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KR-20260064809-A - DISPLAY DEVICE AND METHOD OF INSPECTING DISPLAY DEVICE, AND ELECTRONIC DEVICE

KR20260064809AKR 20260064809 AKR20260064809 AKR 20260064809AKR-20260064809-A

Abstract

A method for inspecting a display device according to embodiments of the present invention comprises pixels including: a first transistor in which a gate electrode is connected to a first node, a first power line through a second node, and a second electrode is connected to a third node; a second transistor connected between a data line and the second node, with a gate electrode connected to a first scan line; a third transistor connected between the first node and the third node, with a gate electrode connected to a second scan line; a fourth transistor connected between the first node and the second power line, with a gate electrode connected to a third scan line; a fifth transistor connected between the third node and the third power line, with a gate electrode connected to a fourth scan line; and a sixth transistor connected between the second node and the fourth power line, with a gate electrode connected to the fourth scan line. During the inspection process of the pixels, a first voltage is supplied to the data line, the first power line, and the fourth power line, a second voltage is supplied to the third power line, and a voltage that drops from the third voltage to the fourth voltage is supplied to the second power line; and a gate-off voltage is supplied to the second scan line so that the third transistor is turned off.

Inventors

  • 백석기
  • 이기훈
  • 김두현

Assignees

  • 삼성디스플레이 주식회사

Dates

Publication Date
20260508
Application Date
20241029

Claims (20)

  1. Pixels comprising: a first transistor in which the gate electrode is connected to a first node, the first electrode is connected to a first power line via a second node, and the second electrode is connected to a third node; a second transistor connected between a data line and the second node, with the gate electrode connected to a first scan line; a third transistor connected between the first node and the third node, with the gate electrode connected to a second scan line; a fourth transistor connected between the first node and the second power line, with the gate electrode connected to a third scan line; a fifth transistor connected between the third node and the third power line, with the gate electrode connected to a fourth scan line; and a sixth transistor connected between the second node and the fourth power line, with the gate electrode connected to the fourth scan line; During the inspection process of the above pixels A first voltage is supplied to the data line, the first power line, and the fourth power line, a second voltage is supplied to the third power line, and a voltage decreasing from the third voltage to the fourth voltage is supplied to the second power line; A method for inspecting a display device in which a gate-off voltage is supplied to the second scan line so that the third transistor is turned off.
  2. In Article 1, A method for inspecting a display device in which the first voltage is 0V.
  3. In Article 1, A method for inspecting a display device in which the second voltage is lower than the first voltage.
  4. In Article 1, A method for inspecting a display device in which the third voltage is a voltage higher than the first voltage, and the fourth voltage is a voltage lower than the second voltage.
  5. In Article 1, A method for inspecting a display device in which the voltage supplied by the above second power line is lowered by a constant voltage for each frame.
  6. In Article 1, Each of the above pixels is A seventh transistor connected between the first power line and the second node, with its gate electrode connected to the light emission control line; A method for inspecting a display device further comprising an eighth transistor connected between the third node and the fifth transistor, wherein the gate electrode is connected to the light emission control line.
  7. In Article 6, An enable first scan signal is supplied to the first scan line so that the second transistor can be turned on at least once during a frame period, and A method for inspecting a display device in which a gate-on voltage is supplied to the third scan line so that the fourth transistor is turned on.
  8. In Article 7, A method for inspecting a display device, wherein an enable light emission control signal is supplied to the light emission control line so as to overlap with the enable first scan signal to turn on the seventh transistor and the eighth transistor during a portion of a frame period, and a disable light emission control signal is supplied so as to turn off the seventh transistor and the eighth transistor during the remainder of the frame period.
  9. In Article 8, A method for inspecting a display device in which the above remaining period is 95% or more and 99% or less of one frame period.
  10. In Article 8, A method for inspecting a display device in which an enable fourth scan signal is supplied to the fourth scan line to turn on the sixth transistor during the aforementioned partial period, and a disable fourth scan signal is supplied to turn off the sixth transistor during the aforementioned remaining period.
  11. In Article 1, The first voltage is supplied to the first power line via the first resistor, and A method for inspecting a display device in which the first voltage is supplied to the fourth power line via a second resistor.
  12. In Article 11, A method for inspecting a display device in which the first and second resistors have resistance values between 100Ω and 100MΩ.
  13. A step of supplying different voltages to the gate electrodes of driving transistors for each frame; The method includes the step of detecting the amount of current flowing to the driving transistor while turning on a switching transistor connected between a data line and the first electrode of the driving transistor for a certain period for each of the above frames; A method for inspecting a display device in which a diode transistor located between the gate electrode and the second electrode of the above-mentioned driving transistor is set to a turn-off state.
  14. In Article 13, A method for inspecting a display device in which a first voltage is supplied to a first power line and a bias power line connected to the first electrode of the driving transistor.
  15. In Article 14, A method for inspecting a display device in which the first voltage is supplied to the above data line.
  16. In Article 14, The first voltage is supplied to the first power line via the first resistor, and A method for inspecting a display device in which the first voltage is supplied to the above bias power line via a second resistor.
  17. In Article 16, A method for inspecting a display device in which the first and second resistors have resistance values between 100Ω and 100MΩ.
  18. It comprises a pixel section including pixels that display a predetermined image and a test pixel that does not display the image; The above test pixel is A first transistor in which the gate electrode is connected to a first node, the first electrode to a second node, and the second electrode to a third node; A storage capacitor connected between the first power line and the first node; A second transistor connected between the data line and the second node, with the gate electrode connected to the first scan line; A third transistor connected between the first node and the third node, with its gate electrode connected to the second scan line; A fourth transistor connected between the first node and the second power line, with its gate electrode connected to the third scan line; A fifth transistor connected between the third node and the third power line, with its gate electrode connected to the fourth scan line; A sixth transistor in which a second electrode is connected to the second node and a gate electrode is connected to the fourth scan line; A seventh transistor in which a second electrode is connected to the second node and a gate electrode is connected to a light emission control line; It comprises an eighth transistor connected between the third node and the fifth transistor, wherein the gate electrode is connected to the light emission control line; A display device in which the first electrode of the above-mentioned sixth transistor is not electrically connected to the above-mentioned first power line.
  19. In Article 18, The first electrode of the above-mentioned sixth transistor is a display device that is not electrically connected to a separate power line.
  20. A display panel comprising pixels that display a predetermined image and a test pixel that does not display the image; The above test pixel is A first transistor in which the gate electrode is connected to a first node, the first electrode to a second node, and the second electrode to a third node; A storage capacitor connected between the first power line and the first node; A second transistor connected between the data line and the second node, with the gate electrode connected to the first scan line; A third transistor connected between the first node and the third node, with its gate electrode connected to the second scan line; A fourth transistor connected between the first node and the second power line, with its gate electrode connected to the third scan line; A fifth transistor connected between the third node and the third power line, with its gate electrode connected to the fourth scan line; A sixth transistor in which a second electrode is connected to the second node and a gate electrode is connected to the fourth scan line; A seventh transistor in which a second electrode is connected to the second node and a gate electrode is connected to a light emission control line; It comprises an eighth transistor connected between the third node and the fifth transistor, wherein the gate electrode is connected to the light emission control line; The first electrode of the above-mentioned sixth transistor is an electronic device that is not electrically connected to the above-mentioned first power line.

Description

Display Device and Method of Inspecting Display Device, and Electronic Device The present invention relates to a display device, a method for inspecting a display device, and an electronic device. With the advancement of information technology, the importance of display devices, which serve as a medium connecting users and information, is being highlighted. In response to this, the use of display devices such as Liquid Crystal Displays (LCDs) and Organic Light Emitting Displays (OLEDs) is increasing. The manufacturing process of a display device includes an inspection process to check for pixel abnormalities. A method capable of reliably detecting pixel abnormalities during this inspection process is required. FIG. 1 is a drawing showing a display device according to one embodiment of the present invention. FIG. 2 is a drawing showing an embodiment of the scanning driving unit and the light-emitting driving unit illustrated in FIG. 1. FIG. 3 is a drawing showing a pixel according to one embodiment of the present invention. FIG. 4 is a waveform diagram showing an example of a method for driving a pixel of FIG. 3 during a display scanning period. Figure 5 is a waveform diagram showing an example of a method for driving a pixel of Figure 3 during a self-injection period. FIGS. 6 and FIGS. 7 are drawings showing examples of signals supplied to the active section and the blank section. FIG. 8 is a diagram showing an example of voltage supplied to pixels during the inspection process of pixels. Figures 9a and 9b are diagrams showing driving waveforms supplied to pixels during the inspection process. Figure 10 is a diagram showing an example of a light emission control signal supplied during an inspection period. Figure 11 is a diagram showing the characteristic curve of the first transistor detected during the inspection process. FIG. 12 is a diagram showing an embodiment of supplying voltage to pixels during the inspection process of pixels. Figure 13 is a diagram showing the characteristic curve of the first transistor generated during the inspection process when voltage is supplied through a resistor as in Figure 12. FIG. 14 is a drawing showing a test pixel according to one embodiment of the present invention. FIG. 15 is a drawing showing an electronic device according to one embodiment of the present invention. Hereinafter, various embodiments of the present invention will be described in detail with reference to the attached drawings so that those skilled in the art can easily implement the present invention. The present invention may be embodied in various different forms and is not limited to the embodiments described herein. To clearly explain the present invention, parts unrelated to the explanation have been omitted, and the same reference numerals are assigned to identical or similar components throughout the specification. Accordingly, the reference numerals described above may also be used in other drawings. Furthermore, the expression "identical" in the explanation may mean "substantially identical." In other words, it may be an identicality to the extent that a person with ordinary knowledge would accept it as such. Other expressions may also be those in which "substantially" has been omitted. Some embodiments are described in the accompanying drawings in relation to functional blocks, units, and/or modules. Those skilled in the art will understand that these blocks, units, and/or modules are physically implemented by logic circuits, individual components, microprocessors, hardwired circuits, memory elements, wiring connections, and other electronic circuits. These may be formed using semiconductor-based manufacturing techniques or other manufacturing techniques. In the case of blocks, units, and/or modules implemented by microprocessors or other similar hardware, they may be programmed and controlled using software to perform the various functions discussed in the present invention, and may optionally be driven by firmware and/or software. Additionally, each block, unit, and/or module may be implemented by dedicated hardware, or by a combination of dedicated hardware performing some functions and a processor performing other functions (e.g., one or more programmed microprocessors and associated circuits). Furthermore, in some embodiments, blocks, units, and/or modules may be physically separated into two or more individual blocks, units, and/or modules that interact within the scope of the concept of the present invention without departing from the scope of the present invention. Additionally, in some embodiments, blocks, units, and/or modules may be combined into physically more complex blocks, units, and/or modules within the scope of the concept of the present invention. The term “connection” between two components may mean that it encompasses both electrical and physical connections, but is not necessarily limited thereto. For example, “connection” used in relation to circuit diagrams may mea