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JP-2026075980-A - Dimensional measurement management system and dimensional measurement management method

JP2026075980AJP 2026075980 AJP2026075980 AJP 2026075980AJP-2026075980-A

Abstract

[Problem] The object of the present invention is to provide a dimensional measurement management system and a dimensional measurement management method that can improve the economic efficiency of dimensional measurement. [Solution] The dimensional measurement management system of the present invention is characterized by comprising: a shape information extraction unit that extracts shape information to be measured from the design information of a target member; a measurement coordinate calculation unit that calculates measurement coordinates from the shape information extracted by the shape information extraction unit; a measurement area setting unit that sets a measurement area based on the measurement coordinates calculated by the measurement coordinate calculation unit and the dimensional information of a measuring instrument; an interference check unit that compares the measurement area generated by the measurement area setting unit with the design information to perform an interference check; and a measurement feasibility determination unit that determines whether measurement is possible or not based on the results of the interference check unit. [Selection Diagram] Figure 1

Inventors

  • 中野 博之
  • 皆川 俊介
  • 荒川 貴行
  • 多田 岳史
  • 鈴木 優斗

Assignees

  • 株式会社日立製作所

Dates

Publication Date
20260511
Application Date
20241023

Claims (11)

  1. A shape information extraction unit extracts shape information to be measured from the design information of the target component, A measurement coordinate calculation unit calculates measurement coordinates from the shape information extracted by the shape information extraction unit, A measurement area setting unit sets a measurement area based on the measurement coordinates calculated by the measurement coordinate calculation unit and the dimensional information of the measuring instrument, An interference check unit compares the measurement area generated by the measurement area setting unit with the design information to perform interference checks, A dimensional measurement management system characterized by having a measurement feasibility determination unit that determines whether measurement is possible or not based on the results of the interference check unit.
  2. In the dimensional measurement management system according to claim 1, A dimension measurement management system characterized by having a measuring instrument dimension database that stores dimensional information of the measuring instrument and can transmit the dimensional information of the measuring instrument to the measurement area setting unit.
  3. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the dimensional information of the measuring instrument includes the dimensions of the contact probe of the measuring instrument.
  4. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the dimensional information of the measuring instrument includes the dimensions of the holding part of the measuring instrument.
  5. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the dimensional information of the measuring instrument includes the dimensions of the movable parts of the measuring instrument.
  6. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the shape information is the contour or surface of the target member to be measured.
  7. In the dimensional measurement management system according to claim 1, The dimensional measurement management system is characterized in that the measurement feasibility determination unit compares the measurement error with the tolerance of the measurement coordinates to determine whether measurement is possible or the number of measurement points.
  8. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the shape used in the measurement area setting unit is the actual shape of the measuring instrument.
  9. In the dimensional measurement management system according to claim 1, A dimensional measurement management system characterized in that the shape used in the measurement area setting unit is a geometrically simplified shape of the actual shape of the measuring instrument.
  10. A shape information extraction step that extracts shape information to be measured from the design information of the target component, A measurement coordinate calculation step which calculates measurement coordinates from the shape information extracted in the shape information extraction step, A measurement area setting step in which a measurement area is set based on the measurement coordinates calculated in the measurement coordinate calculation step and the dimensional information of the measuring instrument, An interference check step which compares the measurement area generated in the measurement area setting step with the design information to perform an interference check, A dimensional measurement management method characterized by including a measurement feasibility determination step that determines whether measurement is possible or not based on the results of the interference check step.
  11. In the dimensional measurement control method according to claim 10, The dimensional measurement management method is characterized in that the measurement feasibility determination step includes comparing the measurement error with the tolerance of the measurement coordinates to determine whether measurement is possible or the number of measurement points.

Description

This invention relates to a dimensional measurement management system and a dimensional measurement management method. Geometric tolerance control is commonplace in manufacturing. One example of geometric tolerance control is positional tolerance. For instance, the center point of a circle must lie within a circle with a diameter of 0.1 mm. Since the center of a circle cannot be measured directly, a contact-type three-dimensional coordinate measuring instrument is used to measure the three-dimensional coordinates of multiple points on the circumference. The acquired data is then applied to determine the circle's center. Three-dimensional coordinate measuring instruments are generally of the gantry-type contact type. A spherical contact element attached to the tip of a probe is moved by a three-dimensional (X, Y, Z) movement mechanism and applied to the object being measured, which is placed on a surface plate, to acquire its three-dimensional coordinates. Therefore, it is necessary to determine the point on the object to be measured and confirm whether that point can be measured by the three-dimensional coordinate measuring instrument. At this time, the size of the three-dimensional coordinate measuring instrument includes not only the size of the probe sphere that contacts the object being measured, but also the size of the movement mechanism and holding mechanism. Therefore, it is necessary to confirm whether the probe and the aforementioned mechanisms will collide with (interfere with) the object being measured. Patent Document 1 discloses a technology for an interference checking device comprising: a model number limit input unit that receives the upper limit of the number of geometric models to be set as the modeling target for interference checking; a modeling processing unit that generates model candidates from the modeling target using geometric models up to or less than the model limit; a processing calculation amount limit setting unit that sets the upper limit of the calculation amount for interference checking based on the amount of calculation required for each process of the controller that controls the modeling target; a minimum inclusion volume model determination unit that determines the model candidate with the smallest inclusion volume from among the model candidates that can perform interference checking calculation processing up to or less of the calculation limit as the model to be modeled; and an interference checking unit that performs interference checking between models using the determined model. Patent Document 2 discloses a technique in which, based on 3D CAD data received from a 3D CAD device, a 3D CAM device performs interference checks between the workpiece and the entire machining system, including the NC machine, based on the 3D CAD data, before creating machining paths. This check is performed by a pre-machining analysis unit, specifically for interference checks of the movement of jigs, tool holders, spindle heads, during table rotation, or during automatic tool changes. International Publication No. 2014/122995Japanese Patent Publication No. 2001-154715 This diagram shows the components for determining whether or not dimensional measurement is possible in the embodiment.An example of design information is shown below.This is a diagram showing a contact-type three-dimensional measuring machine.This is a magnified view of the tip of a contact-type three-dimensional measuring machine.This is a diagram showing a hollow cylinder as an example of the target component.This figure shows the measurement points of the hollow cylinder in the example.This diagram shows the contact probe of a contact-type three-dimensional measuring machine.This is a detailed enlarged view of the tip of a contact-type three-dimensional measuring machine.This figure shows the position of the tip sphere of the contact probe in the embodiment.This figure shows the region over which the tip sphere of the contact probe moves in the embodiment.This figure shows the contact-type three-dimensional measuring machine of the embodiment in contact with the measurement point.This diagram illustrates the collision (interference) between the target component of the embodiment and a contact-type three-dimensional measuring machine.This diagram illustrates how optimizing the contact probe in the embodiment can prevent interference between the target component and the contact-type three-dimensional measuring machine.This figure shows a simplified representation of the movable parts of the contact-type three-dimensional measuring machine of the embodiment.This figure shows a simplified version of the movable part of the contact-type three-dimensional measuring machine in the embodiment, moved to the measurement point.This diagram shows the direction in which the contact probe approaches the hollow cylinder in the embodiment.This figure shows the hollow cylinder of the target component example and the measurement area s