KR-20260067146-A - APPARATUS AND METHOD FOR CALCULATING CONDITION-BASED PROCESS CAPABILITY INDEX OF EQUIPMENT USING EQUIPMENT SPECIFICATIONS

KR20260067146AKR 20260067146 AKR20260067146 AKR 20260067146AKR-20260067146-A

Abstract

According to various embodiments of the present invention, a device for calculating a process capability evaluation index of equipment receives a target value, which is a reference value input to the equipment to maintain the target environmental conditions of the equipment, or a process value, which is a value corresponding to the target value and is obtained by a sensor measuring the equipment; receives at least one operation parameter corresponding to an operation rule for calculating an evaluation index for the process capability of the equipment; calculates at least one derived variable used as a criterion for detecting abnormalities in the equipment using the target value or the process value; and can calculate a process capability evaluation index of the equipment based on at least one selected from a group consisting of the at least one derived variable, the target value, the process value, and the at least one essential parameter.

Inventors

이방원
강덕훈

Assignees

(주)브릭

Dates

Publication Date: 20260512
Application Date: 20241105

Claims (14)

A memory for storing one or more programs for calculating an evaluation index of the process capability of the equipment; and one or more processors for performing operations according to the one or more programs; wherein the processors, In order to maintain the environmental conditions targeted by the above equipment, the equipment receives a target value, which is a reference value input to the equipment, or a process value, which is a value corresponding to the target value and is obtained by a sensor measuring the equipment. At least one operation parameter corresponding to the rule of operation for calculating the evaluation index of the process capability of the above equipment is received as input, and Calculate at least one derived variable that is used as a criterion for detecting abnormalities in the equipment using the above target value or the above measurement value, and A device for calculating a process capability evaluation index of a facility, which calculates a process capability evaluation index of a facility based on at least one selected from a group consisting of at least one derived variable, the target value, the measured value, and at least one essential parameter.
In paragraph 1, The above processor producing the above at least one derived variable is, A device for calculating a process capability evaluation index of equipment, characterized by calculating at least one selected from a group consisting of: a target value change amount corresponding to the difference between a target value at a first point in time and a target value at a second point in time that is prior to the first point in time; a residual value corresponding to the difference between the target value and the measured value; a time gap corresponding to the time difference between the first point in time and the second point in time; and an estimated arrival time, which is the estimated time required for the measured value to reach the target value.
In paragraph 2, The above at least one operation parameter is, A device for calculating a process capability evaluation index of a facility, characterized by including at least one selected from a group consisting of a value of variation per unit time of the above-mentioned measurement value, a ratio value of an allowable error for setting an anomaly detection standard, and an adjustment parameter for cases where the value of variation per unit time is not linear.
In paragraph 3, The above processor is, If the amount of change in the target value at the first time point is not zero, The estimated arrival time is calculated by dividing the residual value at the first time point by the fluctuation value per unit time of the measurement value and adding the time gap at the first time point, and When the above change in target value is 0, A device for calculating a process capability evaluation index of equipment, characterized by determining the above-mentioned expected arrival time to be 0.
In paragraph 4, The above processor is, The value of the time remaining until the measured value reaches the target value, updated in real time at the first point in time above, A device for calculating a process capability evaluation index of equipment, characterized by determining the larger value between the value obtained by subtracting the time gap of the first time point from the time remaining for the measured value to reach the target value at the second time point and 0.
In paragraph 5, The above processor is, If the estimated arrival time at the first time point is greater than 0, The time remaining until the measured value reaches the target value at the first point in time above, The larger value between the estimated arrival time at the first time point and the time remaining until the measured value reaches the target value at the first time point, which is updated in real time, is determined, and A target value adjusted to reflect the expected change in the measured value during the time gap at the first point in time, A device for calculating a process capability evaluation index of equipment, characterized by determining the value based on the measurement value at the first point in time above.
In paragraph 6, The above processor is, If the time remaining until the measured value reaches the target value at the above second time point is greater than 0, The value of the time remaining until the measurement value reaches the target value at the first point in time, updated in real time, is determined as the time remaining until the measurement value reaches the target value at the first point in time, and The adjusted target value at the first point in time above, If the residual value at the second time point is less than 0, The value is determined as the smaller value between the second value obtained by adding the adjusted target value at the second time point to the first value obtained by multiplying the first value obtained by multiplying the time gap and the fluctuation value per unit time of the measurement value, and the target value at the first time point. If the residual value at the second time point is greater than 0, The first value obtained by multiplying the time gap and the fluctuation value per unit time of the measurement value is determined as the larger value among the third value obtained by subtracting the adjusted target value at the second time point from the target value at the first time point, and the target value at the first time point. If the residual value at the second time point is 0, A device for calculating a process capability evaluation index of equipment, characterized by determining the adjusted target value at the second point in time above.
In Paragraph 7, The above processor is, If the time remaining until the measured value reaches the target value at the above second time point is 0 or less, The time remaining until the measured value reaches the target value at the first point in time is determined to be 0, and A device for calculating a process capability evaluation index of equipment, characterized by determining the adjusted target value of the first time point as the target value of the first time point.
In paragraph 8, The above processor is, The raw error at the first time point is calculated by subtracting the adjusted target value at the first time point from the measurement value at the first time point, and When calculating the adjusted error considering the time remaining until the measured value reaches the set value, The adjusted error at the first point in time above, If the time remaining until the measured value reaches the target value at the first point in time is 0, Determined as the raw error at the first point in time above, and If the time remaining until the measurement value at the first time point reaches the target value is not zero, A device for calculating a process capability evaluation index of equipment, characterized by determining the value obtained by dividing the row error of the first time point by the value obtained by applying an exponential function to the adjustment parameter.
In Paragraph 9, The above processor is, A device for calculating a process capability evaluation index of equipment, characterized by calculating the process capability evaluation index of the equipment using the above-mentioned adjusted error.
A method performed in a device comprising a memory for storing one or more programs for calculating an evaluation index of the process capability of a facility and one or more processors for performing operations according to said one or more programs, wherein A step of receiving a target value, which is a reference value input to the equipment to maintain the environmental conditions targeted by the equipment, or a process value, which is a value corresponding to the target value and is obtained by a sensor measuring the equipment; A step of receiving at least one operation parameter corresponding to an operation rule for calculating an evaluation index for the process capability of the above-mentioned facility; A step of calculating at least one derived variable used as a criterion for detecting an abnormality of the equipment using the above target value or the above measurement value; and A method for calculating a process capability evaluation index of a facility, comprising the step of calculating a process capability evaluation index of a facility based on at least one selected from a group consisting of at least one derived variable, the target value, the measured value, and at least one essential parameter.
In Paragraph 11, The step of calculating at least one derived variable used as a criterion for detecting abnormalities in the equipment using the above target value or the above measurement value is: It includes calculating at least one selected from a group consisting of a target value change amount corresponding to the difference between a target value at a first time point and a target value at a second time point prior to the first time point, a residual value corresponding to the difference between the target value and the measured value, a time gap corresponding to the time difference between the first time point and the second time point, and an estimated arrival time which is the estimated time required for the measured value to reach the target value. The above at least one operation parameter is, A method for calculating a process capability evaluation index of a facility, characterized by including at least one selected from a group consisting of a value of variation per unit time of the above-mentioned measurement, a ratio value of an allowable error for setting an anomaly detection standard, and an adjustment parameter for cases where the value of variation per unit time is not linear.
In Paragraph 12, The step of calculating a process capability evaluation index of a facility based on at least one selected from a group consisting of at least one derived variable, the target value, the measured value, and at least one essential parameter is: If the amount of change in the target value at the first time point is not zero, The estimated arrival time is calculated by dividing the residual value at the first time point by the fluctuation value per unit time of the measurement value and adding the time gap at the first time point, and When the above change in target value is 0, A method for calculating a process capability evaluation index of equipment, characterized by determining the above-mentioned expected arrival time to be 0.
A computer program stored on a computer-readable recording medium for executing on a computer the method for calculating the process capability evaluation index of a facility described in any one of paragraphs 11 to 13.

Description

Apparatus and Method for Calculating Condition-Based Process Capability Index of Equipment Using Equipment Specifications The present invention relates to an apparatus and method for calculating a process capability evaluation index of equipment. The content described in this section merely provides background information regarding the present embodiment and does not constitute prior art. In the manufacturing sector, detecting equipment anomalies requires significant time and resources, ranging from data collection to model implementation. Anomaly detection performance is heavily dependent on the quantity and quality of collected data, and in most cases, model implementation necessitates customization. Understanding anomaly detection results often requires specialized knowledge of data analysis, and data experts are needed for the maintenance and management of the models. For these reasons, there are high barriers to entry for small and medium-sized enterprises (SMEs) to apply equipment anomaly detection models. To address this problem, a general-purpose rule-based anomaly detection model with minimal data collection difficulties may be required. Such a model should be based on rules that allow for simple configuration and be capable of performing effective anomaly detection with only a small amount of environmental variable data. FIG. 1 is a flowchart illustrating a method for calculating a process capability evaluation index of a condition-based facility using facility specifications according to an embodiment of the present invention. FIG. 2 is a diagram illustrating the operation process of a method for calculating a process capability evaluation index of a condition-based facility using facility specifications according to an embodiment of the present invention. FIG. 3 is a diagram illustrating the operation process of a method for calculating a process capability evaluation index of a condition-based facility using facility specifications according to an embodiment of the present invention. FIG. 4 visually shows the results of anomaly detection resulting from the injection of anomalies and changes in the target value (TV) and measured value (PV) of the equipment according to an embodiment of the present invention, in accordance with the operation performed by the condition-based equipment process capability evaluation index calculation device utilizing equipment specifications. FIG. 5 is a graph showing the change in equipment status and CMK value in units of time (seconds) according to the change in the target value (TV) and measured value (PV) of the equipment, in accordance with the operation performed by the equipment specification-based process capability evaluation index calculation device according to one embodiment of the present invention. FIG. 6 is a diagram illustrating the configuration of a device for calculating a process capability evaluation index of a condition-based facility using facility specifications according to an embodiment of the present invention. Hereinafter, embodiments of the present invention will be described in detail with reference to the attached drawings. The advantages and features of the present invention, and the methods for achieving them, will become clear by referring to the embodiments described below in detail together with the attached drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. Unless otherwise defined, all terms used in this specification (including technical and scientific terms) may be used in a meaning that is commonly understood by those skilled in the art to which the present invention belongs. Furthermore, terms defined in commonly used dictionaries are not to be interpreted ideally or excessively unless explicitly and specifically defined otherwise. The terms used in this application are used merely to describe specific embodiments and are not intended to limit the invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In this application, terms such as “have,” “may have,” “include,” or “may include” are intended to indicate the existence of the features, numbers, steps, actions, components, parts, or combinations thereof described in the specification, and should be understood as not precluding the existence or addition of one or more other features, numbers, steps, actions, components, parts, or combinations thereof. Terms including ordinal numbers, such as “second,” “first,” etc., may be used to describe various components, but said components are not limited by said terms. The above terms are used solely for the purpose of distinguishing one component