In particular, by using the test pin device, it is possible to easily perform tests simultaneously on additional test surfaces, for example, that are directly adjacent to the contact surface under test. The following describes embodiments of the present invention. [Aspect 1] A test pin device comprising a high-frequency test contact member (10) for detachably contacting a contacting object, particularly a substrate-to-substrate plug connector, The aforementioned high-frequency test contact member (10) is A first contact area at one end for establishing contact with the contact partner (30), A contact pin device (20) housing the test contact member and a second contact region on the opposite side for establishing electrical contact, An intermediate meandering elastic region (3), having a cavity (5) preferably centrally located and extending along the extending direction (V) of the elastic region for suspension along the longitudinal extending direction (L) of the test contact member (10), The high-frequency test contact member (10) comprises a lamellar-shaped base body (10a) having, The high-frequency test contact member is characterized in that the meandering elastic region (3) has a plurality of curved members (8a, 8b, 8c, 8d) that are continuous with each other in the extending direction (V), and each has a curvature angle (α1 , α2 , β1 , β2 ) of 5° to 70°. [Aspect 2] In the high-frequency test contact member described in Aspect 1, The high-frequency test contact member is characterized in that the meandering elastic region (3) has two curved portions (6a, 6b) that are adjacent to each other in the extending direction (V), and each of the two curved portions (6a, 6b) has two consecutive and opposing curved members, which are particularly arranged in an S shape, and each of the curved members preferably has substantially the same curvature angle (α1 , α2 , β1 , β2 ) . [Aspect 3] In the high-frequency test contact member described in Aspect 1 or 2, The curvature angles of the curved members (8a, 8b) of the first curved portion (6a) are 40 to 70°, preferably 45 to 65°, and/or A high-frequency test contact member characterized in that the curvature angles of the curved members (8c, 8d) of the second curved portion (6b) are 5 to 25°, preferably 5 to 15°. [Aspect 4] In the high-frequency contact member described in any one of aspects 1 to 3, The elastic region (3) is A high-frequency test contact member characterized by having a total cross-section (F3) that is preferably uniform in the extending direction (V) and differs by less than 20%, preferably less than 15%, from the cross-sections (F1, F2) of adjacent portions of the first and/or second contact regions ( 1 , 2 ) . [Aspect 5] In the high-frequency test contact member described in any one of aspects 1 to 4, The high-frequency test contact member is characterized in that the meandering elastic region has at least one connecting bridge (7) that obstructs the cavity (5) extending along the extending direction (V). [Aspect 6] In the high-frequency test contact member described in any one of aspects 1 to 5, The second contact area (2) is, A high-frequency test contact member characterized by having a curved end portion (2a) formed on the test pin device (20) for establishing at least partially elastic electrical contact with the contact portion (18), and preferably having a narrower cross-section than the second contact region (2). [Aspect 7] A high-frequency test pin device (20) for detachably connecting to a multi-pole contact partner (30), particularly to a board-to-board plug connector, The aforementioned high-frequency test pin device (20) is An inner casing (11) having a contact portion (12) at one end for interacting with the contact partner (30) for the purpose of conducting a test, An outer casing (13) comprising: an outer casing (13) wherein, at least partially and with respect to the outer casing (13), particularly along the longitudinal direction of the device (L1 ) , the inner casing (11) is positioned to be fixed in that position at a first non-contact relative position, and at a second relative position in which it is electrically in contact with a second contact mating (30), the inner casing (11) is movably guided so that the inner casing (11) is mounted at least partially movable with respect to the outer casing (13), particularly rotatable and/or tiltable; The aforementioned high-frequency test pin device (20) is The high-frequency test pin device (20) and at least one printed circuit board (14a, 14b) having a contact member (9a) for establishing external electrical contact, The device has a plurality of high-frequency test contact members (10) according to any one of embodiments 1 to 6, which contact the printed circuit board (14a, 14b) and extend toward the contact portion (12)