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JP-2026075244-A - Inspection apparatus for sheet-like materials and inspection method for sheet-like materials

JP2026075244AJP 2026075244 AJP2026075244 AJP 2026075244AJP-2026075244-A

Abstract

【assignment】 To realize an inspection device and inspection method that can detect defects in moving sheet-like objects with a simple device configuration and high sensitivity. [Solution] The present invention, which solves the above problems, is a sheet-like material inspection apparatus comprising an irradiation means for irradiating a moving sheet-like material with electromagnetic waves and a receiving means for receiving electromagnetic waves through the sheet-like material, and performing an inspection of the sheet-like material based on the signal received by the receiving means, wherein in the inspection section for inspecting the sheet-like material, the path line along which the sheet-like material moves is a straight line, the irradiation means is arranged so that electromagnetic waves are irradiated onto the sheet-like material over the inspection section, and the receiving means is arranged so that the receiving axis of the receiving means substantially coincides with the path line of the sheet-like material in the inspection section. [Selection Diagram] Figure 1

Inventors

  • 山村 歩輝
  • 佐久間 敦士
  • 中井 康博

Assignees

  • 東レ株式会社

Dates

Publication Date
20260508
Application Date
20241022

Claims (6)

  1. A sheet-like object inspection apparatus comprising an irradiation means for irradiating electromagnetic waves onto a moving sheet-like object, and a receiving means for receiving electromagnetic waves via the sheet-like object, wherein the receiving means performs an inspection of the sheet-like object based on the signal received by the receiving means, In the inspection section for inspecting sheet-like materials, the path line along which the sheet-like material moves is a straight line. The irradiation means is arranged so that electromagnetic waves are irradiated onto the sheet-like material over the inspection section. The receiving means is positioned such that its receiving axis substantially coincides with the pass line of the sheet-like material in the inspection section. A device for inspecting sheet-like materials.
  2. The irradiation means emits X-rays as electromagnetic waves, and the transmitting axis of the irradiation means is positioned so as to substantially coincide with the pass line of the sheet-like material in the inspection section. The receiving means comprises a scintillator that receives X-rays and an imaging device that images the visible light irradiated by the scintillator. An inspection apparatus for sheet-like materials according to claim 1.
  3. The sheet-like material with permeability will be the object of inspection. The irradiation means irradiates light as electromagnetic waves and irradiates light toward the surface of the sheet-like material across the inspection section. An inspection apparatus for sheet-like materials according to claim 1.
  4. A method for inspecting a sheet-like object, comprising irradiating a moving sheet-like object with electromagnetic waves, receiving the electromagnetic waves through the sheet-like object, and inspecting the sheet-like object based on the state of the received electromagnetic waves, In the inspection section for inspecting the sheet-like material, the sheet-like material is moved so that the pass line becomes straight. Electromagnetic waves are irradiated onto the sheet-like material over the aforementioned inspection section. Electromagnetic waves are received from a direction that substantially coincides with the pass line of the sheet-like material in the aforementioned inspection section. A method for inspecting sheet-like materials.
  5. The electromagnetic wave is an X-ray, and the X-ray is irradiated such that the irradiation axis of the X-ray substantially coincides with the pass line of the sheet-like object in the inspection section. X-rays transmitted through the sheet-like material are received by a scintillator, and the sheet-like material is inspected based on the state of the visible light converted by the scintillator. A method for inspecting a sheet-like material according to claim 4.
  6. The aforementioned sheet-like material is light-transmitting, The electromagnetic wave is light, and the light is irradiated toward the surface of the sheet-like material across the inspection section. A method for inspecting a sheet-like material according to claim 4.

Description

This invention relates to an inspection apparatus and a method for inspecting sheet-like materials. In sheet materials such as films and paper, inspections are conducted to detect defects present on the surface or within the sheet material while it is in motion. Generally, this method involves irradiating the sheet material with light, capturing the transmitted or reflected light with a camera, and detecting defects based on the captured image. In this inspection method, the amount of transmitted or reflected light changes at the point of impact, and defects are detected based on this change in light intensity. Furthermore, there are inspection methods that use radiation such as X-rays instead of light. X-rays are emitted onto a sheet-like material, and the X-rays that pass through the sheet are converted into visible light by a scintillator. This visible light is then imaged by a sensor. In this process, if the sheet-like material has defects such as metallic foreign objects, the X-rays are shielded, and the amount of visible light converted by the scintillator changes based on the amount of shielding. The defects are then detected based on this change in light intensity. Furthermore, although not a technique related to defect detection, Patent Document 1 discloses a countermeasure against the phenomenon where the amount of change in light or X-rays becomes small when detecting unevenness in the thickness of a light-transmitting film or unevenness in the coating applied to its surface. Patent Document 1 describes a system with one light irradiation means and one light detection means. Between irradiation and detection, the light-transmitting film's pass line is folded multiple times, or a reflector is used to reflect the light multiple times, causing the light to pass through the film multiple times. As a result, even small changes in light intensity due to unevenness, which were small with a single transmission, become larger with multiple transmissions, allowing detection by the light detection means. Japanese Patent Application Publication No. 7-98284 Figure 1 is a schematic diagram of an inspection apparatus for sheet-like materials according to Embodiment 1 of the present invention.Figure 2 is a diagram illustrating the principle of defect detection in Embodiment 1.Figure 3 is a schematic diagram of a conventional inspection device for sheet-like materials.Figure 4 illustrates the principle of defect detection in a conventional inspection device for sheet-like materials.Figure 5 is a schematic diagram of an inspection apparatus for sheet-like materials according to Embodiment 2 of the present invention.Figure 6 is a diagram illustrating the principle of defect detection in Embodiment 2. The following describes embodiments for carrying out the present invention (hereinafter referred to as "embodiments") with reference to the drawings. However, the present invention is not limited by these embodiments. [Embodiment 1] Refer to Figure 1. Figure 1 is a schematic diagram of an inspection apparatus for sheet-like materials according to Embodiment 1 of the present invention. The inspection apparatus for sheet-like materials 1 consists of an irradiation means 2 and a receiving means 3. The sheet-like material 10 is transported while being carried on transport rolls 5a and 5b. Between the transport rolls 5a and 5b, the pass line of the sheet-like material 10 is straight, and electromagnetic waves are irradiated from the irradiation means 2 towards this straight section. The electromagnetic waves irradiated from the irradiation means 2 are received by the receiving means 3 via the sheet-like material 10, and defects in the sheet-like material 10 are detected based on the received electromagnetic waves. The sheet-like material 10 can be film or paper; it is not particularly limited as long as it is in a sheet-like form. The irradiation means 2 is, for example, an X-ray source, and its transmitting axis is positioned so as to substantially coincide with the pass line between the transport rolls 5a and 5b of the sheet-like material 10. The transmitting axis is the central axis of the X-rays emitted from the irradiation means 2. In Embodiment 1, the X-rays irradiated from the illumination means 2 irradiate the sheet-like material 10 over the entire length between the transport rolls 5a and 5b (the X-rays are irradiated in the direction of travel of the sheet-like material 10), so the area between the transport rolls 5a and 5b becomes the inspection section I. The irradiation means 2 may be a source that emits radiation other than an X-ray source, such as gamma rays, or an illumination source that emits light in wavelength ranges such as ultraviolet, visible, infrared, and terahertz. In the case of illumination, LEDs, halogens, metal halide lamps, or fluorescent lamps may be used. The receiving means 3 consists of a scintillator 31 that converts X-rays to visible light and an imaging means 32 that images the visible