KR-20260065050-A - DISPLAY DEVICE, DEVICE FOR INSPECTING, METHOD FOR INSPECTING OF DISPLAY DEVICE USING THEREO AND ELECTRONIC DEVICE

KR20260065050AKR 20260065050 AKR20260065050 AKR 20260065050AKR-20260065050-A

Abstract

The present invention relates to a display device, an inspection device, a method for inspecting a display device, and an electronic device. A display device according to one embodiment comprises a substrate including a display area and a non-display area, a plurality of light-emitting elements arranged in a plurality of columns and a plurality of rows in the display area, a plurality of simulated patterns in a first row arranged in the same column as the light-emitting elements in the first row in the non-display area, and a plurality of simulated patterns in a first column arranged in the same row as the light-emitting elements in the first column in the non-display area, wherein each of the plurality of simulated patterns in the first row may have the same shape and the same area as the light-emitting element arranged in the same column among the light-emitting elements in the first row.

Inventors

윤제현

Assignees

삼성디스플레이 주식회사

Dates

Publication Date: 20260508
Application Date: 20241031

Claims (20)

A substrate including a display area and a non-display area; A plurality of light-emitting elements arranged in a plurality of columns and a plurality of rows in the above display area; A plurality of simulated patterns in a first row arranged in the same column as the light-emitting element in the first row in the above-mentioned non-display area; and It includes a plurality of simulation patterns in a first column arranged in the same row as the light-emitting element in the first column in the above non-display area. Each of the plurality of simulated patterns in the first row above is a display device having the same shape and the same area as a light-emitting element placed in the same column among the light-emitting elements of the first row.
In paragraph 1, The plurality of imitation patterns of the first column and the plurality of imitation patterns of the first row are formed of metal, and The above-mentioned light-emitting element is a display device that is a light-emitting element made of an inorganic material.
In Article 1, The plurality of simulation patterns of the first row above are placed at the top or bottom of the display area, and A plurality of simulation patterns of the first column above are a display device positioned on the left or right side of the display area.
A stage on which a substrate comprising a plurality of simulated patterns and a plurality of light-emitting elements is placed; An image acquisition unit for capturing an image of the above substrate; A control unit that controls the operation of the image acquisition unit above; and An inspection device comprising an image processing unit that determines whether there is a defect in a light-emitting element by comparing image data of simulated patterns and image data of light-emitting elements through image data obtained from the image acquisition unit.
In paragraph 4, The above substrate includes a display area and a non-display area, and The above plurality of light-emitting elements are arranged in a plurality of columns and a plurality of rows in the above display area, and An inspection device comprising a plurality of simulated patterns, the plurality of simulated patterns in a first row arranged in the same column as a light-emitting element in a first row in the non-display area, and a plurality of simulated patterns in a first column arranged in the same row as a light-emitting element in a first column.
In paragraph 5, The inspection device for determining the above defect includes deviation or misalignment from the correct position of the light-emitting element.
In paragraph 6, The above image processing unit is an inspection device that detects deviations and misalignments of light-emitting elements by utilizing the difference between the gray value of a light-emitting element and the gray values of a plurality of simulated patterns in a first row corresponding to the light-emitting element and simulated patterns in a first column corresponding to the light-emitting element.
In paragraph 6, The above image processing unit is an inspection device that extracts image data of simulated patterns corresponding to the target light-emitting element based on pre-stored simulated patterns and position data of light-emitting elements.
In paragraph 5, A plurality of simulated patterns in the first row above are inspection devices having the same shape and same area as the light-emitting element in the first column.
In paragraph 5, The plurality of imitation patterns of the first column and the plurality of imitation patterns of the first row are formed of metal, and The above-mentioned light-emitting element is an inspection device that is a light-emitting element made of an inorganic material.
In paragraph 5, The plurality of simulation patterns of the first row above are placed at the top or bottom of the display area, and A testing device in which a plurality of simulation patterns of the first column are positioned on the left or right side of the display area.
In paragraph 6, An inspection device further comprising an output unit that receives and displays defect inspection results from the image processing unit above.
A step of placing a target substrate having a plurality of light-emitting elements formed thereon on a stage and aligning an image acquisition unit on the target substrate; The above-described image acquisition unit captures a target substrate including simulated patterns and light-emitting elements to acquire a first image; and A display device inspection method comprising the step of an image processing unit comparing image data of simulated patterns and image data of light-emitting elements through image data obtained from the image acquisition unit to determine whether there is a defect in the light-emitting element.
In Article 13, The above substrate includes a display area and a non-display area, and The above plurality of light-emitting elements are arranged in a plurality of columns and a plurality of rows in the above display area, and A display device inspection method comprising a plurality of simulated patterns, wherein the plurality of simulated patterns include a plurality of simulated patterns in a first row arranged in the same column as a light-emitting element in a first row in the non-display area, and a plurality of simulated patterns in a first column arranged in the same row as a light-emitting element in a first column.
In Article 13, The step of determining whether the above defect exists is, A display device inspection method in which the above-mentioned image processing unit extracts image data of simulated patterns corresponding to the target light-emitting element based on pre-stored simulated patterns and position data of light-emitting elements.
In Article 15, A display device inspection method in which the image processing unit determines a defect if the similarity of image data of simulated patterns corresponding to image data of a light-emitting element under inspection is less than a preset reference value.
In Article 15, The above image data is a display device inspection method in which luminance data is used.
In Article 16, A display device inspection method in which the image processing unit determines deviation and misalignment of light-emitting elements by utilizing the difference between the gray value of a light-emitting element and the gray values of a plurality of simulated patterns in a first row corresponding to the light-emitting element and simulated patterns in a first column corresponding to the light-emitting element.
In Article 14, The plurality of simulated patterns of the first row above have the same shape and the same area as the light-emitting element of the first column, and The plurality of simulation patterns of the first row above are placed at the top or bottom of the display area, and A display device inspection method in which a plurality of simulation patterns of the first column are placed on the left or right side of the display area.
It includes a display device that displays images, and The above display device is, A substrate including a display area and a non-display area; A plurality of light-emitting elements arranged in a plurality of columns and a plurality of rows in the above display area; A plurality of simulated patterns in a first row arranged in the same column as the light-emitting element in the first row in the above-mentioned non-display area; and It includes a plurality of simulation patterns in a first column arranged in the same row as the light-emitting element in the first column in the above non-display area. Each of the plurality of simulated patterns in the first row is an electronic device having the same shape and the same area as a light-emitting element placed in the same column among the light-emitting elements of the first row.

Description

Display device, inspection device, method for inspecting a display device, and electronic device The present invention relates to a display device, an inspection device, a method for inspecting a display device, and an electronic device. As the information society develops, the demand for display devices to display images is increasing in various forms. Display devices may be flat panel display devices such as Liquid Crystal Displays, Field Emission Displays, and Light Emitting Displays. The light-emitting display device may be implemented as an organic light-emitting display device including an organic light-emitting diode element as a light-emitting element, an inorganic light-emitting display device including an inorganic semiconductor element as a light-emitting element, or a micro light-emitting diode display device including a micro light-emitting diode element (or micro light-emitting diode element) as a light-emitting element. FIG. 1 is a perspective view showing a display device according to one embodiment. FIG. 2 is a layout diagram showing a display device according to one embodiment. FIG. 3 is a block diagram showing a display device according to one embodiment. FIG. 4 is an equivalent circuit diagram showing a subpixel according to one embodiment. FIG. 5 is a layout diagram showing pixels of a display area according to one embodiment. FIG. 6 is a cross-sectional view showing an example of a cross-section of a display panel corresponding to the line I-I' of FIG. 5. Figure 7 is a cross-sectional view showing in detail an example of area A of Figure 6. FIG. 8 is an enlarged view of a part of a display device to illustrate a simulated pattern and an array of light-emitting elements. FIG. 9 is a block diagram schematically showing an inspection device according to one embodiment. FIG. 10 is a flowchart illustrating a method for inspecting a display device according to one embodiment. FIG. 11 is a schematic diagram illustrating a method for inspecting a display device according to one embodiment. FIG. 12 is an example of location data according to one embodiment. FIGS. 13 and FIGS. 14 are images for detecting defects in a light-emitting element by comparing a single pixel with a simulated pattern. Figure 15 is an image illustrating defect detection in a conventional light-emitting element. FIGS. 16 to 18 are drawings for explaining the types of distortion defects of a light-emitting element detectable according to one embodiment of the present invention. FIG. 19 is an exemplary drawing showing a smart watch including a display device according to one embodiment. FIGS. 20 and FIGS. 21 are exemplary drawings showing a virtual reality device including a display device according to one embodiment. FIG. 22 is an example drawing showing a virtual reality device including a display device according to another embodiment. FIG. 23 is an exemplary drawing showing an automobile instrument panel and center fascia including display devices according to one embodiment. FIG. 24 is an exemplary drawing showing a transparent display device including a display device according to one embodiment. The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. When elements or layers are referred to as being "on" another element or layer, this includes cases where another layer or element is interposed directly on or in the middle of another element. Throughout the specification, the same reference numerals refer to the same components. Shapes, sizes, ratios, angles, numbers, etc., disclosed in the drawings for describing embodiments are exemplary and therefore the invention is not limited to the depicted details. Although terms such as "first," "second," etc., are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are used merely to distinguish one component from another. Therefore, it goes without saying that the first component mentioned below may also be the second component within the technical scope of the present invention. The features of each of the various embodiments of the present invention may be combined or combined with one another, either partially or wholly, and may technically enable various interlocking and operation. Each embodiment may be implemented independently of one another or may be implemented together in an associated relationship. Specific embodiments will be described below with reference to the attach