US-12618723-B2 - Electronic device, parameter calibration method, and non-transitory computer readable storage medium

Abstract

An electronic device is disclosed. The electronic device includes several sensing circuits, several strain sensing circuits, a memory and a processor. The several sensing circuits are configured to obtain several sensing values. The several strain sensing circuits are configured to obtain several strain sensing values. The memory is configured to store a linking database. The linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence. The processor is configured to: update several external parameters between the several sensing circuits according to the several strain sensing values and the linking database.

Inventors

• Wei-Fan Chen

Assignees

• HTC CORPORATION

Dates

Publication Date

20260505

Application Date

20240424

Claims (20)

1. 1 . An electronic device, comprising: a plurality of sensing circuits, configured to obtain a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space; a plurality of strain sensing circuits, configured to obtain a plurality of strain sensing values in correspondence to a deformation of the electronic device; a memory, configured to store a linking database, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and a processor, coupled to the plurality of sensing circuits, the plurality of strain sensing circuits and the memory, configured to: update a plurality of external parameters between the plurality of sensing circuits according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
2. 2 . The electronic device of claim 1 , wherein the processor is further configured to: obtain a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values; obtain a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and update the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.
3. 3 . The electronic device of claim 1 , wherein the processor is further configured to: establish the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.
4. 4 . The electronic device of claim 3 , wherein the processor is further configured to: obtain a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits; obtain a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and establish the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.
5. 5 . The electronic device of claim 1 , wherein the processor is further configured to: perform a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device; wherein the plurality of strain sensing circuits are set at the plurality of representative positions.
6. 6 . The electronic device of claim 1 , wherein the processor is further configured to: update the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and re-construct the linking database when the deformation of the electronic device is not within the elastic range.
7. 7 . The electronic device of claim 6 , wherein the processor is further configured to: determine whether the deformation of the electronic device is within the elastic range according to the linking database.
8. 8 . A parameter calibration method, suitable for an electronic device, comprising: obtaining a plurality of sensing values so as to obtain a pose of the electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device; obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device; storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
9. 9 . The parameter calibration method of claim 8 , further comprising: obtaining a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values; obtaining a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and updating the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.
10. 10 . The parameter calibration method of claim 8 , further comprising: establishing the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases.
11. 11 . The parameter calibration method of claim 10 , further comprising: obtaining a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits; obtaining a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and establishing the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.
12. 12 . The parameter calibration method of claim 8 , further comprising: performing a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device; wherein the plurality of strain sensing circuits are set at the plurality of representative positions.
13. 13 . The parameter calibration method of claim 8 , further comprising: updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and re-constructing the linking database when the deformation of the electronic device is not within the elastic range.
14. 14 . The parameter calibration method of claim 13 , further comprising: determining whether the deformation of the electronic device is within the elastic range according to the linking database.
15. 15 . A non-transitory computer readable storage medium, wherein the non-transitory computer readable storage medium comprises one or more computer programs stored therein, and the one or more computer programs can be executed by one or more processors so as to be configured to operate a parameter calibration method, wherein the parameter calibration method comprises: obtaining a plurality of sensing values so as to obtain a pose of an electronic device within an environmental coordinate system of a real space by a plurality of sensing circuits of the electronic device; obtaining a plurality of strain sensing values in correspondence to a deformation of the electronic device by a plurality of strain sensing circuits of the electronic device; storing a linking database by a memory of the electronic device, wherein the linking database comprises a linking relationship between a plurality of testing strain sensing value groups of the plurality of strain sensing circuits and a plurality of testing external parameter groups of the plurality of sensing circuits in correspondence; and updating a plurality of external parameters between the plurality of sensing circuits by a processor of the electronic device according to the plurality of strain sensing values and the linking database so as to obtain the pose of the electronic device within the environmental coordinate system accurately, wherein when obtaining the pose of the electronic device, the plurality of external parameters between the plurality of sensing circuits are considered.
16. 16 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises: obtaining a first testing strain sensing value group of the plurality of testing strain sensing value groups corresponding to the plurality of strain sensing values; obtaining a first testing external parameter group of the plurality of testing external parameter groups in correspondence to the first testing strain sensing value group according to the linking database; and updating the plurality of external parameters between the plurality of sensing circuits according to the first testing external parameter group.
17. 17 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises: establishing the linking database according to the plurality of testing strain sensing value groups and the plurality of testing external parameter groups in correspondence based on a plurality of loading cases, comprising: obtaining a first testing strain sensing value group based on a first loading case of the plurality of loading cases by the plurality of strain sensing circuits; obtaining a first testing external parameter group corresponding to the first loading case according to a plurality of images captured by a plurality of cameras of the plurality of sensing circuits when the electronic device is deformed based on the first loading case; and establishing the linking relationship between the first testing strain sensing value group and the first testing external parameter group based on the first loading case.
18. 18 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises: performing a structural stress analysis to the electronic device so as to obtain a plurality of representative positions of the electronic device; wherein the plurality of strain sensing circuits are set at the plurality of representative positions.
19. 19 . The non-transitory computer readable storage medium of claim 15 , wherein the parameter calibration method further comprises: updating the plurality of external parameters according to the linking database when the deformation of the electronic device is within an elastic range; and re-constructing the linking database when the deformation of the electronic device is not within the elastic range.
20. 20 . The non-transitory computer readable storage medium of claim 19 , wherein the parameter calibration method further comprises: determining whether the deformation of the electronic device is within the elastic range according to the linking database.

Description

BACKGROUND Field of Invention The present application relates to an electronic device, a parameter calibration method, and a non-transitory computer readable storage medium. More particularly, the present application relates to an electronic device, a parameter calibration method, and a non-transitory computer readable storage medium with a self-tracking function. Description of Related Art In the future, the development trend of the electronic devices, such as the head-mounted display devices, will inevitably develop in the direction of thinness and lightness. It will be more obvious to use elastic design instead of rigidity in the structural design of the electronic devices such as the HMD devices. However, the opportunity for structural elastic deformation will also be greater. The sensing devices or the sensing circuits set on the electronic devices would become unfixed with the deformation of the electronic devices. The relative positions and the relative rotations between the sensing devices or the sensing circuits of the electronic devices will no longer be fixed values, and corrections for the relative positions and the relative rotations need to be more immediate, faster, and more flexible, so as to maintain the operational performances of the electronic devices. Several methods are proposed to calibrate the external parameters, including the relative positions and the relative rotations between the sensing devices or the sensing circuits. However, these calibration methods must be carried out through the image captured by the cameras. It requires a long time to collect and analyze data based on the captured images, making it difficult to respond in real time. Moreover, in the previous methods, only the external parameters between the cameras can be corrected, while other non-image capture devices such as depth sensors and gyroscopes cannot be corrected in real time, which can easily cause positioning errors of the electronic devices during long-term use. Therefore, how to calibrate the external parameters between the sensing devices or the sensing circuits of the electronic device in real time when the electronic device is structural elastic deformed is a problem to be solved. SUMMARY The disclosure provides an electronic device. The electronic device includes several sensing circuits, several strain sensing circuits, a memory and a processor. The several sensing circuits are configured to obtain several sensing values so as to locate the electronic device. The several strain sensing circuits are configured to obtain several strain sensing values in correspondence to a deformation of the electronic device. The memory is configured to store a linking database. The linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence. The processor is coupled to the several sensing circuits, the several strain sensing circuits and the memory. The processor is configured to update several external parameters between the several sensing circuits according to the several strain sensing values and the linking database. The disclosure provides a parameter calibration method suitable for an electronic device. The parameter calibration method includes the following operations: obtaining several sensing values so as to locate the electronic device by several sensing circuits of the electronic device; obtaining several strain sensing values in correspondence to a deformation of the electronic device by several strain sensing circuits of the electronic device; storing a linking database by a memory of the electronic device, in which the linking database includes a linking relationship between several testing strain sensing value groups and several testing external parameter groups in correspondence; and updating several external parameters between the several sensing circuits by a processor of the electronic device according to the several strain sensing values and the linking database. The disclosure provides a non-transitory computer readable storage medium with a computer program to execute aforesaid parameter calibration method. It is to be understood that both the foregoing general description and the following detailed description are by examples and are intended to provide further explanation of the invention as claimed. BRIEF DESCRIPTION OF THE DRAWINGS Aspects of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is noted that, according to the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion. FIG. 1 is a schematic block diagram illustrating an electronic device in accordance with some embodiments of the present disclosure. FIG. 2 is a schematic diagram illustrating a user operating the electro