US-12618809-B2 - Probe position encoding by ultrasound image correlation

Abstract

Data indicative of displacement of an acoustic probe assembly (or motion of an imaging aperture associated therewith) can be extracted from acquired acoustic echo data to perform motion tracking without requiring a separate mechanical motion sensor. As an illustrative example, a deterministic noise pattern associated with a particular probe location can be identified and motion of the noise pattern can be used to provide an estimate of probe assembly motion. Such an estimate can be used to facilitate imaging corresponding to multiple probe locations in support of acoustic non-destructive testing (NDT) such as in relation to Phased Array Ultrasound Test (PAUT).

Inventors

• Alain Le Duff

Assignees

• EVIDENT CANADA, INC.

Dates

Publication Date

20260505

Application Date

20220617

Claims (20)

1. 1 . A computer-implemented method of estimating a displacement of a probe assembly of an ultrasound inspection system along a surface of a specimen, the computer-implemented method comprising: acquiring, at a first position of the probe assembly positioned on the surface of the specimen, a first ultrasound image, wherein the first ultrasound image includes first structural noise of material grains in the specimen; acquiring, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image, wherein the second ultrasound image includes second structural noise of the material grains in the specimen; determining, using the first structural noise and the second structural noise, a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image; and estimating, using the determined first representation of the measure of similarity, the displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly.
2. 2 . The computer-implemented method of claim 1 , wherein the first ultrasound image and the second ultrasound image include B-scan images.
3. 3 . The computer-implemented method of claim 1 , wherein determining the first representation of the measure of similarity between the first ultrasound image and the second ultrasound image includes: performing a first cross-correlation between the first ultrasound image and the second ultrasound image.
4. 4 . The computer-implemented method of claim 3 , comprising: acquiring, at a third position of the probe assembly positioned on the surface of the specimen, a third ultrasound image; performing a second cross-correlation of the first ultrasound image and the third ultrasound image; and estimating, using the determined second cross-correlation, the displacement of the probe assembly between the first position of the probe assembly and the third position of the probe assembly.
5. 5 . The computer-implemented method of claim 4 , wherein the first ultrasound image is a first reference image, the computer-implemented method comprising: determining a correlation coefficient; and selecting a second reference image when the determined correlation coefficient meets a threshold value.
6. 6 . The computer-implemented method of claim 5 , wherein selecting the second reference image when the determined correlation coefficient meets the threshold value includes: selecting a current ultrasound image as a new reference image when the determined correlation coefficient meets the threshold value.
7. 7 . The computer-implemented method of claim 4 , wherein estimating, using the determined first representation of the measure of similarity, the displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly includes: determining, in relation to the first position of the probe assembly, the second position of the probe assembly that corresponds to a maximum value of the first cross-correlation; and determining, in relation to the first position of the probe assembly, a third position of the probe assembly that corresponds to a maximum value of the second cross-correlation.
8. 8 . An ultrasound inspection system comprising: a probe assembly to be positioned on a specimen under inspection; and a processor to: acquire, at a first position of the probe assembly positioned on a surface of the specimen, a first ultrasound image, wherein the first ultrasound image includes first structural noise of material grains in the specimen; acquire, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image, wherein the second ultrasound image includes second structural noise of the material grains in the specimen; determine, using the first structural noise and the second structural noise, a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image; and estimate, using the determined first representation of the measure of similarity, a displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly.
9. 9 . The ultrasound inspection system of claim 8 , wherein the probe assembly includes a linear array.
10. 10 . The ultrasound inspection system of claim 8 , wherein the first ultrasound image and the second ultrasound image include B-scan images.
11. 11 . The ultrasound inspection system of claim 8 , wherein the processor configured to determine the first representation of the measure of similarity between the first ultrasound image and the second ultrasound image is configured to: perform a first cross-correlation between the first ultrasound image and the second ultrasound image.
12. 12 . The ultrasound inspection system of claim 11 , wherein the processor further configured to: acquire, at a third position of the probe assembly positioned on the surface of the specimen, a third ultrasound image; perform a second cross-correlation of the first ultrasound image and the third ultrasound image; and estimate, using the determined second cross-correlation, the displacement of the probe assembly between the first position of the probe assembly and the third position of the probe assembly.
13. 13 . The ultrasound inspection system of claim 12 , wherein the first ultrasound image is a first reference image, the processor further configured to: determine a correlation coefficient; and select a second reference image when the determined correlation coefficient meets a threshold value.
14. 14 . The ultrasound inspection system of claim 13 , wherein the processor configured to select the second reference image when the determined correlation coefficient meets the threshold value is configured to: select a current ultrasound image as a new reference image when the determined correlation coefficient meets the threshold value.
15. 15 . The ultrasound inspection system of claim 12 , wherein the processor configured to estimate, using the determined first representation of the measure of similarity, the displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly is configured to: determine, in relation to the first position of the probe assembly, the second position of the probe assembly that corresponds to a maximum value of the first cross-correlation; and determine, in relation to the first position of the probe assembly, a third position of the probe assembly that corresponds to a maximum value of the second cross-correlation.
16. 16 . A machine-readable medium including instructions that, when executed by at least one processor, cause a system to: acquire, at a first position of a probe assembly of an ultrasound inspection system positioned on a surface of a specimen, a first ultrasound image, wherein the first ultrasound image includes first structural noise of material grains in the specimen; acquire, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image, wherein the second ultrasound image includes second structural noise of material grains in the specimen; determine, using the first structural noise and the second structural noise, a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image; and estimate, using the determined first representation of the measure of similarity, a displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly.
17. 17 . The machine-readable medium of claim 16 , wherein the first ultrasound image and the second ultrasound image include B-scan images.
18. 18 . The machine-readable medium of claim 16 , wherein the instructions that cause the system to determine the first representation of the measure of similarity between the first ultrasound image and the second ultrasound image cause the system to: perform a first cross-correlation between the first ultrasound image and the second ultrasound image.
19. 19 . The machine-readable medium of claim 16 , wherein the first ultrasound image is a first reference image, including further instructions that cause the system to: determine a correlation coefficient; and select a second reference image when the determined correlation coefficient meets a threshold value.
20. 20 . The machine-readable medium of claim 19 , wherein the instructions that cause the system to select the second reference image when the determined correlation coefficient meets the threshold value cause the system to: select a current ultrasound image as a new reference image when the determined correlation coefficient meets the threshold value.

Description

CLAIM OF PRIORITY This application is a U.S. National Stage filing under 35 U.S.C. § 371 from International Application No. PCT/CA2022/050979, titled “PROBE POSITION ENCODING BY ULTRASOUND IMAGE CORRELATION” to Alain Le Duff, filed on Jun. 17, 2022, which claims the benefit of priority of U.S. Provisional Patent Application Ser. No. 63/217,106, titled “PROBE POSITION ENCODING BY ULTRASOUND IMAGE CORRELATION” to Alain Le Duff, filed on Jun. 30, 2021, the entire contents of which being incorporated herein by reference. FIELD OF THE DISCLOSURE This document pertains generally, but not by way of limitation, to non-destructive evaluation, and more particularly, to apparatus and techniques for providing acoustic inspection, such as using a Phase Array Ultrasound Testing (PAUT) or other array acquisition approach including performing motion tracking of a probe assembly. BACKGROUND Various inspection techniques can be used to image or otherwise analyze structures without damaging such structures. For example, one or more of x-ray inspection, eddy current inspection, or acoustic (e.g., ultrasonic) inspection can be used to obtain data for imaging of features on or within a test specimen. For example, acoustic imaging can be performed using an array of ultrasound transducer elements, such as to image a region of interest within a test specimen. Different imaging modes can be used to present received acoustic signals that have been scattered or reflected by structures on or within the test specimen. SUMMARY OF THE DISCLOSURE Data indicative of displacement of an acoustic probe assembly (or motion of an imaging aperture associated therewith) can be extracted from acquired acoustic echo data to perform motion tracking without requiring a separate mechanical motion sensor. As an illustrative example, a deterministic noise pattern associated with a particular probe location can be identified and motion of the noise pattern can be used to provide an estimate of probe assembly motion. Such an estimate can be used to facilitate imaging corresponding to multiple probe locations in support of acoustic non-destructive testing (NDT) such as in relation to Phased Array Ultrasound Test (PAUT). In an aspect, this disclosure is directed to a computer-implemented method of estimating a displacement of a probe assembly of an ultrasound inspection system along a surface of a specimen, the computer-implemented method comprising: acquiring, at a first position of the probe assembly positioned on the surface of the specimen, a first ultrasound image: acquiring, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image; determining a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image: and estimating, using the determined first representation of the measure of similarity, the displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly. In an aspect, this disclosure is directed to an ultrasound inspection system comprising: a probe assembly to be positioned on a specimen under inspection: and a processor to: acquire, at a first position of the probe assembly positioned on a surface of the specimen, a first ultrasound image: acquire, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image; determine a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image: and estimate, using the determined first representation of the measure of similarity, a displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly. In an aspect, this disclosure is directed to a machine-readable medium including instructions that, when executed by at least one processor, cause a system to: acquire, at a first position of a probe assembly of an ultrasound inspection system positioned on a surface of a specimen, a first ultrasound image: acquire, at a second position of the probe assembly positioned on the surface of the specimen, a second ultrasound image: determine a first representation of a measure of similarity between the first ultrasound image and the second ultrasound image: and estimate, using the determined first representation of the measure of similarity, a displacement of the probe assembly between the first position of the probe assembly and the second position of the probe assembly. BRIEF DESCRIPTION OF THE DRAWINGS In the drawings, which are not necessarily drawn to scale, like numerals can describe similar components in different views. Like numerals having different letter suffixes can represent different instances of similar components. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document. FIG. 1 illustrat