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KR-102963754-B1 - DISPLAY DEVICE AND DISPLAY DEVICE INSPECTION METHOD

KR102963754B1KR 102963754 B1KR102963754 B1KR 102963754B1KR-102963754-B1

Abstract

A display device according to one embodiment of the present invention includes a display layer in which an active area in which a plurality of pixels are arranged and a peripheral area adjacent to the active area are defined, and the display layer includes a transistor arranged in the active area and comprising a gate, a source, and a drain, a first crack line arranged in the peripheral area and surrounding at least a portion of the active area when viewed in a plane, and a second crack line arranged in the peripheral area and placed below the first crack line, and the first crack line and the second crack line may be insulated from each other.

Inventors

  • 지안호
  • 박상우
  • 조성호

Assignees

  • 삼성디스플레이 주식회사

Dates

Publication Date
20260513
Application Date
20220114

Claims (20)

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  10. A display device comprising a display layer having an active region in which a plurality of pixels are arranged and a peripheral region adjacent to the active region, wherein the display layer comprises a transistor arranged in the active region and including a gate, a source, and a drain, a first crack line arranged in the peripheral region and surrounding at least a portion of the active region when viewed in a plane, a second crack line arranged in the peripheral region and positioned below the first crack line, and an insulating layer arranged between the first crack line and the second crack line; A step of detecting a defect occurring in the display device based on at least one of the first crack line and the second crack line; and A method for inspecting a display device comprising the step of analyzing the location where the defect occurred based on a Wheatstone Bridge.
  11. In Article 10, The step of analyzing the location of the above defect is a display device inspection method using the Murray Loop method.
  12. In Article 10, The above defect includes a first defect and a second defect different from the first defect, and The step of detecting the above defect is, A first detection step for detecting a first defect of the first crack line based on the first crack line; and A display device inspection method comprising a second detection step for detecting a second defect in the insulating layer based on the first crack line and the second crack line.
  13. In Article 12, The step of analyzing the location of the above defect is a method for inspecting a display device that analyzes the location of the insulating layer that occurred in the above second defect.
  14. In Article 10, A method for inspecting a display device, comprising the step of analyzing the location of the defect, electrically connecting a detector including a Murray loop device to the first crack line.
  15. In Article 10, A method for inspecting a display device, comprising the step of analyzing the location of the above defect and connecting the second crack line to the ground voltage.
  16. In Article 10, A method for inspecting a display device, comprising the step of analyzing the location of the defect, which includes the step of detecting the heat generation location of the first crack line.
  17. A display device comprising a display layer having an active area in which a plurality of pixels are arranged and a surrounding area adjacent to the active area, wherein the display layer comprises a first crack line arranged in the surrounding area and surrounding at least a portion of the active area when viewed in a planar view, and a second crack line arranged in the surrounding area and arranged below the first crack line. A step of detecting defects occurring in the display layer based on the first crack line and the second crack line; and A display device inspection method comprising the step of analyzing the location where the defect occurred using the Murray Loop method.
  18. In Article 17, A method for inspecting a display device, comprising the step of analyzing the location where the above defect occurred, and the step of connecting the second crack line to the ground voltage.
  19. In Article 17, The step of analyzing the location where the above defect occurred is, A step of connecting a detector to the first crack line; and A method for inspecting a display device comprising the step of the first crack line and the detector forming a Wheatstone Bridge.
  20. In Article 17, A method for inspecting a display device, comprising the step of analyzing the location of the defect, which includes the step of detecting the heat generation location of the first crack line.

Description

Display Device and Display Device Inspection Method The present invention relates to a display device capable of inspecting defects in a display device and a method for inspecting a display device. With the recent technological advancement of display devices, display devices including flexible display panels are being developed. The display panel includes multiple pixels for displaying images and a driving chip for driving the pixels. The pixels are placed in the display area of the display panel, and the driving chip is placed in the non-display area of the display panel surrounding the display area. A bending portion is defined between the driving chip and the display area, and the bending portion is bent so that the driving chip is placed at the bottom of the display panel. To reduce the process defect rate of such display devices, a process to inspect for defects and cracks is necessary as a type of pre-shipment inspection. FIG. 1 is a perspective view illustrating a display device according to one embodiment of the present invention. FIG. 2a is a cross-sectional view of a display device according to one embodiment of the present invention. FIG. 2b is a cross-sectional view of a display device according to one embodiment of the present invention. FIG. 3 is a cross-sectional view of a display device cut along I-I' of FIG. 1 according to one embodiment of the present invention. FIG. 4 is a plan view of a display layer according to one embodiment of the present invention. FIG. 5 is a cross-sectional view showing a portion cut along II-II' of FIG. 4 according to one embodiment of the present invention. FIG. 6 is a flowchart illustrating a method for inspecting a display device according to an embodiment of the present invention. FIG. 7a is a plan view of a defective display layer according to one embodiment of the present invention. FIG. 7b is a plan view illustrating the AA' region of FIG. 7a according to one embodiment of the present invention. FIG. 8a is a plan view of a defective display layer according to one embodiment of the present invention. FIG. 8b is a plan view of a defective display layer according to one embodiment of the present invention. FIG. 9 is a cross-sectional view taken along III-III' of FIG. 8a according to one embodiment of the present invention. FIG. 10 is a diagram illustrating the location of a defect by the Murray Loop method according to one embodiment of the present invention. FIG. 11 is a circuit diagram forming a Wheatstone Bridge according to one embodiment of the present invention. In this specification, where a component (or region, layer, part, etc.) is described as being “on,” “connected,” or “joined” another component, it means that it may be directly placed/connected/joined on the other component, or that a third component may be placed between them. Identical reference numerals denote identical components. Additionally, in the drawings, the thicknesses, proportions, and dimensions of components are exaggerated for the effective illustration of the technical content. “And/or” includes all one or more combinations that the associated components may define. Terms such as "first," "second," etc., may be used to describe various components, but said components should not be limited by said terms. These terms are used solely for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be named the second component, and similarly, the second component may be named the first component. A singular expression includes a plural expression unless the context clearly indicates otherwise. Additionally, terms such as “below,” “lower,” “above,” and “upper” are used to describe the relationships between the components depicted in the drawings. These terms are relative concepts and are described based on the directions indicated in the drawings. Terms such as "include" or "have" are intended to specify the existence of the features, numbers, steps, actions, components, parts, or combinations thereof described in the specification, and should be understood as not precluding the existence or addition of one or more other features, numbers, steps, actions, components, parts, or combinations thereof. Unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as generally understood by those skilled in the art to which the present invention pertains. Furthermore, terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant technology, and should not be interpreted in an overly ideal or overly formal sense unless explicitly defined herein. Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view illustrating a display device according to one embodiment of the present invent