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JP-2026075836-A - Circuit simulation methods

JP2026075836AJP 2026075836 AJP2026075836 AJP 2026075836AJP-2026075836-A

Abstract

[Problem] One embodiment aims to provide a circuit simulation method that can improve the accuracy of the simulation. [Solution] According to one embodiment, a circuit simulation method is provided. The circuit simulation method includes acquiring a plurality of device characteristics that have been measured in advance under operating terminal conditions. The circuit simulation method includes setting a plurality of model parameters corresponding to the measured plurality of device characteristics. The circuit simulation method includes finding a single objective function that includes the plurality of model parameters. The circuit simulation method includes minimizing the single objective function and optimizing the plurality of model parameters. The circuit simulation method includes outputting the optimized plurality of model parameters to a circuit simulator. [Selection Diagram] Figure 7

Inventors

  • 江川 典幸
  • 松縄 哲明

Assignees

  • キオクシア株式会社

Dates

Publication Date
20260511
Application Date
20241023

Claims (7)

  1. To acquire multiple device characteristics under operating terminal conditions, Setting multiple model parameters corresponding to the aforementioned multiple device characteristics, To find a single objective function that includes the aforementioned multiple model parameters, Minimizing the aforementioned single objective function and optimizing the aforementioned multiple model parameters, Outputting the above-mentioned optimized model parameters to the circuit simulator, Circuit simulation methods including...
  2. To find the aforementioned single objective function, Using the aforementioned multiple model parameters, calculate multiple device characteristics under the aforementioned operating terminal conditions, The single objective function is generated using the multiple differences between the multiple device characteristics obtained and the multiple device characteristics calculated. The circuit simulation method according to claim 1, including the following:
  3. The generation of the aforementioned single objective function is The process involves generating multiple scalarization functions using the aforementioned multiple differences, To generate the single objective function that includes the plurality of scalarization functions, The circuit simulation method according to claim 1, including the following:
  4. The generation of the aforementioned single objective function is The process involves generating multiple scalarization functions using the aforementioned multiple differences, The single objective function is generated by taking the weighted mean square root of the plurality of scalarization functions, The circuit simulation method according to claim 3, including the following:
  5. Optimizing the aforementioned multiple model parameters is The circuit simulation method according to claim 1, comprising using a probabilistic algorithm to find the plurality of model parameters that minimize the single objective function.
  6. Optimizing the aforementioned multiple model parameters is The first probabilistic algorithm is used to search for initial values for the single objective function, Using a second probabilistic algorithm, find the multiple model parameters that minimize the single objective function with the searched initial values, The circuit simulation method according to claim 5, including the following:
  7. To obtain the above means, The circuit simulation method according to claim 1, comprising performing measurements on a device under the operating terminal conditions and obtaining the characteristics of the plurality of devices under the operating terminal conditions.

Description

This embodiment relates to a circuit simulation method. In circuit simulation methods, the operation of a device is simulated using multiple model parameters corresponding to multiple device characteristics. Improving the accuracy of the simulation is desirable in circuit simulation methods. Japanese Patent Publication No. 2002-124666Japanese Patent Publication No. 2006-202966Japanese Patent Publication No. 2007-80062Japanese Patent Publication No. 2010-061190Japanese Patent Publication No. 2010-067830 A diagram showing the functional configuration of an information processing device on which the circuit simulation method according to the embodiment is executed.A diagram showing device characteristic data in an embodiment.A diagram showing device characteristic data in an embodiment.A data flow diagram showing the flow of information in a circuit simulation method according to an embodiment.A diagram showing the hardware configuration of an information processing device on which the circuit simulation method according to the embodiment is executed.A flowchart illustrating the general circuit simulation method according to the embodiment.A flowchart illustrating the details of the circuit simulation method according to the embodiment.A flowchart illustrating a circuit simulation method according to a first modified example of the embodiment.A flowchart illustrating a circuit simulation method according to a second modified example of the embodiment.A flowchart illustrating a circuit simulation method according to a third modified example of the embodiment. The circuit simulation method according to the embodiment will be described in detail below with reference to the attached drawings. Note that the present invention is not limited to this embodiment. (Embodiment) The circuit simulation method according to the embodiment simulates the operation of a device using multiple model parameters corresponding to multiple device characteristics, and measures are taken to improve the accuracy of the simulation. The circuit simulation method may be performed using an information processing device 1 as shown in Figure 1. Figure 1 is a diagram showing the functional configuration of the information processing device 1 on which the circuit simulation method according to this embodiment is executed. The information processing device 1 can be connected to the measuring device MD and the circuit simulator CS, respectively. The measuring device MD has a measuring terminal, and by connecting the measuring terminal to the operating terminal of device DV, it is possible to measure the operating characteristics of device DV. Device DV is, for example, a transistor, including a MOSFET type transistor. The operating terminals include the gate terminal, source terminal, and drain terminal. The measuring device MD can measure multiple device characteristics of device DV under operating terminal conditions. Operating terminal conditions include the applied voltage or current to the operating terminals. The information processing device 1 acquires multiple device characteristics under operating terminal conditions from the measuring device MD. Once the multiple device characteristics are acquired, the information processing device 1 starts the model extraction program 96 and sets multiple model parameters corresponding to the multiple device characteristics according to the model extraction program 96. The information processing device 1 obtains a single objective function containing multiple model parameters according to the model extraction program 96. The information processing device 1 calculates multiple device characteristics under operating terminal conditions using the multiple model parameters. The information processing device 1 generates an objective function using multiple differences between the acquired multiple device characteristics and the calculated multiple device characteristics. For example, the information processing device 1 generates multiple scalarization functions using multiple differences and generates a single objective function containing multiple scalarization functions. The information processing device 1 may also generate the single objective function by taking the weighted mean square root of the multiple scalarization functions. The information processing device 1 minimizes a single objective function and optimizes multiple model parameters according to the model extraction program 96. The information processing device 1 uses a probabilistic algorithm to minimize the single objective function and optimize multiple model parameters. For example, the information processing device 1 may use a first probabilistic algorithm to search for initial values of multiple model parameters that minimize a single objective function. The information processing device 1 may then use a second probabilistic algorithm to find multiple model parameters that minimize the single objective function using the searched initia