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JP-7855007-B2 - Probe Contact

JP7855007B2JP 7855007 B2JP7855007 B2JP 7855007B2JP-7855007-B2

Inventors

  • ペク、スンハ

Assignees

  • リーノ インダストリアル インコーポレイテッド

Dates

Publication Date
20260507
Application Date
20220413
Priority Date
20210421

Claims (12)

  1. A probe contact that electrically connects a first terminal and a second terminal, A fixed plunger having a first body with one end in contact with the first terminal, and a first stopper protruding laterally with respect to the longitudinal direction of the first body, A second body having one end in contact with the second terminal and the other end in electrical contact with the fixed plunger, and a plurality of movable plungers having a second stopper protruding laterally with respect to the longitudinal direction of the second body, and arranged to slide independently of each other along the longitudinal direction, A spring sandwiched between the first stopper and the second stopper, The first body of the fixed plunger includes a guide rail into which the plurality of movable plungers mesh, The second body of the movable plunger includes a guide groove recessed along the longitudinal direction, formed by opposing rail support portions into which the guide rail is inserted, and the guide rail is supported by the opposing rail support portions when the movable plunger slides relative to the fixed plunger . Probe contact.
  2. The probe contact according to claim 1, wherein only the movable plunger, which is pressurized during inspection, slides.
  3. Each of the plurality of movable plungers includes a first coupling portion whose other end is connected to the other end of the fixed plunger in a manner that allows for relative sliding. The fixed plunger includes a second coupling portion at its other end that is coupled to the first coupling portion. Either the first joint or the second joint includes at least one support projection on the surfaces that are joined together. The other of the first joint and the second joint includes a support groove that accommodates the at least one support projection in an engageable and detachable manner. The probe contact according to claim 1.
  4. The probe contact according to claim 1, wherein the second retaining portion, during inspection, applies an unbalanced force to the end of the spring with respect to the longitudinal central axis of the spring, causing the spring to buckle and deform.
  5. The second body is plate-shaped, The second stopper protrudes in the width direction from one side of the second body. The probe contact according to claim 1.
  6. The probe contact according to claim 5, wherein the second stopper portion of the movable plunger is provided symmetrically with respect to the central axis of the spring at a predetermined position in the longitudinal direction of the second body.
  7. The probe contact according to claim 1, wherein the second stopper portion of the movable plunger protrudes in mutually opposite directions.
  8. The second body is plate-shaped, The second stopper includes a pair of stoppers protruding in the width direction from both sides of the second body, The lower surfaces of the pair of fasteners are provided such that they have different heights from the other end of the second body in the longitudinal direction of the second body. The probe contact according to claim 1.
  9. The second body is plate-shaped, The second stopper protrudes in the thickness direction from one surface of the second body. The probe contact according to claim 1.
  10. The probe contact according to claim 9, wherein the second retaining portion includes an inclined surface that contacts the end of the spring.
  11. The probe contact according to claim 1, wherein the guide rail includes guide walls that extend along the longitudinal direction on both sides and protrude in the thickness direction.
  12. An inspection socket supporting a probe contact as described in any one of claims 1 to 11.

Description

This invention relates to a probe contact for inspecting the electrical characteristics of an object under inspection. The probe contact can electrically interconnect the first terminal of the test circuit board and the second terminal of the object under test in order to inspect the electrical characteristics of the object under test. A probe contact comprising a first plunger, a second plunger and a third plunger slidably mounted on both sides of the first plunger, a small-diameter first spring provided between the first and second plungers, and a large-diameter second spring housing the first spring and provided between the first and third plungers has been disclosed in Patent Document 1. Japanese Patent No. 5629611 This is a perspective view showing a probe contact according to the first embodiment of the present invention. This diagram shows the probe contact in disassembled form, as shown in Figure 1. This is a side view of the probe contact. This is a cross-sectional view taken along lines A-A and B-B in Figure 3. Figure 4 is a cross-sectional view showing the state in which the first and second movable plungers slide independently. Figure 4 is a cross-sectional view showing the state in which the first and second movable plungers are sliding simultaneously. This figure shows the contact state of the first and second movable plungers with respect to the second terminal of a BGA type. This figure shows the contact state of the first and second movable plungers with respect to the pad-type second terminal. This figure shows a movable plunger according to a second embodiment of the present invention. This figure shows a plurality of movable plungers according to a third embodiment of the present invention. This figure shows a probe contact to which the movable plunger of Figure 10 is applied. This figure shows a plurality of movable plungers according to a fourth embodiment of the present invention. This figure shows a plurality of movable plungers according to a fifth embodiment of the present invention. This figure shows a plurality of movable plungers according to the sixth embodiment of the present invention. Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. Figure 1 is a perspective view showing a probe contact 1 according to the first embodiment of the present invention; Figure 2 is an exploded view of the probe contact 1 in Figure 1; Figure 3 is a side view of the probe contact 1; Figure 4 is a cross-sectional view taken along lines A-A and B-B in Figure 3; Figure 5 is a cross-sectional view showing the state in Figure 4 where the first and second movable plungers 12-1 and 12-2 slide independently; and Figure 6 is a cross-sectional view showing the state in Figure 4 where the first and second movable plungers 12-1 and 12-2 slide simultaneously. The probe contact 1 may be supported parallel to the inspection direction on a flat-plate type inspection socket (not shown). Both ends of the probe contact 1 may partially protrude from the upper and lower surfaces of the inspection socket. During inspection, the second terminal 31 of the object under inspection 3 may press on one end of the probe contact 1 protruding from the upper or lower surface. At this time, the probe contact 1 can electrically connect, for example, the first terminal 21 of the inspection circuit board 2 to the second terminal 31 of the object under inspection 3, such as a semiconductor. Referring to Figures 1 to 6, the probe contact 1 may include a fixed plunger 11 with one end in contact with the first terminal 21 of the test circuit board 2, a plurality of movable plungers 12 with one end in contact with the second terminal 31 of the object to be tested 3, and a spring 13 provided between the fixed plunger 11 and the movable plungers 12 to provide elastic force. The fixed plunger 11 may include a first body 111 and a pair of first stopper portions 112 that protrude laterally with respect to the longitudinal direction of the first body 111. The fixed plunger 11 is made of a conductive material and may be manufactured using MEMS (microelectromechanical systems) or a mold. The first body 111 may include a fixed contact portion 113 provided at one end to contact the first terminal 21, and a first coupling portion 114 provided at the other end. The first coupling portion 114 may include a guide rail 1141 inserted into the guide groove 1241 of the movable plunger 12, and guide walls 1142 protruding from both side walls of the guide rail 1141. The guide rail 1141 is plate-shaped and may have a thickness equal to or greater than the width of the guide groove 1241 of the movable plunger 12. The guide rail 1141 is provided with fastening grooves 1141a recessed in the width direction on both sides. The fastening grooves 1141a may detachably engage with fastening projections 1241a provided on the rail support portion 1242 of the movable plunger 12. The guide wall 1142 prev