JP-7854969-B2 - Information processing device, information processing method, and computer program

Inventors

• 竹澤 和輝
• 伊藤 智史
• 長尾 竜也

Assignees

• ＫＤＤＩ株式会社

Dates

Publication Date

20260507

Application Date

20230720

Claims (6)

1. An acquisition unit that acquires an image of the object, the object shooting distance which is the distance from the position of the imaging device that captured the image to the object which is the subject, and the complex dielectric constant of the object. A surface roughness value acquisition unit that obtains a surface roughness value indicating the surface roughness of the object from the aforementioned image, A correlation distance acquisition unit that determines a correlation distance corresponding to the object shooting distance and the frequency components of the image, A scattering loss calculation unit calculates the scattering loss of the object using the surface roughness value, the complex dielectric constant, and the correlation distance. An information processing device equipped with the following features.
2. The surface roughness value acquisition unit is, Extract the outline of the object from the aforementioned image, The brightness distribution is obtained from the aforementioned image. Based on the relationship between the number of objects in a pre-determined contour, their brightness distribution, and their surface roughness values, the number of objects in the extracted contour and the surface roughness values corresponding to the determined brightness distribution are obtained. The information processing apparatus according to claim 1.
3. The correlation distance acquisition unit, From the aforementioned image, the power spectrum was obtained. From the relationship between the power spectrum of a pre-determined image, the distance from the position of the imaging device that captured the image to the subject, and the correlation distance, the correlation distance corresponding to the obtained power spectrum and the object's shooting distance is obtained. The information processing apparatus according to claim 1.
4. The scattering loss calculation unit obtains, from the surface roughness value, the complex dielectric constant, and the correlation distance, a first parameter used in the scattering loss model that determines the beam width of the scattered wave for each surface element, and a second parameter that determines the intensity of the scattered wave for each surface element. The information processing apparatus according to claim 1.
5. An information processing method performed by an information processing device, An acquisition step to acquire an image showing the object, the object shooting distance which is the distance from the position of the imaging device that captured the image to the object which is the subject, and the complex permittivity of the object, A surface roughness value acquisition step, which involves obtaining a surface roughness value indicating the surface roughness of the object from the aforementioned image, A correlation distance acquisition step that determines the correlation distance corresponding to the object shooting distance and the frequency components of the image, A scattering loss calculation step in which the scattering loss of the object is calculated using the surface roughness value, the complex dielectric constant, and the correlation distance, Information processing methods including
6. On the computer, An acquisition step to acquire an image showing the object, the object shooting distance which is the distance from the position of the imaging device that captured the image to the object which is the subject, and the complex permittivity of the object, A surface roughness value acquisition step, which involves obtaining a surface roughness value indicating the surface roughness of the object from the aforementioned image, A correlation distance acquisition step that determines the correlation distance corresponding to the object shooting distance and the frequency components of the image, A scattering loss calculation step in which the scattering loss of the object is calculated using the surface roughness value, the complex dielectric constant, and the correlation distance, A computer program designed to execute something.

Description

This invention relates to an information processing device, an information processing method, and a computer program. Conventionally, methods for estimating the propagation loss of electromagnetic waves in the 300 GHz band have been studied (see, for example, Non-Patent Documents 1 and 2). Non-Patent Document 1 examines the scattering of 300 GHz electromagnetic waves due to walls. Non-Patent Document 2 examines scattering loss using the ER model (scattering loss model). Masaaki Urahashi, Ryo Okumura, Koji Suizu, and Akihiko Hirata, “Complex Permittivity Evaluation of Building Materials at 200-500 GHz Using THz-TDS,” IEEE, 2020Vittorio Degli-Esposti, “A Diffuse Scattering Model for Urban Propagation Prediction,” IEEE Transactions on Antennas and Propagation, Volume 49, Issue 7, July 2001 This block diagram shows an example configuration of an information processing device according to one embodiment.This figure shows an overview of a method for estimating the transmission path of electromagnetic waves according to one embodiment.This figure shows an example of an information processing method according to one embodiment.This is a diagram illustrating the surface roughness value according to one embodiment.This figure illustrates an example of a method for calculating surface roughness value and correlation distance according to one embodiment.This figure illustrates an example of a method for calculating surface roughness value and correlation distance according to one embodiment.This figure illustrates an example of a method for calculating surface roughness value and correlation distance according to one embodiment.This figure illustrates an example of a method for calculating surface roughness value and correlation distance according to one embodiment.This figure illustrates an example of a method for calculating ER model parameters according to one embodiment.This figure illustrates an example of a method for calculating ER model parameters according to one embodiment.This figure illustrates an example of a method for calculating ER model parameters according to one embodiment.This figure illustrates an example of a method for calculating ER model parameters according to one embodiment. Embodiments of the present invention will be described below with reference to the drawings. Figure 1 is a block diagram showing an example configuration of an information processing device according to one embodiment. In Figure 1, the information processing device 1 includes an acquisition unit 11, a surface roughness value acquisition unit 12, a correlation distance acquisition unit 13, a scattering loss calculation unit 14, and a storage unit 20. Each function of the information processing device 1 is realized by the information processing device 1 being equipped with computer hardware such as a CPU (Central Processing Unit) and memory, and the CPU executing computer programs stored in memory. The information processing device 1 may be configured using a general-purpose computer device, or it may be configured as a dedicated hardware device. For example, the information processing device 1 may be configured using a server computer connected to a communication network such as the Internet. Furthermore, each function of the information processing device 1 may be realized through cloud computing. Also, the information processing device 1 may be implemented by a single computer, or its functions may be distributed across multiple computers. Furthermore, the information processing device 1 may be configured to launch a website using, for example, a WWW system. The acquisition unit 11 acquires an image of an object (target image), such as a wall, the object shooting distance (the distance from the position of the imaging device that captured the target image to the object), and the complex dielectric constant of the object. The surface roughness value acquisition unit 12 calculates the surface roughness value, which indicates the surface roughness of the object, from the target image. The correlation distance acquisition unit 13 calculates the correlation distance corresponding to the object shooting distance and the frequency components of the target image. The scattering loss calculation unit 14 calculates the scattering loss of the object using the surface roughness value, complex dielectric constant, and correlation distance. The storage unit 20 stores various data. The acquisition unit 11, surface roughness value acquisition unit 12, correlation distance acquisition unit 13, and scattering loss calculation unit 14 store their processing results in a predetermined area of the storage unit 20. The information processing device 1 outputs the processing results stored in the storage unit 20. For example, the information processing device 1 may display the processing results on a predetermined display device. For example, the information processing device 1 may transmit the processing results to a predetermined destination v