KR-20260065477-A - Pixel defect detection apparatus including concave light source and diffuser structure for providing uniform illumination across the entire field of view of an image sensor

KR20260065477AKR 20260065477 AKR20260065477 AKR 20260065477AKR-20260065477-A

Abstract

The present invention relates to a lighting device for use in determining pixel defects of an image sensor in a camera that includes an image sensor and outputs image data based on a signal output from the image sensor, wherein the lighting device includes a light source for emitting light and is configured such that the light emitted from the light source is uniformly irradiated over the entire imaging area of the camera.

Inventors

박진영
우정우
이정훈

Assignees

엘지이노텍 주식회사

Dates

Publication Date: 20260508
Application Date: 20250429
Priority Date: 20241101

Claims (6)

In a lighting device for use in determining pixel defects of an image sensor in a camera that includes an image sensor and outputs image data based on a signal output from the image sensor, Includes a light source for emitting light; and The above light source is, The light emitted from the light source is configured to be uniformly irradiated over the entire imaging area of the camera, and Configured to have a concave shape so that the emitted light can be uniformly irradiated over the entire imaging area of the camera, Lighting device.
In Article 1, It further includes a diffuser layer, The above diffuser layer is, Configured to be positioned along the curved surface of a light source having the above-mentioned concave shape, Lighting device.
In Article 2, The above diffuser layer is, A configuration configured to reduce deviations in light irradiation direction and intensity according to the curvature of a light source having the above-mentioned concave shape, Lighting device.
In Article 1, The above diffuser layer is formed to have a material that scatters and diffuses light generated from the above light source, Lighting device.
In Article 1, The above camera is, Includes an optical system; The above optical system is, A lens comprising a lens that refracts external light received by the camera to converge toward the center, Lighting device.
In Article 5, The above light source is, It is configured to have a curvature corresponding to the curvature of the above optical system, and The center of the curvature of the above light source is, Formed to coincide with the center of curvature of the optical system or to have a distance of less than or equal to the center of curvature of the optical system, Lighting device.

Description

Pixel defect detection apparatus including concave light source and diffuser structure for providing uniform illumination across the entire field of view of an image sensor The present invention relates to a pixel defect detection device having a concave light source and a diffuser structure that provides uniform illumination over the entire field of view of an image sensor. Image sensors such as CMOS and CCD are devices that convert external light into electrical signals and output them as digital images, and each pixel of an image sensor performs the functions of receiving light and generating electrical signals. Some pixels of an image sensor may have defects that prevent them from providing normal output values due to microscopic defects during the manufacturing process or damage caused by the external environment. Conventionally, when a uniform light source is shone onto an image sensor, the center of the sensor experiences relatively high illumination while the periphery experiences low illumination, resulting in brightness inconsistencies and making it difficult to provide uniform illumination across the entire field of view of the image sensor. Additionally, when a uniform light source is shone onto an image sensor with a wide angle, there is a problem in that the illumination coverage of the image sensor is insufficient. FIG. 1a is a diagram illustrating the configuration of a system for inspecting pixel defects of an image sensor according to one embodiment of the present invention. FIG. 1b is a diagram illustrating image data output from a pixel defect inspection target device according to one embodiment of the present invention. FIG. 2a is a drawing for explaining pixel defects according to an embodiment of the present invention. FIG. 2b is a conceptual diagram for explaining the shadow phenomenon of image data according to one embodiment of the present invention. FIG. 3 is a diagram illustrating the step of inspecting pixel defects of an image sensor according to one embodiment of the present invention. FIG. 4 is a diagram illustrating the shading phenomenon that appears in image data output from an image sensor according to an embodiment of the present invention. FIG. 5 is a diagram illustrating the results provided by a system for inspecting pixel defects of an image sensor according to an embodiment of the present invention. FIG. 6 is a diagram illustrating a defective pixel information report, which is the result of a pixel defect inspection device according to one embodiment of the present invention. Specific details of the embodiments are included in the detailed description and drawings. The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. Throughout the specification, the same reference numerals refer to the same components. FIG. 1a is a diagram illustrating the configuration of a system for inspecting pixel defects of an image sensor according to an embodiment of the present invention. FIG. 1b is a diagram illustrating image data output from a pixel defect inspection target device according to an embodiment of the present invention. Referring to FIG. 1a, a system (10) for inspecting pixel defects of an image sensor may include a pixel defect inspection target device (100), a lighting device (200), and a pixel defect inspection device (300). Additionally, the pixel defect inspection target device (100) may include an image sensor (110) and an optical system (120). According to one embodiment of the present invention, a pixel defect inspection device (300) may include a receiving unit (310), a processor (320), and a storage unit (330). Specifically, the receiving unit (310) may receive data output from a pixel defect inspection target device (100). Specifically, the data output from the pixel defect inspection target device (100) may include image data or brightness code data of the image data. According to one embodiment of the present invention, the processor (320) can determine whether there is a defect in at least one pixel included in the image sensor (110) based on data output from the pixel defect inspection target device (100). A specific method for determining whether there is a pixel defect is described in detail below in the description of the step (S10) of inspecting pixel defects in the image sensor. According to one embodiment of the present invention, the storage unit (330) may store data authorized by the receiving unit (310) or result data regard