JP-7854614-B2 - Generation method, generation apparatus, and program
Inventors
- 竹澤 昌宏
- 原 伸夫
- 中橋 昭久
Assignees
- パナソニックIPマネジメント株式会社
Dates
- Publication Date
- 20260507
- Application Date
- 20220415
Claims (7)
- A generation method for generating an estimation formula for estimating observed values obtained from a physical phenomenon, based on condition values that indicate the conditions of the physical phenomenon, Obtain multiple first parameter values, A second parameter value, representing the result of a simulation simulating the physical phenomenon performed using each of the aforementioned multiple first parameter values as a condition value, is obtained in association with the first parameter value. Among the plurality of first parameter values, one or more first parameter values are identified in which the second parameter value associated with the first parameter value belongs to a predetermined range including the observed value. A generation method for generating and outputting the estimation formula based on the one or more first parameter values identified and the second parameter values associated with each of the one or more first parameter values.
- In the above generation method, Obtain multiple third parameter values prepared as conditional values for the aforementioned simulation, A fourth parameter value, representing the result of the simulation performed using each of the aforementioned multiple third parameter values as a condition value, is obtained in correspondence with the said third parameter value. The acquisition process is performed one or more times to obtain a new third parameter value using the plurality of third parameter values and the plurality of fourth parameter values. The plurality of third parameter values and the new third parameter value obtained by the acquisition process are acquired as the plurality of first parameter values. In the aforementioned acquisition process, A provisional estimation formula is generated to estimate the fourth parameter value associated with each of the aforementioned multiple third parameter values, The generation method according to claim 1, wherein a new third parameter value indicating the conditions of the physical phenomenon is obtained, the new third parameter value whose estimated value, estimated from the new third parameter value by the provisional estimation formula, falls within the predetermined range.
- In the aforementioned acquisition process, further, It is determined whether the new fourth parameter value, which shows the results of the simulation performed using the new third parameter value as a condition value, falls within the predetermined range. If, in one of the acquisition processes described above, it is determined that the new fourth parameter value does not fall within the predetermined range, The generation method according to claim 2, wherein the new third parameter value is added to the plurality of third parameter values, and the new fourth parameter value is added to the plurality of fourth parameter values, and then the next acquisition process of one of the acquisition processes is performed.
- The acquisition process described above is performed up to a maximum of N times. The generation method according to claim 3, wherein, in each of the N acquisition processes, if it is determined that the new fourth parameter value does not fall within the predetermined range, one or more first parameter values are identified and the estimation formula is generated.
- moreover, The predetermined range is determined such that it includes a predetermined proportion of the second parameter values among a plurality of the aforementioned second parameter values. The generation method according to any one of claims 1 to 4, wherein the estimation formula is generated using the predetermined range determined.
- A generating device that generates an estimation formula for estimating observed values obtained from a physical phenomenon, based on condition values that indicate the conditions of the physical phenomenon, An acquisition unit that acquires multiple first parameter values and acquires second parameter values, which represent the results of a simulation that simulates the physical phenomenon performed using each of the multiple first parameter values as a condition value, in association with the first parameter values. A specification unit identifies one or more first parameter values among the plurality of first parameter values, the second parameter value associated with the first parameter value belongs to a predetermined range including the observed value, A generating device comprising a generating unit that generates and outputs the estimation formula based on the one or more first parameter values identified and the second parameter values associated with each of the one or more first parameter values.
- A program that causes a computer to execute the generation method described in claim 1.
Description
This invention relates to a generation method, a generation apparatus, and a program. Recent advances in computer technology have led to the widespread use of numerical analysis or numerical simulation (also simply called simulation) in various fields to simulate physical phenomena. For example, Patent Document 1 describes a method for identifying difficult-to-measure thermophysical properties by measuring the temperature of an object made of multiple materials. Japanese Patent Publication No. 2005-140693 This is a block diagram showing the configuration of the generating apparatus in the embodiment.This is a flowchart illustrating the generation method in the embodiment.This is the first explanatory diagram illustrating the compression shear test of a powder.This is the second explanatory diagram illustrating the compression shear test of powder.This is the third explanatory diagram illustrating the compression shear test of powder.This is an explanatory diagram showing the relationship between parameters and estimation formulas in a simulation.This is an explanatory diagram showing an example of the response under the experimental design conditions in the embodiment.This is an explanatory diagram showing an example of estimated value 1 under the experimental design conditions in the embodiment.This is an explanatory diagram showing the accuracy of estimation formula 1 in the example.This is an explanatory diagram showing an example of estimated value 1 under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing an example of the response under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing an example of estimated value 2 under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing the accuracy of estimation formula 2 in the example.This is an explanatory diagram showing an example of estimated value 2 under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing an example of the response under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing an example of estimated value 3 under the conditions of the experimental design and confirmation simulation in the embodiment.This is an explanatory diagram showing the accuracy of estimation formula 3 in the example.This is an explanatory diagram showing an example of the response and estimated value 3 under the conditions of the experimental design and confirmation simulation in the embodiment.This is a flowchart showing a production method in a modified example of the embodiment. (Knowledge that formed the basis of this invention) Simulations are conducted during the design phase of an industrial device or machine, for example, to evaluate in advance whether it can perform in a manner suitable for its intended use. Based on the results of these simulations, the design of the device or machine may then be optimized. To accurately simulate physical phenomena in such industrial devices or machinery, the analysis parameters provided to the analysis program must be appropriate. These analysis parameters include, for example, material properties, initial or boundary conditions, or model parameters contained within the physical model used to describe the physical phenomena within the analysis program. For example, to evaluate the temperature distribution of electronic components, heat transfer simulations based on estimation formulas for the heat conduction equation are sometimes performed. In such cases, unless appropriate analytical parameters are provided, such as the amount of heat flowing in and out as boundary conditions, and material properties like thermal conductivity, specific heat, or density, sufficient analytical accuracy for practical use cannot be obtained. However, when dealing with actual industrial equipment or machinery, it is often difficult to know all of these analytical parameters accurately in advance. For example, while thermal properties such as thermal conductivity or specific heat can be measured relatively easily, many parameters are difficult to measure, such as thermal resistance between complexly assembled components or the effects of heat transfer due to natural convection. Furthermore, not only in heat transfer simulations, but also in powder simulations, for example, methods such as the discrete element method are generally used. The analytical parameters required in these methods include the friction coefficient between particles, rolling resistance, and surface energy. These are parameters that are extremely difficult to measure individually, and they change depending on the combination of multiple powders or the combination of powder and structure. Therefore, incorpo