KR-20260067341-A - INLINE TERAHERTZ MEASUREMENT DEVICE FOR DRY ELECTRODE FILM MANUFACTURING, AND METHODS THEREOF

Abstract

A system and method for processing a dry electrode film are disclosed, comprising a roller system, a terahertz measuring device, and a dry electrode powder mixture dispenser. The measuring device may include a terahertz source and a terahertz sensor. The terahertz source is emitted toward the upper and lower surfaces of the dry electrode film, and after being reflected, returns to the terahertz sensor to measure the physical properties of the dry electrode film.

Inventors

• 잔디아타슈바르, 아르다반
• 에글스턴, 본
• 왕, 카이핑
• 에르벤, 크리스토프
• 진, 시카이
• 다나카, 켄타로
• 팜, 민

Assignees

• 테슬라, 인크.

Dates

Publication Date

20260512

Application Date

20251103

Priority Date

20241105

Claims (20)

1. In a system for processing dry electrode films, A roller system including a calendar roller; A measuring device disposed on the calendar roller and comprising a terahertz source and a terahertz sensor; and Dry electrode powder mixture dispenser Includes, The above terahertz source is configured to emit terahertz radiation pulses, and The terahertz sensor is configured to detect the terahertz reflection of the terahertz radiation pulse, and The above dry electrode powder mixture dispenser is configured to spray dry electrode material onto the calendar roller, and The above terahertz source is positioned in alignment with the above terahertz sensor, System.
2. In paragraph 1, Additional calendar roller; and Additional measuring device Includes more, The above additional measuring device is placed on the above additional calendar roller, System.
3. In paragraph 1, The above terahertz radiation pulse includes any one or any combination of spot size, peak width, and frequency, System.
4. In paragraph 3, The above spot size includes a diameter of 0.05 mm to 0.5 mm, System.
5. In paragraph 3, The above frequency is 0.05 THz to 5.0 THz, System.
6. In paragraph 3, The above peak width is 1 ps to 5 ps, System.
7. In paragraph 1, The above terahertz sensor is configured to measure a physical property selected from a group consisting of any one or any combination of mass density, loading, uniformity, thickness, and basis weight. System.
8. In paragraph 1, The terahertz sensor is configured to measure any one or any combination of the flight time of the terahertz radiation pulse, the intensity of the terahertz radiation pulse, and the intensity of the terahertz reflection. System.
9. In paragraph 1, The above terahertz sensor is configured to measure the intensity of the above terahertz reflection, System.
10. In paragraph 1, Current collector dispenser including, System.
11. In a method for calibrating the above system of claim 1, Step of applying a dry electrode film onto the above-mentioned calendar roller - the dry electrode film comprises a marker and a film region located downstream of the marker, and the film region comprises a first main surface and a second main surface located opposite the first main surface -; A step of emitting a marker terahertz radiation pulse from a terahertz source to the marker to form a marker reflection; A step of detecting the marker reflection using the terahertz sensor; A step of emitting a terahertz radiation pulse from a terahertz source into a film region at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; A step of detecting the first terahertz reflection at a second time point using the terahertz sensor, and detecting the second terahertz reflection at a third time point using the terahertz sensor; and Step of sampling the above film area including, method.
12. In a method for processing a dry electrode film, Step of applying a dry electrode film onto a calendar roller - said dry electrode film comprises a first main surface and a second main surface located opposite the first main surface -; A step of forming a dry electrode film that moves by rotating the above calendar roller; A step of emitting a terahertz radiation pulse to the moving dry electrode film at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; and A step of detecting the first terahertz reflection using a terahertz sensor at a second time point, and detecting the second terahertz reflection using a terahertz sensor at a third time point. including, method.
13. In Paragraph 12, A step of determining the flight time of a first major surface by quantifying the difference between the first time point and the second time point; and A step of determining the flight time of the second major surface by quantifying the difference between the first time point and the third time point. including, method.
14. In Paragraph 12, A step of determining the intensity of the terahertz radiation pulse at the first time point; A step of determining the intensity of the first terahertz reflection at the second time point; Step of determining the intensity of the second terahertz reflection at the third point in time including, method.
15. In Paragraph 12, The step of emitting the terahertz radiation pulse comprises the step of projecting any one or any combination of spot size, peak width, and frequency. method.
16. In paragraph 15, The above spot size includes a diameter of 0.05 mm to 0.5 mm, method.
17. In Paragraph 16, The above frequency is at least 0.05 terahertz and at least 5.0 terahertz, method.
18. In Paragraph 16, The above peak width is at least 1.0 ps and no more than 5 ps, method.
19. In Paragraph 12, The above detection includes the step of determining a physical property selected from a group consisting of any one or any combination of mass density, loading, uniformity, thickness, and basis weight. method.
20. In Paragraph 12, Step of applying a current collector onto the above dry electrode film including, method.

Description

Inline Terahertz Measurement Device for Dry Electrode Film Manufacturing and Methods Thereof The present disclosure relates to systems for manufacturing dry electrode films and methods for processing dry electrode films. In particular, the method relates to processing and calibrating a system for processing dry electrode films using terahertz sources and sensors. Dry electrode films for energy storage devices comprise binder materials combined with active electrode materials. Dry electrode films are manufactured by calendaring powder mixtures without the use of solvents, resulting in unique manufacturing processes and potential assembly difficulties. For example, while the properties of electrode films manufactured by wet solvents can be controlled through slurry deposition processes, dry electrode films are formed on calendar rolls before being applied onto a current collector to form electrodes. Therefore, other methods and systems specifically applied to control the properties of dry electrode films may be useful. FIG. 1 is a cross-sectional view of a measuring device placed on a dry electrode material applied on a calendar roller according to some embodiments. FIG. 2 is a cross-sectional view of a system for processing a dry electrode film including a measuring device according to some embodiments. FIG. 3 is a cross-sectional view of a system for processing a dry electrode film in operation according to some embodiments. FIG. 4a is a cross-sectional view of systems for processing dry electrode films according to some embodiments. FIG. 4b is a front view of systems for processing dry electrode films according to some embodiments. FIG. 5 is a flowchart illustrating a method for calibrating a system for processing a dry electrode film according to some embodiments. FIG. 6 is a flowchart illustrating a method for processing a dry electrode film according to some embodiments. Includes citations of any priority applications. This disclosure claims the benefit of priority to U.S. Patent Application No. 18/937,956, titled “Inline Terahertz Measurement Apparatus and Methods for Manufacturing Dry Electrode Films,” filed on November 5, 2024, the entire contents of which are incorporated herein by reference for all purposes. For the purpose of explaining the summary of the invention and the benefits of the prior art, specific objects and benefits of the invention are described herein. Not all objects or benefits are necessarily achieved in specific embodiments of the invention. Accordingly, for example, those skilled in the art will recognize that the invention may be implemented or performed in a manner that achieves or optimizes one or more benefits taught herein, while other objects or benefits taught or suggested herein may not necessarily be achieved. In some aspects, a system for processing a dry electrode film is described. The system for processing a dry electrode film comprises a roller system including a calendar roller; a measuring device disposed over the calendar roller and including a terahertz source and a terahertz sensor; and a dry electrode powder mixture dispenser, wherein the terahertz source is configured to emit a terahertz radiation pulse and the terahertz sensor is configured to detect a terahertz reflection of the terahertz radiation pulse and the dry electrode powder mixture dispenser is configured to spray a dry electrode material over the calendar roller and the terahertz source is disposed collinear with the terahertz sensor. In some embodiments, the system further comprises an additional calendar roller and an additional measuring device, wherein the additional measuring device is positioned on the additional calendar roller. In some embodiments, the terahertz radiation pulse comprises any one or any combination of spot size, peak width, and frequency. In some embodiments, the spot size comprises a diameter of about 0.05 mm to 0.5 mm. In some embodiments, the frequency is about 0.05 THz to 5.0 THz. In some embodiments, the peak width is about 1 ps to 5 ps. In some embodiments, the terahertz sensor is configured to measure a physical property selected from the group consisting of any one or any combination of mass density, stacking weight, uniformity, thickness, and weight per unit area. In some embodiments, the terahertz sensor is configured to measure any one or any combination of the flight time of the terahertz radiation pulse, the intensity of the terahertz radiation pulse, and the intensity of the terahertz reflection. In some embodiments, the terahertz sensor is configured to measure the intensity of the terahertz reflection. In some embodiments, the system further includes a current collector dispenser. In some aspects, a method for calibrating the system is described. The method comprises the steps of: applying a dry electrode film over the calendar roller—the dry electrode film comprises a marker and a film region located downstream of the marker, and the film region comprises