US-12625761-B2 - Fault repair method and apparatus, electronic device and storage medium

US12625761B2US 12625761 B2US12625761 B2US 12625761B2US-12625761-B2

Abstract

Embodiments of the present application relate to the field of communications, and discloses a fault repair method and apparatus, an electronic device and a storage medium. The method includes: acquiring a fault feature of a fault; determining whether a fault cause corresponding to the fault feature exists; when a corresponding fault cause does exist, determining whether a repair rule corresponding to the fault cause exists; when a corresponding repair rule does exist, repairing the fault according to the repair rule; and when no corresponding repair rule exists, reporting the fault cause, and after acquiring a repair instruction, repairing the fault according to the repair instruction, and updating a repair rule library.

Inventors

Senyang DENG
Lei Shan
Dongfang Ning
Zuofeng ZHANG

Assignees

ZTE CORPORATION

Dates

Publication Date: 20260512
Application Date: 20220914
Priority Date: 20211009

Claims (11)

1 . A fault repair method, comprising: acquiring a fault feature of a fault; determining whether a fault cause corresponding to the fault feature exists, comprising: acquiring a device function module in which the fault is located; and acquiring, according to a diagnostic rule corresponding to the device function module in a preset diagnostic rule library, the fault cause corresponding to the fault feature, the diagnostic rule being a correspondence between the fault feature and the fault cause; determining, upon a condition that a corresponding fault cause does exist, whether a repair rule corresponding to the fault cause exists; repairing, upon a condition that the corresponding repair rule does exist, the fault according to the repair rule; upon a condition that no corresponding repair rule exists: reporting the fault cause; after acquiring a repair instruction, repairing the fault according to the repair instruction; and updating a repair rule library.
2 . The fault repair method of claim 1 , further comprising: obtaining, upon a condition that no corresponding fault cause exists, the fault cause by self-learning and reasoning according to an existing correspondence between a fault feature and the fault cause.
3 . The fault repair method of claim 2 , wherein the self-learning is implemented by a decision tree algorithm.
4 . The fault repair method of claim 2 , wherein the self-learning is implemented by a support vector machine algorithm.
5 . The fault repair method of claim 1 , wherein updating the repair rule library comprises: performing, according to the repair instruction, self-learning to generate a new repair rule; detecting, according to the fault, the fault cause and the new repair rule, correctness of the new repair rule; updating, upon a condition that the new repair rule is correct, the repair rule library with the new repair rule; and adjusting, upon a condition that the new repair rule is incorrect, a self-learning algorithm parameter, regenerating a new repair rule, and detecting correctness of the regenerated new repair rule.
6 . The fault repair method of claim 1 , wherein the fault feature comprises a function fault feature; wherein the function fault feature is configured to represent a hardware state of each device function module; and the function fault feature is obtained by being reported by each device function module.
7 . The fault repair method of claim 1 , wherein the fault feature comprises a performance fault feature; wherein the performance fault feature is configured to represent a signal processing performance of each device function module; and the performance fault feature is obtained according to a signal processing performance parameter of each device function module.
8 . The fault repair method of claim 1 , wherein the fault feature comprises: a function fault feature and a performance fault feature; wherein the function fault feature is configured to represent a hardware state of each device function module; the performance fault feature is configured to represent a signal processing performance of each device function module; the function fault feature is obtained by being reported by each device function module; and the performance fault feature is obtained according to a signal processing performance parameter of each device function module.
9 . The fault repair method of claim 8 , wherein the performance fault feature is acquired by: acquiring a transceiving signal of the each device function module; identifying a configuration parameter of the transceiving signal; calculating a performance index of the each device function module according to the configuration parameter; and obtaining the performance fault feature according to the performance index.
10 . An electronic device, comprising: at least one processor; and a memory communicatively connected with the at least one processor; the memory storing instructions executable by the at least one processor, and the instructions being executed by the at least one processor to enable the at least one processor to execute a fault repair method of claim 1 .
11 . A non-transitory computer-readable storage medium storing a computer program which, when executed by a processor, implements a fault repair method of claim 1 .

Description

CROSS-REFERENCE TO RELATED APPLICATIONS The present application is based on and claims priority to Chinese Patent Application No. 202111177755.5, filed on Oct. 9, 2021, the entire content of which is hereby incorporated by reference into the present application. TECHNICAL FIELD The present application relates to the field of communications, and particularly to a fault repair method and apparatus, an electronic device and a storage medium. BACKGROUND With the explosive development of information technology, the base station device is evolved from 2G to 5G with higher and higher complexity, the base station device is composed of a large number of working modules, the associative coupling between different modules is tight, the fault of one module often causes a chain reaction, and thus the whole system cannot function properly. Base station devices are often built in high-altitude buildings such as iron towers, and the working environment is harsh, such as extremely hot and cold climate, remote mountainous areas, high altitude areas and other harsh environments. Since base station device troubleshooting generally requires professional instruments and meters, the difficulty and cost of troubleshooting and repairing the base station devices rise sharply. Therefore, how to break away from the limitation of external instruments and meters, and quickly detect, locate and repair the faults of the base station devices is an urgent problem to be solved. SUMMARY An embodiment of the present application provides a fault repair method, including: acquiring a fault feature of a fault; determining whether a fault cause corresponding to the fault feature exists; when a corresponding fault cause does exist, determining whether a repair rule corresponding to the fault cause exists; when a corresponding repair rule does exist, repairing the fault according to the repair rule; and when no corresponding repair rule exists, reporting the fault cause, and after acquiring a repair instruction, repairing the fault according to the repair instruction, and updating a repair rule library. An embodiment of the present application further provides a fault repair apparatus, including: a feature module, configured to acquire a fault feature of a fault; a diagnostic module, configured to acquire a fault cause of the fault according to the fault feature; a repair module, configured to search whether a repair rule corresponding to the fault cause exists in a repair rule library; repair the fault according to the repair rule if the repair rule exists; report the fault cause if the repair rule does not exist, after acquiring a repair instruction, repair the fault according to the repair instruction, and update the repair rule library. An embodiment of the present application further provides an electronic device, including: at least one processor; and a memory communicatively connected with the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to execute the above-described fault repair method. An embodiment of the present application further provides a non-transitory computer-readable storage medium, storing a computer program which, when executed by a processor, implements the above-described fault repair method. BRIEF DESCRIPTION OF FIGURES FIG. 1 is a schematic diagram of an internal structure of a base station device according to an embodiment of the present application; FIG. 2 is an internal block diagram of an intelligent fault diagnostic system according to an embodiment of the present application; FIG. 3 is a flowchart of a fault repair method according to an embodiment of the present disclosure; FIG. 4 is a flowchart of an ACPR blind identification method according to an embodiment of the present disclosure; FIG. 5 is a structural schematic diagram of a rule library according to an embodiment of the present disclosure; FIG. 6 is an interactive flowchart of a fault repair method according to an embodiment of the present disclosure; FIG. 7 is a structural schematic diagram of a fault repair apparatus according to an embodiment of the present disclosure; and FIG. 8 is a structural schematic diagram of an electronic device according to an embodiment of the present disclosure. DETAILED DESCRIPTION In order to make the object, technical solutions and advantages of the embodiments of the present application more clear, the embodiments of the present application will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can appreciate that in the various embodiments of the present application, numerous technical details are set forth in order to provide the reader with a better understanding of the present application. However, the claimed technical solution can be implemented without these technical details and with various va