KR-102963829-B1 - Jig assembly for element fixing of a burn-in tester

KR102963829B1KR 102963829 B1KR102963829 B1KR 102963829B1KR-102963829-B1

Abstract

The present invention discloses a jig assembly for fixing components of a burn-in tester. The present invention is configured such that, after a large number of micro-components, such as Multilayer Ceramic Capacitors (MLCCs), are inserted into the component grooves of a lower jig, the upper jig is moved in a sliding manner to secure them. Accordingly, when micro-components are inserted into the burn-in chamber for testing or ejected after testing, the micro-components that are stuck to the pogo pins due to static electricity are physically separated and aligned, thereby enabling individual performance testing of the micro-components as well as stably maintaining the test coordinates of each micro-component after testing.

Inventors

구남철
김찬회

Assignees

주식회사디아이

Dates

Publication Date: 20260513
Application Date: 20241227

Claims (12)

A lower jig having an insert base formed with a device groove into which a micro-device is inserted, and guide pins protruding from one end and the other end, respectively; An upper jig having a pogo pin protruding from one surface facing the insert base for electrical connection with the micro-element, and pin holes formed at one end and the other end respectively for fastening the guide pin, and which is coupled to the lower jig while moving linearly in a horizontal direction relative to the guide pin to separate and align the micro-elements; and, A jig assembly for fixing elements of a burn-in tester, characterized by including: a latch member formed at one end and the other end of the lower jig, respectively, which combines the lower jig and the upper jig and guides the horizontal linear movement of the upper jig.
In Article 1, A jig assembly for fixing elements of a burn-in tester, characterized in that the lower jig is connected to the system board of the burn-in tester and has a connector formed therein that applies a test signal to the electrode portion of the micro-element via the pogo pin through a test line or outputs the test results of the micro-elements to the system board.
In Article 2, A first connection part is formed at each end of the lower jig, connected to the connector part and the test line, and A jig assembly for fixing elements of a burn-in tester, characterized in that the upper jig has a second connection portion formed therein that is electrically connected to the first connection portion and applies a test signal to the pogo pin.
In Paragraph 3, The above pinhole is, A first pinhole formed at the lowest end of the bottom side of the upper jig and on which the guide pin is primarily seated; A second pinhole extending horizontally from the first pinhole and on which the guide pin is secondarily seated when the upper jig moves linearly in the horizontal direction; and, A third pinhole formed by stacking to be stepped on the second pinhole and guiding the vertical movement of the upper jig so that the pogo pin is electrically connected to the micro-element; comprising A jig assembly for fixing elements of a burn-in tester, characterized in that a blocking film having a stopper function is formed on one side of the third pinhole to block the upper part of the first pinhole to restrict the vertical movement of the upper jig.
In Article 4, The upper jig above is, A guide frame having the above-mentioned second connection part and a plurality of pinholes formed therein; A substrate frame that is laminated to the guide frame, wherein the pogo pin protruding through the plurality of pinholes is formed, and a test line is formed to be electrically connected to the second connection part; A base frame laminated to the above substrate frame, wherein the third pinhole and the blocking film are formed; and, A jig assembly for fixing elements of a burn-in tester, characterized by being formed with a combined structure of an auxiliary frame formed at one end and the other end of the base frame, wherein the first and second pinholes are formed therein.
In Article 4, A jig assembly for fixing an element of a burn-in tester, characterized in that the pogo pin is configured to maintain a predetermined gap with the insert base so that the upper jig moves linearly in the horizontal direction while vertical movement is restricted by the barrier when the guide pin is first seated in the first pinhole.
In Article 6, A jig assembly for fixing a component of a burn-in tester, characterized in that the pogo pin is configured to be electrically connected to the micro-component inserted into the component groove of the insert base when the guide pin passes through the second pinhole and the third pinhole forming a stacked structure therewith.
In Article 1, A jig assembly for fixing elements of a burn-in tester, characterized in that a first mounting area and a second mounting area are divided and formed in the insert base, and an element groove into which a large amount of the micro-element is inserted is formed in a grid shape in each of the first mounting area and the second mounting area.
In Article 8, A jig assembly for fixing elements of a burn-in tester, characterized in that the upper jig is a block structure mounted in the first mounting area and the second mounting area, respectively, and the pogo pins are formed to protrude in a grid shape on one side so as to match 1:1 with the number of element grooves forming a grid shape.
In Article 1, The above latch member is, A movable guide part having a fixing projection formed protrudingly so as to be fitted and coupled to one end and the other end of the lower jig, respectively; A jig coupling part having a coupling rod formed on one surface, which is coupled to one end and the other end of the upper jig through a fastening member; A jig assembly for fixing elements of a burn-in tester, characterized by including: a jig moving part that moves linearly in a horizontal direction along a moving guide part while being coupled to the coupling rod formed on one surface of the jig coupling part.
In Article 10, A first guide projection is formed protrudingly at one end of the above-mentioned moving guide part, and A jig assembly for fixing elements of a burn-in tester, characterized in that a second guide projection is formed protrudingly on the jig moving part, which comes into contact with and faces the first guide projection.
In Article 10, On one side of the above jig coupling part, a plurality of first fastening blocks are formed protruding through which the coupling rod passes, and On one side of the above jig moving part, a plurality of second fastening blocks are formed protrudingly, intersecting with the first fastening block and through which the connecting rod passes. A jig assembly for fixing elements of a burn-in tester, characterized in that fixing pins are configured to be fastened to both ends of the second fastening block to prevent separation and detachment of the connecting rod penetrating the first and second fastening blocks.

Description

Jig assembly for element fixing of a burn-in tester The present invention relates to a technology for burn-in testing of micro-devices (e.g., multilayer ceramic capacitors (MLCCs)), and more specifically, to a jig assembly for fixing devices in a burn-in tester that enables stable fixing of a large number of micro-devices when they are inserted into a burn-in chamber for testing or ejected after testing. Generally, devices with driving elements underwent reliability testing immediately before shipment. That is, only devices with driving elements that were judged to be good products as a result of the test judgment through the Burn-In process, an electrical characteristic test, were shipped. The burn-in process is a process that continuously accelerates the stress on a driving element under harsh conditions, and it refers to a process for inspecting whether the stressed driving element has deteriorated. However, the burn-in testers applied to the aforementioned burn-in process have not performed any burn-in testing on micro-devices, such as Multilayer Ceramic Capacitors (MLCCs), which are currently used as essential components in small digital devices like mobile phones, digital cameras, and computers. In other words, burn-in testing for micro-devices currently relies on a manual method. Consequently, since burn-in testing is performed on a sampling basis rather than on the entire batch, there has been a problem where a high number of defects occur when micro-devices are applied to products. Accordingly, the applicant filed and obtained registration for a burn-in tester for micro-devices under Patent Publication No. 10-1876966 to improve the above-mentioned problem, and the present invention improves the tray structure, which is a jig structure described in the aforementioned prior patent. In other words, the prior patent describes a method in which, when a micro-element is seated and aligned in an element groove by a vibrating part, the micro-element is pressed through a pressure flange, and at this time, a connection pin (or pogo pin) rises to establish an electrical connection with the micro-element while conducting a test. However, the aforementioned prior patent has a problem in which, when a tray with micro-devices seated in the device grooves of the tray is inserted into a burn-in chamber for testing or ejected after testing, the micro-devices stick to the connection pins due to static electricity and cannot be physically detached. This problem results in unclear test coordinates for the micro-devices seated in each device groove of the tray, and the present invention is designed to improve upon this problem. FIG. 1 is a combined perspective view of a jig assembly for fixing an element as an embodiment of the present invention. FIG. 2 is a cross-sectional view along line AA of FIG. 1 as an embodiment of the present invention. FIG. 3 is a schematic plan view showing the structure of a lower jig as an embodiment of the present invention. FIG. 4 is an enlarged perspective view showing the structure of an insert base as an embodiment of the present invention. FIG. 5 is a schematic side view showing the structure of an upper jig as an embodiment of the present invention. FIG. 6 is a schematic bottom view showing the combined structure of a base frame and an auxiliary frame forming an upper jig as an embodiment of the present invention. FIG. 7 is an enlarged view showing a stacked structure of pinholes formed in a base frame and an auxiliary frame, respectively, as an embodiment of the present invention. FIG. 8 is a diagram of the coupling structure of a latch member as an embodiment of the present invention. FIG. 9 is a separation structure diagram of a latch member as an embodiment of the present invention. FIG. 10 is a schematic plan view showing the state in which an upper jig is initially mounted on a lower jig as an embodiment of the present invention. FIG. 11 is a schematic plan view showing the state in which an upper jig, initially mounted on a lower jig, moves linearly in a horizontal direction as an embodiment of the present invention. The detailed description of the invention refers to the accompanying drawings, which illustrate specific embodiments in which the invention may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention. It should be understood that various embodiments of the invention are different but need not be mutually exclusive. For example, specific shapes, structures, and characteristics described herein may be implemented in other embodiments without departing from the spirit and scope of the invention in relation to one embodiment. It should also be understood that the location or arrangement of individual components within each disclosed embodiment may be changed without departing from the spirit and scope of the invention. Accordingly, the following detailed description is not intended to be limiting,