KR-20260063808-A - INSPECTION APPARATUS OF COMPONENT
Abstract
The present invention relates to a component inspection device, comprising: a loading unit into which a lot to be inspected is loaded, the lot to be inspected having a plurality of trays to be inspected, each having a plurality of components seated thereon; an inspection unit that receives the trays to be inspected in tray units from the loading unit, inspects the components, and determines good components and defective components; a buffer tray loader on which the trays to be inspected after inspection by the inspection unit are seated; a good component tray loader and a defective component tray loader capable of seating trays; a good component waiting unit equipped with a plurality of good component waiting lots; and a device control unit that moves the defective components among the components on the trays to be inspected seated on the buffer tray loader to the defective components seated on the defective component tray loader. The above device control unit may operate as one of the following modes: a first good product processing mode in which, when a good product waiting tray on which a part corresponding to a part on the inspection target tray is placed does not exist in the good product waiting lot of the good product waiting unit, the inspection target tray from which the defective product has been removed is moved to an empty good product waiting lot of the good product waiting unit, and all inspection target trays loaded in the inspection target lot are sequentially inspected and moved to the corresponding empty good product waiting lot after moving the defective product; and a second good product processing mode in which, when the good product waiting tray exists in at least one of the good product waiting lots of the good product waiting unit, the good product waiting tray is moved to the good product tray loader, and then the good product among the parts on the inspection target tray placed in the buffer tray loader is moved to an empty space of the good product waiting tray placed in the good product tray loader.
Inventors
- 조철훈
- 임종빈
- 류형진
- 박준형
Assignees
- (주)펨트론
Dates
- Publication Date
- 20260507
- Application Date
- 20241031
Claims (9)
- In a component inspection device, A loading section into which an inspection target lot loaded with multiple inspection target trays, each having multiple parts seated thereon, is introduced; An inspection unit that receives the trays to be inspected in tray units from the loading unit, inspects the parts, and distinguishes between good and defective products, and A buffer tray loader on which the inspection target tray, on which the inspection is completed by the inspection unit, is placed, and A good tray loader and a defective tray loader capable of seating trays, and A good product waiting section equipped with multiple good product waiting lots, and It includes a device control unit that moves the defective parts among the parts on the inspection target tray seated on the buffer tray loader to the defective tray seated on the defective tray loader; The above device control unit A first good product processing mode in which, if a good product waiting tray on which a part corresponding to a part on the inspection target tray is seated does not exist in the good product waiting lot of the good product waiting section, the inspection target tray from which the defective product has been removed is moved to an empty good product waiting lot of the good product waiting section, and all inspection target trays loaded in the inspection target lot are sequentially inspected and moved to the corresponding empty good product waiting lot after moving the defective product; An inspection device for a part characterized by operating in one of a second good product processing modes, wherein when the good product waiting tray is present in at least one of the good product waiting lots of the good product waiting section, the good product waiting tray is moved to the good product tray loader, and then the good product among the parts on the inspection target tray placed on the buffer tray loader is moved to the empty space of the good product waiting tray placed on the good product tray loader.
- In paragraph 1, It further includes a boundary tray loader on which a tray can be seated; The above inspection unit identifies boundary parts corresponding to the boundary between good and defective products; A component inspection device characterized by the above device control unit moving the boundary component among the components on the inspection target tray seated on the buffer tray loader to the boundary tray seated on the boundary tray loader.
- In paragraph 2, The above device control unit It is arranged to manage parts produced in at least one production device, each consisting of at least one cavity, on a cavity-by-cavity basis, and A part inspection device characterized by determining whether a part on the inspection target tray corresponds to a part based on whether the part was produced in the same cavity.
- In paragraph 3, It further includes an unloading unit for extracting good products based on the inspection results of the inspection unit above; The above device control unit, in the above second good product processing mode, When the good product waiting tray placed on the good product tray loader is fully loaded with good products, the good product waiting tray placed on the good product tray loader is moved to the unloading unit, and In the sequence of moving another good product waiting tray loaded in the good product waiting lot of the good product waiting section to the good product tray loader, and then moving the good product among the parts on the inspection target tray placed on the buffer tray loader to the empty space of the good product waiting tray placed on the good product tray loader, A component inspection device characterized by classifying good and defective products on each of the inspection target trays loaded in the inspection target lot introduced into the loading unit.
- In paragraph 3, An inspection device for a part, characterized in that the good product waiting tray loaded in the good product waiting lot of the good product waiting section is an inspection target tray that has been moved to an empty good product waiting lot in the first good product processing mode.
- In paragraph 3, A component inspection device characterized in that the above device control unit processes a plurality of the above inspection target trays within the above inspection target lot, which are initially introduced into the above loading unit, in the above first good product processing mode.
- In paragraph 2, It further includes a boundary waiting section equipped with multiple boundary waiting lots; A component inspection device characterized by the above device control unit moving the tray on the boundary tray loader to one of the plurality of boundary waiting lots when the boundary component is present on the tray on the boundary tray loader after the inspection of one of the above inspection target lots is completed.
- In Paragraph 7, It further includes a boundary processing unit equipped with a plurality of boundary processing lots; The above device control unit An inspection device for parts characterized by moving a tray on a boundary tray loader to one of a plurality of boundary waiting lots when the boundary part is fully loaded during the inspection process of one of the above-mentioned inspection target lots.
- In paragraph 8, The above device control unit An inspection device for a part, characterized by moving the boundary waiting tray to the boundary tray loader and moving the boundary part classified from the inspection target lot to the boundary waiting tray loaded on the boundary tray loader when a boundary waiting lot containing a boundary waiting tray having a boundary part corresponding to a part on the inspection target tray is present in the boundary waiting section.
Description
Inspection apparatus of component The present invention relates to an inspection device for parts, and more specifically, to an inspection device for inspecting a number of parts produced in a production device. Electronic devices, such as mobile phones, are produced by assembling multiple components. For instance, a mobile phone is manufactured by assembling multiple components, such as a display, printed circuit board, case, and touch module, after they have been produced. Each component applied to an electronic device is inspected for defects after production, and a representative inspection method is vision inspection equipment. For example, Automated Visual Inspection (AVI) equipment is widely used for visual inspection, which automatically performs visual inspection of components by acquiring 2D images or 3D images using the moiré technique. Generally, after production, parts are moved in multiple units placed on trays, and multiple trays are moved while loaded into a lot. In addition, parts are typically fed into inspection equipment on a lot basis for inspection. For example, Korean Registered Patent No. 10-0699866 discloses a 'method for continuous inspection of semiconductor devices through lot and tray verification.' A single inspection device inspects parts produced in multiple production units, and parts produced in each production unit must be distinguished and inspected. In addition, even parts generated in a single production unit must be distinguished by the cavity of that production unit for inspection and transfer. In other words, when m production units, each consisting of n cavities, are inspected using a single inspection device, n × m types of parts are inspected. During each inspection process, good parts and defective parts must be sorted into lots and trays according to n × m cases. If efficient sorting is not performed, a problem arises where the inspection time increases. FIG. 1 is a drawing showing an example of a production line to which an inspection device according to an embodiment of the present invention is applied, and FIG. 2 is a drawing showing the configuration of a lot applied to a production line according to an embodiment of the present invention, and FIG. 3 is a control block diagram of an inspection device according to an embodiment of the present invention, and FIGS. 4 and 5 are control flow diagrams of an inspection device according to an embodiment of the present invention, and FIGS. 6 to 8 are drawings for explaining the inspection process of an inspection device according to an embodiment of the present invention. The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the present invention, and the present invention is defined only by the scope of the claims. The terms used in this specification are for describing embodiments and are not intended to limit the invention. In this specification, the singular form includes the plural form unless specifically stated otherwise in the text. The terms "comprises" and/or "comprising" used in this specification do not exclude the presence or addition of one or more other components in addition to the components mentioned. Throughout the specification, the same reference numerals refer to the same components, and "and/or" includes each of the mentioned components and all combinations of one or more. Although terms such as "first," "second," etc., are used to describe various components, these components are not limited by these terms. These terms are used merely to distinguish one component from another. Therefore, the first component mentioned below may be the second component within the technical scope of the invention. Unless otherwise defined, all terms used herein (including technical and scientific terms) may be used in a meaning commonly understood by those skilled in the art to which the present invention pertains. Additionally, terms defined in commonly used dictionaries are not to be interpreted ideally or excessively unless explicitly and specifically defined otherwise. The present invention will be described in detail below with reference to the attached drawings. FIG. 1 is a drawing showing an example of a production line to which an inspection device (100) according to an embodiment of the present invention is applied. Referring to FIG. 1, a plurality of production devices (300) may be installed in a production line according to an embodiment of the present invention, and an inspection device (100) may inspect parts produced in each production device (300). In one em