US-12625096-B2 - Measurement and determination of crystallographic texture with respect to position

US12625096B2US 12625096 B2US12625096 B2US 12625096B2US-12625096-B2

Abstract

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.

Inventors

Michael George Glavicic

Assignees

ROLLS-ROYCE CORPORATION

Dates

Publication Date: 20260512
Application Date: 20240307

Claims (20)

1 . A method comprising: measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material; receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ 1 ), a second Euler angle Φ, and a third Euler angle (φ 2 ), wherein the third Euler angle (φ 2 ) is missing or erroneous; adjusting, by the processing circuitry, the third Euler angle (φ 2 ) of a pixel of the plurality of pixels; and storing, by the processing circuitry and based on adjusting the third Euler angle (φ 2 ) of the pixel reducing a total beta phase misorientation, the alpha phase data set.
2 . The method of claim 1 , wherein the material comprises a titanium alloy.
3 . The method of claim 1 , wherein the pixel is a first pixel, the method further comprising: determining, by the processing circuitry, an alpha grain of each pixel of the plurality of pixels based on a position of each pixel and the first and second Euler angles (φ 1 , Φ) of each pixel; determining, by the processing circuitry, which alpha grains of the plurality of pixels may be from the same prior beta grain, and adjusting, by the processing circuitry, the third Euler angle (φ 2 ) of a second pixel of the plurality of pixels, wherein adjusting the third Euler angle (φ 2 ) of the first pixel and the second pixel is based on: the first and second pixels are from different alpha grains, the first and second pixels being from the same prior beta grain, and the first and second pixels being adjacent to each other.
4 . The method of claim 3 , wherein determining which alpha grains of the plurality of pixels may be from the same prior beta grain comprises: randomly selecting a pixel of the plurality of pixels as the first pixel, wherein the first pixel is from a first alpha grain; selecting the second pixel based on the second pixel being from a second alpha grain different from the first alpha grain and the second pixel being adjacent to the first pixel; and determining that a c-axis misorientation between the first and second pixels is one of about 0°, about 60°, or about 90°.
5 . The method of claim 4 , further comprising: assigning, by the processing circuitry, a random angle value to the third Euler angle (φ 2 ) of the first pixel; assigning, by the processing circuitry, a different angle value to the third Euler angle (φ 2 ) of the second pixel such that the c-axis misorientation between the first and second pixels is one of about 0°, about 60°, or about 90°; assigning, by the processing circuitry, the random angle value to the third Euler angle (φ 2 ) of each pixel of the plurality of pixels that is from the first alpha grain; and assigning, by the processing circuitry, the different angle value to the third Euler angle (φ 2 ) of each pixel of the plurality of pixels that is from the second alpha.
6 . The method of claim 5 , further comprising: determining, by the processing circuitry, a first Burgers inverse transform (IT) solution to transform the first pixel to a first beta phase pixel of a beta phase data set and a second Burgers inverse transform (IT) solution to transform the second pixel to a second beta phase pixel of the beta phase data set, wherein determining the first and second Burgers IT solutions is based on reducing the total beta phase misorientation of the beta phase data set after transforming the first and second pixels by the first and second Burgers IT solutions.
7 . The method of claim 6 , wherein the first and second Burgers IT solutions are selected from a subset of less than all six of a set of six unique Burgers IT solutions that transform an alpha phase crystal to a beta phase crystal.
8 . The method of claim 7 , further comprising: determining, by the processing circuitry, a Burgers IT solution from the subset of less than all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution; and subsequently determining, by the processing circuitry, a Burgers IT solution from the subset including all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution.
9 . The method of claim 8 , further comprising: changing, by the processing circuitry, the value of the third Euler angle (φ 2 ) of the first pixel by at least one of 30°, 10.53°, or 5.16°; and determining, by the processing circuitry, a Burgers IT solution from the subset including all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution.
10 . The method of claim 9 , wherein a blade of a gas turbine engine comprises the material, the method further comprising: determining, by the processing circuitry and subsequent to changing the value of the third Euler angle (φ 2 ) of the first pixel, at least one microtexture region (MTR) based on the alpha phase data set; outputting, by the processing circuitry, an alert based on determining the at least one MTR; determining, by the processing circuitry, a status of the blade based on at least one of the alpha phase data set or the at least one MTR; and outputting, by the processing circuitry, the status of the blade.
11 . A device comprising: a measurement device configured to measure a crystalline structure of a material and output an alpha phase data set indicative of the measurement of the crystalline structure; a memory; and one or more processors implemented in circuitry and in communication with the memory, the one or more processors configured to: receive the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ 1 ), a second Euler angle Φ, and a third Euler angle (φ 2 ), wherein the third Euler angle (φ 2 ) is missing or erroneous; adjust the third Euler angle (φ 2 ) of a pixel of the plurality of pixels; and store, based on adjusting the third Euler angle (φ 2 ) of the pixel reducing a total beta phase misorientation, the alpha phase data set.
12 . The device of claim 11 , wherein the material comprises a titanium alloy.
13 . The device of claim 11 , wherein the pixel is a first pixel, wherein the one or more processors are further configured to: determine an alpha grain of each pixel of the plurality of pixels based on a position of each pixel and the first and second Euler angles (φ 1 , Φ) of each pixel; determine which alpha grains of the plurality of pixels may be from the same prior beta grain, and adjust the third Euler angle (φ 2 ) of a second pixel of the plurality of pixels, wherein adjusting the third Euler angle (φ 2 ) of the first pixel and the second pixel is based on: the first and second pixels are from different alpha grains, the first and second pixels being from the same prior beta grain, and the first and second pixels being adjacent to each other.
14 . The device of claim 13 , wherein, to determine which alpha grains of the plurality of pixels may be from the same prior beta grain, the one or more processors are configured to: randomly select a pixel of the plurality of pixels as the first pixel, wherein the first pixel is from a first alpha grain; select the second pixel based on the second pixel being from a second alpha grain different from the first alpha grain and the second pixel being adjacent to the first pixel; and determine that a c-axis misorientation between the first and second pixels is one of about 0°, about 60°, or about 90°.
15 . The device of claim 14 , wherein the one or more processors are further configured to: assign a random angle value to the third Euler angle (φ 2 ) of the first pixel; assign a different angle value to the third Euler angle (φ 2 ) of the second pixel such that the c-axis misorientation between the first and second pixels is one of about 0°, about 60°, or about 90°; assign the random angle value to the third Euler angle (φ 2 ) of each pixel of the plurality of pixels that is from the first alpha grain; and assign the different angle value to the third Euler angle (φ 2 ) of each pixel of the plurality of pixels that is from the second alpha.
16 . The device of claim 15 , wherein the one or more processors are further configured to: determine a first Burgers inverse transform (IT) solution to transform the first pixel to a first beta phase pixel of a beta phase data set and a second Burgers inverse transform (IT) solution to transform the second pixel to a second beta phase pixel of the beta phase data set, wherein determining the first and second Burgers IT solutions is based on reducing the total beta phase misorientation of the beta phase data set after transforming the first and second pixels by the first and second Burgers IT solutions.
17 . The device of claim 16 , wherein the first and second Burgers IT solutions are selected from a subset of less than all six of a set of six unique Burgers IT solutions that transform an alpha phase crystal to a beta phase crystal.
18 . The device of claim 17 , wherein the one or more processors are further configured to: determine a Burgers IT solution from the subset of less than all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution; and subsequently determine a Burgers IT solution from the subset including all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution.
19 . The device of claim 18 , wherein a blade of a gas turbine engine comprises the material, wherein the one or more processors are further configured to: change the value of the third Euler angle (φ 2 ) of the first pixel by at least one of 30°, 10.53°, or 5.16°; determine a Burgers IT solution from the subset including all six unique Burgers IT solutions for each pixel of the plurality of pixels based on reducing the total beta phase misorientation of the beta phase data set after transforming each pixel by the respective Burgers IT solution; determine, subsequent to changing the value of the third Euler angle (φ 2 ) of the first pixel, at least one microtexture region (MTR) based on the alpha phase data set; output and alert based on determining the at least one MTR; determine a status of the blade based on at least one of the alpha phase data set or the at least one MTR; and output the status of the blade.
20 . A non-transitory computer-readable storage medium having stored thereon instructions that, when executed, configure a processor to: receive an alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ 1 ), a second Euler angle Φ, and a third Euler angle (φ 2 ), wherein the third Euler angle (φ 2 ) is missing or erroneous; adjust the third Euler angle (φ 2 ) of a pixel of the plurality of pixels; and store, based on adjusting the third Euler angle (φ 2 ) of the pixel reducing a total beta phase misorientation, the alpha phase data set.

Description

GOVERNMENT RIGHTS This invention was made with Government support under contract number FA8650-17-2-5266; SUB: FA8650-20-2-5224. The Government has certain rights in this invention. TECHNICAL FIELD This disclosure relates to determining the local crystallographic texture of a polycrystalline material. BACKGROUND Components of high-temperature mechanical systems, such as gas-turbine engines, operate in severe environments. Some components may be formed of a metal or metal alloy, such as, for example, titanium or a titanium alloy. Other components may be formed of a ceramic or a composite material. Mechanical properties of a material may depend at least in part on the microstructure of the material, including a presence or absence of defects, such as holes, voids or sections with a different chemical composition or phase constitution, within the material. For this reason, knowledge of the presence or absence of defects in the material may be desired before utilizing the material in a component, such as a gas turbine engine component. SUMMARY In general, this disclosure describes techniques for determining a crystalline structure of a material based on measurements including missing and/or erroneous data. More particularly, this disclosure describes techniques and devices for determining third Euler angles with improved accuracy based on measurement data sets including first and second Euler angles and missing and/or erroneous third Euler angles. In one example, this disclosure describes a method including: measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material; receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ1), a second Euler angle (Φ), and a third Euler angle (φ2), wherein the third Euler angle (φ2), is missing or erroneous; adjusting, by the processing circuitry, the third Euler angle (φ2), of a pixel of the plurality of pixels; and storing, by the processing circuitry and based on adjusting the third Euler angle (φ2), of the pixel reducing a total beta phase misorientation, the alpha phase data set. In another example, this disclosure describes a device including: a measurement device configured to measure a crystalline structure of a material and output an alpha phase data set indicative of the measurement of the crystalline structure; a memory; and one or more processors implemented in circuitry and in communication with the memory, the one or more processors configured to: receive the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ1), a second Euler angle (Φ), and a third Euler angle (φ2), wherein the third Euler angle (φ2), is missing or erroneous; adjust the third Euler angle (φ2), of a pixel of the plurality of pixels; and store, and based on adjusting the third Euler angle (φ2) of the pixel reducing a total beta phase misorientation, the alpha phase data set. In another example, this disclosure describes a non-transitory computer-readable storage medium having stored thereon instructions that, when executed, configure a processor to: receive an alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ1), a second Euler angle (Φ), and a third Euler angle (φ2), wherein the third Euler angle (φ2) is missing or erroneous; adjust the third Euler angle (φ2) of a pixel of the plurality of pixels; and store, based on adjusting the third Euler angle (φ2) of the pixel reducing a total beta phase misorientation, the alpha phase data set. The details of one or more examples are set forth in the accompanying drawings and the description below. Other features, objects, and advantages will be apparent from the description and drawings, and from the claims. BRIEF DESCRIPTION OF DRAWINGS The patent or application file contains at least one drawing executed in color. Copies of this patent or patent application publication with color drawing(s) will be provided by the Office upon request and payment of the necessary fee. As the color drawings are being filed electronically, only one set of the drawings is submitted. FIG. 1 is a block diagram illustrating an example of a system that may be used to determine microtexture regions (MTRs) and MTR size statistics within a sample. FIG. 2 is a functional block diagram illustrating another example of a system which may be used to determine MTRs and MTR size statistics within sample. FIG. 3 is a schematic representation of an example transformation between a beta phase grain and a plurality of al