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KR-20260067854-A - DISPERSIVE NEAR INFRARED DETECTION SYSTEM FOR MEASURING CURED MATERIAL IN LOCALIZED AREA

KR20260067854AKR 20260067854 AKR20260067854 AKR 20260067854AKR-20260067854-A

Abstract

A distributed NIR detection system for measuring localized curing materials is provided. The distributed NIR detection system for measuring localized curing materials comprises: a light source emitting near-infrared light; a probe comprising a plurality of first optical fiber bundles that transmit the near-infrared light to a measurement target and a plurality of second optical fiber bundles that transmit reflected light from the measurement target; a detector that detects the reflected light; and a computer that interprets the detected reflected light to measure the degree of curing of the measurement target, wherein the detector comprises a first slit that passes the reflected light transmitted by the plurality of second optical fiber bundles; a grating structure that disperses the reflected light passing through the first slit by wavelength; a second slit that selectively passes the light dispersed by the grating structure; and a sensor that detects the light selectively passed through, wherein the plurality of second optical fiber bundles are aligned and arranged in the longitudinal direction of the first slit.

Inventors

  • 권지나
  • 김종석
  • 전은정
  • 백결
  • 심샛별

Assignees

  • 엘지이노텍 주식회사

Dates

Publication Date
20260513
Application Date
20241106

Claims (14)

  1. A light source that emits near-infrared light; A probe comprising a plurality of first optical fibers that transmit the above-mentioned near-infrared light to a measurement target, and a plurality of second optical fibers that transmit reflected light from the above-mentioned measurement target; A detector for detecting the reflected light; and A computer that interprets the detected reflected light to measure the degree of hardness of the measurement target, comprising: The detector above has a first slit that passes reflected light transmitted by a plurality of second optical fibers; A grid structure that disperses reflected light passing through the first slit according to wavelength; A second slit that selectively passes light dispersed by the above-mentioned grid structure; and The above includes a sensor that detects optionally passed light, and The plurality of second optical fibers are arranged aligned in the longitudinal direction of the first slit. Dispersive NIR (Near Infrared) detection system for measuring localized cured materials.
  2. In Article 1, The diameter of each of the plurality of second optical fibers is larger than the width of the first slit, Dispersive NIR detection system for measuring localized area cured materials.
  3. In Paragraph 2, The sum of the diameters of the plurality of second optical fibers is less than or equal to the length of the first slit, Dispersive NIR detection system for measuring localized area cured materials.
  4. In Article 1, The number of the plurality of first optical fibers is greater than the number of the plurality of second optical fibers. Dispersive NIR detection system for measuring localized area cured materials.
  5. In Article 1, The light source emitting the above near-infrared light operates with an output of 4.7W to 30W, Dispersive NIR detection system for measuring localized area cured materials.
  6. In Article 1, A lens further comprising a lens that focuses near-infrared light passing through the probe to a local area of the measurement target. Dispersive NIR detection system for measuring localized area cured materials.
  7. In Paragraph 6, The above lens comprises a silicate-based material, Dispersive NIR detection system for measuring localized area cured materials.
  8. A light source that emits near-infrared light; A probe that transmits the above near-infrared light to a measurement target and receives reflected light from the measurement target; A detector for detecting the received reflected light; and It includes a computer that interprets the detected reflected light to measure the degree of hardening of the measurement target, The above probe is, A transmission signal line having one end connected to the light source and the other end extended to a light entry/exit port facing the measurement target, and It includes a receiving signal line, one end of which is connected to the detector and the other end of which extends to the light input/output port, and The number of multiple first optical fibers included in the transmission signal line is greater than the number of multiple second optical fibers included in the reception signal line, Dispersive NIR detection system for measuring localized area cured materials.
  9. In Paragraph 8, The detector above has a first slit that passes reflected light transmitted by a plurality of receiving signal lines; A grid structure that disperses reflected light passing through the first slit according to wavelength; A second slit that selectively passes light dispersed by the above-mentioned grid structure; and The above includes a sensor that detects optionally passed light, and A plurality of second optical fibers connected to the first slit are arranged in alignment along the length direction of the first slit. Dispersive NIR detection system for measuring localized area cured materials.
  10. In Article 9, The sum of the diameters of the plurality of second optical fibers is equal to or smaller than the length of the first slit. Dispersive NIR detection system for measuring localized area cured materials.
  11. In Article 9, Each of the plurality of second optical fibers has a diameter greater than the width of the first slit, Dispersive NIR detection system for measuring localized area cured materials.
  12. In Paragraph 8, The light source emitting the above near-infrared light operates with an output of 4.7W to 30W, Dispersive NIR detection system for measuring localized area cured materials.
  13. In Paragraph 8, A lens further comprising a lens that focuses near-infrared light passing through the probe to a local area of the measurement target. Dispersive NIR detection system for measuring localized area cured materials.
  14. In Paragraph 13, The above lens comprises a silicate-based material, Dispersive NIR detection system for measuring localized area cured materials.

Description

Dispersive Near Infrared Detection System for Measuring Cured Material in a Localized Area The present invention relates to a distributed NIR detection system for measuring localized cured materials, and more specifically, to a system for measuring the absorbance of near-infrared light for non-contact and non-destructive curing degree measurement of cured materials such as epoxy, and to provide a distributed NIR detection system for measuring localized cured materials that can be configured cost-effectively. To measure the degree of curing of cured materials, such as epoxy used in electronic products, the material is physically extracted, and sample analysis is performed using Differential Scanning Calorimetry (DSC). However, DSC-based hardness analysis had issues regarding reproducibility and its inability to represent the process environment, such as significant variations in measured hardness depending on the analysis area or the inability to detect meaningful changes in hardness between samples with different curing times. Furthermore, since DSC is fundamentally a destructive analysis method, it was nearly impossible to organically integrate it into the process line to measure the hardness of samples being manufactured in real time. Accordingly, analysis based on NIR spectroscopy has been introduced, which irradiates a sample with near-infrared light to measure the absorbance of specific chemical bonds, such as epoxides, and then quantitatively calculates the curing characteristics. This method is non-destructive, allows for a significant reduction in measurement time, and offers the advantages of high reliability for localized area measurements in the μm range. Such near-infrared curing analysis methods include measurements using dispersive near-infrared spectroscopy and measurement methods using Fourier Transform NIR (FT-NIR) spectroscopy. The FT-NIR method is a relatively recently developed technique that can detect light of all wavelengths simultaneously, offering the advantage of being able to analyze various components at high speeds. However, since FT-NIR analyzers are expensive equipment costing over $100,000 per unit, there are practical difficulties in introducing them into various aspects of production process lines. Therefore, in order to implement a more cost-effective distributed NIR detection method for measuring hardness, a distributed NIR detection system is required that is improved in terms of signal-to-noise ratio and reliability, which are evaluated to be inferior to the aforementioned FT-NIR method. FIG. 1 is a diagram illustrating a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention. FIG. 2 is a diagram illustrating the configuration of a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention. FIG. 3 is a diagram illustrating the configuration of a detector included in a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention. FIGS. 4a and 4b are drawings illustrating a configuration in which a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention is coupled with a first slit of a detector. FIGS. 5a and 5b are drawings illustrating the effect according to the output of a light source included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention. Figures 6a and 6b are graphs illustrating the measurement effect optimized by a dispersive NIR detection system for measuring localized area cured materials according to an embodiment of the present invention. FIG. 7 is a diagram illustrating the configuration of a lens and a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention. FIGS. 8a and 8b are graphs illustrating the improvement in measurement effect by a lens included in a dispersive NIR detection system for measuring localized area cured materials according to an embodiment of the present invention. The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. Throughout the specification, the same reference numerals refer to the same components. When one compon