KR-20260067272-A - SELF-INTERFERENCE FOURIER PTYCHOGRAPHIC MICROSCOPY SYSTEM

KR20260067272AKR 20260067272 AKR20260067272 AKR 20260067272AKR-20260067272-A

Abstract

The present invention relates to a self-interference Fourier tymographic microscope system capable of acquiring Fourier tymographic complex image information for reconstructing the three-dimensional shape of an object using a self-interference method in a Fourier tymographic microscope, comprising: an illumination unit used as a light source for incident light of multiple angles on an object; an object that transmits or reflects light generated from the illumination unit; an objective lens that generates a magnified image of the object corresponding to the light from the illumination unit; a self-interferencer for generating interference fringes of the object light that has passed through the objective lens; and an image sensor unit for acquiring interference fringes generated through the self-interferencer.

Inventors

박재형
한지윤

Assignees

서울대학교산학협력단

Dates

Publication Date: 20260512
Application Date: 20241231
Priority Date: 20241105

Claims (17)

A lighting unit used as a light source for incident light at multiple angles on an object; An object that transmits or reflects light generated from the above-mentioned lighting unit; An objective lens that generates an enlarged image of an object corresponding to light from the above-mentioned illumination unit; A self-interferometer for generating interference fringes of object light passing through the above objective lens; and An image sensor unit for acquiring interference fringes generated through the above-mentioned self-interferometer; comprising Self-interference Fourier tychographic microscope system.
In Article 1, The above lighting unit is, Characterized by being composed of an array of light-emitting diodes including at least one light-emitting diode, Self-interference Fourier tychographic microscope system.
In Article 2, The arrangement of each of the above light-emitting diodes is characterized by having various patterns such as grid or circular. Self-interference Fourier tychographic microscope system.
In Article 2, The above light-emitting diode array is, It is divided into a central area and an outer area, A light-emitting diode placed in the central area acquires bright-field information by incidenting a main light beam onto an object at an angle less than a certain angle, and A light-emitting diode placed in an outer region is characterized by acquiring dark-field information by causing a main light beam to be incident on an object at an angle greater than a certain angle. Self-interference Fourier tychographic microscope system.
In Paragraph 3, The light-emitting diode described above is characterized by adjusting illumination and distance according to the shooting information of an object and the detailed design of the optical system. Self-interference Fourier tychographic microscope system.
In Article 1, The above object is, Characterized by applying a transparent object that transmits light from the above-mentioned lighting unit or a reflective object that reflects light from the lighting unit. Self-interference Fourier tychographic microscope system.
In Article 6, The above-mentioned transparent object is, Characterized by being arranged parallel to each other between the lighting unit and the objective lens as the light from the lighting unit is transmitted. Self-interference Fourier tychographic microscope system.
In Article 6, The above reflective object is, Characterized by being positioned parallel to the lighting unit and perpendicular to the objective lens as it reflects the light of the lighting unit. Self-interference Fourier tychographic microscope system.
In Article 6, The above object is, including at least one of a two-dimensional object and a three-dimensional object having height, Self-interference Fourier tychographic microscope system.
In Article 6, Characterized by having a wavefront separator provided between the above-mentioned lighting unit and the object, through which the light source of the lighting unit passes, is reflected by a reflective object, and is incident on an objective lens. Self-interference Fourier tychographic microscope system.
In Article 10, The above wavefront separator is characterized by being composed of a light-separating prism formed by combining two right-angle prisms. Self-interference Fourier tychographic microscope system.
In Article 11, Characterized by the formation of an inclined surface at the boundary of the light-separating prisms of the two right-angle prisms mentioned above. Self-interference Fourier tychographic microscope system.
In Article 10, The above-mentioned wavefront separator is characterized by having a light-separating plate that is coated with a transmittance and reflection according to the amount of light required on at least one surface. Self-interference Fourier tychographic microscope system.
In Article 10, Characterized by the distance between the objective lens and the wavefront separator being adjusted to the working distance of the objective lens. Self-interference Fourier tychographic microscope system.
In Article 1, The above-mentioned self-interference system is, A self-interference Fourier tychographic microscope system characterized by being configured based on a polarizing element or a geometric phase element.
In Article 1, The image sensor unit above is, It consists of an eyepiece lens and an image sensor, and Characterized by acquiring complex information of an object by photographing interference fringes generated by a self-interferometer, Self-interference Fourier tychographic microscope system.
In Article 1, The image sensor unit is characterized by having a polarizing element attached thereto for applying a phase shift technique. Self-interference Fourier tychographic microscope system.

Description

Self-Interference Fourier Tychographic Microscope System The present invention relates to a self-interference Fourier tymographic microscope system, and more specifically, to a self-interference Fourier tymographic microscope system capable of acquiring Fourier tymographic complex image information for the three-dimensional shape reconstruction of an object by using a self-interference method in a Fourier tymographic microscope. Generally, Fourier tychographic microscopy (FPM) acquires multiple low-resolution images using a microscope device and then iteratively synthesizes image information in the frequency domain through a Fourier transform to restore high-resolution amplitude and phase information with a wide field of view (FOV) and numerical aperture (NA), and enables the restoration of the three-dimensional shape of an object by utilizing the acquired phase information. These low-resolution images are divided into bright-field images, which primarily contain low-frequency information of the object, and dark-field images, which contain high-frequency information; each image can be obtained by causing light to be incident on the object surface at various angles. Light incident at multiple angles is transmitted or reflected from the object, passes through the objective lens of the optical system, and reaches the image sensor. At this point, the magnitude and shape of the light are determined by the aperture (NA) of the objective lens used, and the role of the objective lens in the frequency domain can be defined as the pupil function. When controlling the angle of incident light using a light emitting diode array (LED array), the spatial position of the light emitting diodes within the array can be correlated with the spectral position in the frequency space. Therefore, the pupil function in the frequency space is utilized as a low-pass filter to acquire only the necessary information from each low-resolution image and synthesize information corresponding to the entire frequency space of the high-resolution image. By shifting the synthesized frequency information to the spatial domain using the Fourier transform, high-resolution amplitude and phase information is obtained. Unlike conventional microscope devices that obtain shape information of an object by measuring the intensity of light transmitted or reflected from the object, digital holographic microscopy (DHM) can restore shape information of an object through information obtained using light interference and diffraction phenomena. Digital holographic technology utilizes a beam splitter to separate light into two channels: one for the reference light that directly enters the image sensor, and the other for the object light that enters the image sensor after passing through the object being measured. When the object and reference lights, having passed through channels with different optical paths, enter the image sensor, interference pattern information resulting from the interference phenomenon between the two lights is acquired. Generally, since a laser with high coherence is used as the light source to capture interference patterns, there is a disadvantage in that there are significant spatial constraints for system configuration. Since such Fourier tychographic microscopes reconstruct amplitude and phase using images containing only light intensity information, they have the disadvantage of requiring a large number of input images because accurate frequency information can only be obtained when synthesizing information in the frequency domain if the crossover ratio of each piece of information is high. In addition, digital holographic microscopes have the disadvantage that, compared to Fourier tychographic microscopes, the system is difficult to build and there are limitations on the available light sources because a laser must be used as a light source to obtain more accurate object information. FIG. 1 is a schematic diagram illustrating a self-interference Fourier tymographic microscope system according to one embodiment of the present invention. FIG. 2 is a configuration diagram illustrating a self-interference Fourier tymographic microscope system according to another embodiment of the present invention. FIG. 3 is a structural diagram showing a transmission type system of a self-interference Fourier tymographic microscope system according to one embodiment of the present invention. FIG. 4 is a structural diagram showing a reflective system of a self-interference Fourier tymographic microscope system according to one embodiment of the present invention. FIG. 5 is an exemplary diagram showing the transmission bright-field and dark-field imaging states of a self-interference Fourier tymographic microscope system according to one embodiment of the present invention. FIG. 6 is an exemplary diagram showing the reflective brightfield and darkfield imaging states of a self-interference Fourier tymographic microscope system according to one embodiment