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JP-2026075490-A - Electroencephalogram (EEG) measuring device

JP2026075490AJP 2026075490 AJP2026075490 AJP 2026075490AJP-2026075490-A

Abstract

[Problem] To provide an electroencephalogram (EEG) measurement device that can reduce stress on the subject. [Solution] An electroencephalogram measuring device 10 having a mounting part that is attached to the head, the mounting part having an outer casing 100 and a cushion layer 200 attached to the inner surface of the outer casing 100, the cushion layer 200 having a first portion 210 and a second portion 220 located on the outer casing 100 side of the first portion 210 in the thickness direction, the amount of sinking of the first portion 210 measured by the following procedure 1 is 1 mm or more and 8 mm or less, and the amount of sinking of the second portion 220 is 0.5 mm or more and 5 mm or less. 1) Prepare a 50 x 50 x 10 mm sample from the part to be measured. 2) Prepare a push-pull gauge with a Φ20 mm disc-shaped pressure piece attached. 3) Apply pressure to the prepared sample, displacing it by 0.2 mm at a time, and read the load value after each displacement. 4) The total displacement when the load value first exceeds 10 N is defined as the sinking amount in mm. [Selection Diagram] Figure 3

Inventors

  • 中村 健太郎
  • 北添 雄眞
  • 八木澤 隆
  • 山中 健介
  • 浮城 一司
  • 中里 信和
  • 神 一敬
  • 石田 誠

Assignees

  • 住友ベークライト株式会社
  • 国立大学法人東北大学

Dates

Publication Date
20260508
Application Date
20241022

Claims (7)

  1. An electroencephalogram measuring device having a part that is attached to the head, The mounting portion comprises an outer casing and a cushion layer attached to the inner surface of the outer casing. The cushion layer has, in the thickness direction, a first portion and a second portion located closer to the outer casing than the first portion. The measurement is performed according to the following procedure 1: The amount of sinking of the first part is 1 mm or more and 9.5 mm or less. An electroencephalogram (EEG) measuring device in which the amount of sinking of the second part is 0.5 mm or more and 5 mm or less. (Step 1) 1) Prepare a sample measuring 50 x 50 x 10 mm (length x width x thickness) from the area to be measured. 2) Prepare a push-pull gauge with a Φ20 mm disc-shaped pressure piece attached. 3) Apply pressure to the prepared sample, displace it in 0.2 mm increments, and read the load value after the displacement. 4) The total displacement when the load value first exceeds 10 N shall be defined as the sinking amount (mm).
  2. The thickness of the first portion is 1 mm or more and 20 mm or less. The electroencephalogram measuring device according to claim 1.
  3. The thickness of the second portion is 5 mm or more and 25 mm or less. The electroencephalogram measuring device according to claim 1 or 2.
  4. The first part is located on the innermost side of the cushion layer, The electroencephalogram measuring device according to claim 1 or 2.
  5. The first part is the first layer, and the second part is the second layer. The inner surface of the outer casing is made of the second layer and the first layer stacked in that order. The electroencephalogram measuring device according to claim 1 or 2.
  6. The thickness of the cushion layer is 1 mm or more and 45 mm or less. The electroencephalogram measuring device according to claim 1 or 2.
  7. The amount of sinking of the first part, as measured by the following procedure 2, is 0 mm or more and 6.5 mm or less. The electroencephalogram measuring device according to claim 1 or 2. (Step 2) 1) Prepare a sample measuring 50 x 50 x 10 mm (length x width x thickness) from the area to be measured. 2) Prepare a push-pull gauge with a Φ20 mm disc-shaped pressure piece attached. 3) Apply pressure to the prepared sample, displace it in 0.2 mm increments, and read the load value after the displacement. 4) The total displacement when the load value first exceeds 1 N is defined as the sinking amount (mm).

Description

This invention relates to an electroencephalogram (EEG) measurement device. In electroencephalography (EEG), electrodes are placed in contact with the head to perform electrical measurements. The use of helmet-type EEG devices is being considered for EEG measurements. Patent Document 1 describes a helmet-type electroencephalogram (EEG) measurement device. Patent Application No. 2023-104863 This is a perspective view of the electroencephalogram (EEG) measuring device according to this embodiment.This is a perspective view of an electroencephalogram (EEG) measuring device into which a retaining member is inserted.This is a view of an electroencephalogram (EEG) measuring device from the inside.This is an enlarged view of the dashed line area in Figure 3.Figure 1 shows how to use the electroencephalogram (EEG) measurement device.Figure 2 shows how to use the electroencephalogram (EEG) measurement device.Figure 3 shows how to use the electroencephalogram (EEG) measurement device.Figure 4 shows how to use the electroencephalogram (EEG) measurement device. The embodiments of the present invention will be described below with reference to the drawings. In all drawings, similar components are denoted by the same reference numerals, and their descriptions are omitted where appropriate. Figure 1 is a perspective view of the electroencephalogram (EEG) measuring device 10 according to this embodiment, worn on a subject. Figure 2 is a perspective view of the EEG measuring device 10 with the holding member 140 inserted. The holding member 140 will be described later. Figure 3 is an internal view of the EEG measuring device 10 according to this embodiment. Figure 4 is an enlarged view of the dashed line area in Figure 3. As shown in Figures 3 and 4, the electroencephalogram (EEG) measuring device 10 has a mounting portion 11 that is attached to the head. The mounting portion 11 includes an outer casing 100 and a cushioning layer 200. The cushioning layer 200 is provided inside the outer casing 100. In other words, the cushioning layer 200 is held in place by the outer casing 100. The cushion layer 200 includes, in the thickness direction, a first portion 210 and a second portion 220 located closer to the outer casing 100 than the first portion 210. The physical properties of the first portion 210 and the second portion 220 will be described later. Furthermore, the electroencephalogram (EEG) measuring device 10 includes a plurality of second through-holes 114. Electrodes 120 are supported on the cushion layer 200 side of the second through-holes 114. The second through-holes 114 are used to inject a measurement support fluid to reduce the resistance between the scalp and the electrodes 120. The specific uses of the second through-holes 114 will be described later. Furthermore, as shown in Figures 1 and 2, the outer casing 100 may include multiple separate parts that are joined together. In this case, the shape of the outer casing 100 can be adapted to the shape of the subject's head, thereby improving the close fit of the electroencephalogram (EEG) measuring device 10 to the subject's head. The following describes the details of each component of the electroencephalogram (EEG) measurement device 10. [Outer shell 100] The outer casing 100 is formed on the outside of the electroencephalogram measuring device 10. The outer casing 100 forms the outer casing of the electroencephalogram measuring device 10 and has a cushioning layer 200 on its inner surface, i.e., the surface that comes into contact with the head. Furthermore, the outer casing 100 may include multiple separate parts that are joined together. For example, the outer casing 100 may be divided into four parts, six parts, or eight parts. Even when the outer casing 100 is divided into multiple parts, it does not deform except for the change in the distance between each part. However, the outer casing 100 may also be a single, integrated structure. Furthermore, the material constituting the outer casing 100 is not particularly limited as long as it has sufficient hardness to hold the cushion layer 200; however, resin is used as an example. Furthermore, the width W1 of the outer casing 100, when viewed from the inside, from one temporal region to the other, and the width W2 from the frontal region to the occipital region, are appropriately set according to the subject. Furthermore, the thickness T1 of the outer casing 100 is not particularly limited, but is preferably, for example, 1 mm or more and 50 mm or less, and more preferably 1 mm or more and 10 mm or less. By having a thickness T1 of the outer casing 100 equal to or greater than the lower limit, the outer casing 100 can achieve sufficient strength. Also, by having a thickness T1 of the outer casing 100 equal to or less than the upper limit, stress on the subject wearing the electroencephalogram (EEG) measuring device 10 can be reduced. [Cushion layer 200] The cushion layer 200 is an elastic body formed on the ins