KR-102964026-B1 - MEMORY TESTING METHOD FOR SYSTEMS REQUIRING FAST BOOTING AND MISSION COMPUTER PROCESSING THE SAME

KR102964026B1KR 102964026 B1KR102964026 B1KR 102964026B1KR-102964026-B1

Abstract

A memory inspection method by a mission computer in a system requiring high-speed booting includes the steps of: checking a BIT flag of a flash memory when the power is turned on; performing a self-inspection on the entire area of a random access memory if the BIT flag is set in the flash memory; storing the RAM inspection result obtained from the self-inspection on the entire area of the random access memory in an uninitialized memory; and proceeding with a booting process including copying a boot table to the random access memory, executing a runtime library, and entering a main function.

Inventors

주지훈
홍언표
최강아
박명철

Assignees

국방과학연구소

Dates

Publication Date: 20260511
Application Date: 20241024

Claims (17)

In a memory inspection method using a mission computer in a system requiring high-speed booting, Step to check the BIT flag of the flash memory when the power is turned on; If a BIT flag is set in the flash memory, a step of performing a self-check on the entire area of the random access memory; A step of storing the RAM inspection result, obtained by performing a self-inspection on the entire area of the above random access memory, in an uninitialized memory; and A memory inspection method comprising steps for performing a booting process including copying a boot table to the random access memory, executing a runtime library, and entering a main function.
In Article 1, A memory inspection method in which the above-mentioned non-initialized memory is a memory included in the above-mentioned random access memory, and the data stored in the above-mentioned non-initialized memory is preserved without being initialized during the booting process.
In Article 1, A memory inspection method that proceeds with the booting process without performing the steps of performing a self-inspection on the entire area of the random access memory and storing the RAM inspection result in the uninitialized memory when the BIT flag is not set in the flash memory.
In Article 1, A memory inspection method further comprising the step of checking a BIT flag in the flash memory after the above booting process is completed, and if the BIT flag is set in the flash memory, deleting the sector in the flash memory where the BIT flag is stored.
In Paragraph 4, A memory inspection method further comprising the step of retrieving and transmitting the RAM inspection result from the above-mentioned non-initialized memory.
In Article 5, A memory inspection method that further includes a step of processing a RAM inspection not to be performed without performing the steps of deleting the sector in which the BIT flag is stored in the flash memory and retrieving and transmitting the RAM inspection result from the uninitialized memory when the BIT flag is not set in the flash memory after the booting process is completed.
In a memory inspection method for a system requiring high-speed booting, A step in which the inspection equipment transmits a detailed memory inspection command to the mission computer; The step of the above mission computer setting a BIT flag in the flash memory; A step of performing a self-check on the entire area of random access memory when the above mission computer is turned on after being turned off; A step of transmitting a command for the detailed inspection result of a memory element to the mission computer when the inspection equipment confirms that the mission computer has finished booting; and A memory inspection method comprising the step of transmitting to the inspection equipment the RAM inspection result in which the mission computer performs a self-inspection on the entire area of the random access memory.
In Article 7, A memory inspection method in which the mission computer checks the BIT flag of the flash memory when the power is turned on, and performs a self-inspection on the entire area of the random access memory if the BIT flag is set in the flash memory.
In Article 8, A memory inspection method in which the mission computer performs a self-inspection on the entire area of the random access memory and stores the RAM inspection result in an uninitialized memory, then performs a boot table in the random access memory, executes a runtime library, and enters a main function.
In Article 9, A memory inspection method in which the above-mentioned non-initialized memory is a memory included in the above-mentioned random access memory, and the data stored in the above-mentioned non-initialized memory is preserved without being initialized during the booting process.
In Article 9, A memory inspection method in which the mission computer checks for a BIT flag in the flash memory after the booting process is completed, and if the BIT flag is set in the flash memory, deletes the sector in the flash memory where the BIT flag is stored.
In Article 9, A memory inspection method in which the above mission computer retrieves the above RAM inspection result from the above non-initialized memory and transmits it to the above inspection equipment.
Flash memory; Random access memory; and It includes uninitialized memory included in the above random access memory, and A mission computer that, when the power is turned on, checks the BIT flag of the flash memory, and if the BIT flag is set in the flash memory, performs a self-check on the entire area of the random access memory, stores the RAM check result of the self-check on the entire area of the random access memory in the uninitialized memory, and then proceeds with a booting process including copying a boot table to the random access memory, executing a runtime library, and entering a main function.
In Article 13, A mission computer in which the RAM test result stored in the above-mentioned non-initialized memory is preserved without being initialized during the above-mentioned boot process.
In Article 13, A mission computer that proceeds with the booting process without performing the step of performing a self-check on the entire area of the random access memory and the step of storing the RAM check result in the uninitialized memory when the BIT flag is not set in the flash memory.
In Article 13, A mission computer that checks for a BIT flag in the flash memory after the above booting process is completed, deletes the sector in the flash memory where the BIT flag is stored if the BIT flag is set in the flash memory, retrieves the RAM test result from the above uninitialized memory, and transmits it to a test device.
In Article 16, A mission computer that processes the non-performance of RAM inspection without performing the steps of deleting the sector in which the BIT flag is stored in the flash memory and retrieving and transmitting the RAM inspection result from the uninitialized memory when the above booting process is completed and the BIT flag is not set in the flash memory.

Description

Memory Testing Method for Systems Requiring Fast Booting and Mission Computer Processing the Same The present invention relates to a memory inspection method for a system requiring high-speed booting and a mission computer performing the same. In embedded systems, checking Random Access Memory (RAM) during booting is critical to ensuring system reliability and stability. Particularly in environments where high reliability is essential, such as the Mission Computer (MC) on an aircraft, detecting memory defects in advance can prevent mission failure. Mission computers perform a Built-In Test (BIT) during booting, and the test items include a Random Access Memory (RAM) test. Generally, since mission computers must complete booting quickly (e.g., within 1 second) once power is applied, the test is performed on only a portion of the Random Access Memory area to account for the boot time. Additionally, the Random Access Memory (RAM) test in existing mission computers is performed after the boot table is copied and is executed by writing test patterns to memory and reading them to compare values; therefore, there is a limitation in that the test is performed only on areas of Random Access Memory (RAM) that are not used by the software. FIG. 1 is a block diagram showing a mission computer according to one embodiment of the present invention. FIG. 2 is a flowchart illustrating a method for performing a memory inspection based on commands of an inspection device according to one embodiment of the present invention. FIG. 3 is a flowchart illustrating the process of a mission computer performing a memory inspection method according to one embodiment of the present invention. Hereinafter, embodiments of the present invention will be described in detail with reference to the attached drawings so that those skilled in the art can easily implement the present invention. The present invention may be embodied in various different forms and is not limited to the embodiments described herein. To clearly explain the present invention, parts unrelated to the explanation have been omitted, and the same reference numerals are used for identical or similar components throughout the specification. Furthermore, throughout the specification, when a part is described as "including" a certain component, this means that, unless specifically stated otherwise, it does not exclude other components but may include additional components. Hereinafter, with reference to FIGS. 1 to 3, a memory inspection method for a system requiring high-speed booting according to an embodiment of the present invention and a mission computer performing the same will be described. FIG. 1 is a block diagram showing a mission computer according to one embodiment of the present invention. Referring to FIG. 1, a mission computer (100) may include a flash memory (110), a random access memory (RAM) (120), and an uninitialized memory (125) included in the random access memory (RAM). The mission computer (100) may perform a self-inspection (BIT) on the entire area of the random access memory (120) using the flash memory (110), the random access memory (120), and the uninitialized memory (125). At this time, the mission computer (100) does not perform a self-inspection (BIT) every time it boots, but can perform a self-inspection (BIT) at the bootloader stage based on the command of the inspection equipment (10) (e.g., ground equipment that controls the aircraft-mounted computer) as exemplified in FIG. 2. FIG. 2 is a flowchart illustrating a method for performing a memory inspection based on commands of an inspection device according to one embodiment of the present invention. Referring to FIG. 2, the inspection equipment (10) can transmit a memory element detailed inspection setting command to the mission computer (100) (S11). The inspection equipment (10) and the mission computer (100) may be connected via a wireless communication link or a wired communication link. The memory element detailed inspection setting command may be a pre-setting command that causes the mission computer (100) to prepare for an inspection of the entire area of the random access memory (120). The inspection equipment (10) can transmit the memory element detailed inspection setting command so that the mission computer (100) can perform (prepare for) a memory inspection, taking into account the time when the mission computer (100) is not performing a major mission. When the mission computer (100) receives a memory element detailed inspection setting command, it can set a self-inspection (BIT) flag in the flash memory (110) (S12). The mission computer (100) can store the BIT flag in a specific sector of the flash memory (110). After the mission computer (100) stores a BIT flag in the flash memory (110), it can respond to the inspection equipment (10) with a confirmation of the memory element detailed inspection setting in response to the memory element detailed inspection setting command (S13). Wh