TW-I925135-B - SCAN CHAIN CIRCUIT, CONTROL CIRCUIT AND METHOD FOR TESTING FLIP FLOPS

Inventors

• LIN, JIA HAN
• TSAI, SHIH-CHANG
• KUO, FENG-MING
• YUAN, CHUNG-SHENG
• WANG, CHUNG-HSING
• CHENG, YI-KAN

Assignees

• 台灣積體電路製造股份有限公司

Dates

Publication Date

20260511

Application Date

20240508

Priority Date

20240315