US-20260126501-A1 - ELECTRICAL MEASUREMENT METHODS, SYSTEMS, AND KITS

US20260126501A1US 20260126501 A1US20260126501 A1US 20260126501A1US-20260126501-A1

Abstract

Electrical testing methods, systems, and kits are capable of powering, via a first power supply, an electrical system, performing, via a first electrical device, selective detection of at least two parameters of the electrical system, and detecting, via sensor(s) of a second electrical device, presence and/or flow of a parameter from a second power supply to the electrical system to derive parasitic draw of the electrical system. Memory settings of the electrical system are preserved via the second electrical device while the parasitic draw is derived. User input(s) selecting an electrical element of the electrical system are received via a third electrical device that stores impedance data of electrical elements. The third electrical device determines voltage drop across an electrical path passing through the electrical element, which the third electrical device uses to determine, in combination with the impedance identified by the impedance data, amperage of the electrical element.

Inventors

David Douglas Barden

Assignees

POWER PROBE GROUP, INC.

Dates

Publication Date: 20260507
Application Date: 20241104

Claims (20)

1 . An electrical testing method, comprising: powering, via a first power supply, an electrical system, and based thereon performing, via a first electrical device, selective detection of at least two parameters of the electrical system, the powering being selectively provided during detection of the at least two parameters, the first electrical device including: a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto; a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system; determining, via one or more sensors of a second electrical device and based on the second electrical device being coupled to the electrical system, presence of at least one parameter and/or flow of the at least one parameter from a second power supply to the electrical system, the second electrical device including an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the determination of the at least one parameter; preserving, via the second electrical device, memory settings of the electrical system; deriving, via the analyzer of the second electrical device, the parasitic draw of the electrical system from the at least one parameter flowing from the second power supply to the electrical system; receiving, by a third electrical device, one or more user inputs selecting an electrical element from a list of electrical elements, each electrical element of the list of electrical elements having an impedance associated therewith; accessing, from a data storage location associated with the third electrical device, impedance data of the electrical element's impedance; determining, via the third electrical device, voltage drop across an in-circuit electrical path passing through the electrical element; determining, via the third electrical device and from the voltage drop and the impedance, amperage of the electrical element.
2 . The method of claim 1 , wherein the at least two parameters include at least one of circuit continuity, resistance, voltage, current, load impedance, and frequency.
3 . The method of claim 1 , wherein the electrical system is disconnected from a power source of the electrical system when the second power supply of the second electrical device provides power.
4 . The method of claim 3 , wherein the power source is a vehicle battery of a vehicle and the electrical system is associated with the vehicle.
5 . The method of claim 1 , further comprising transmitting, via a wireless network and by a wireless communication means, one or more outputs of at least one of the first electrical device, the second electrical device and the third electrical device.
6 . The method of claim 1 , wherein the at least one parameter flowing from the second power supply to the electrical system is current.
7 . The method of claim 6 , displaying, via an interface of the second electrical device, a graphical representation of changes in the current and a measured voltage being transmitted from the second power supply to the electrical system, the graphical representation of the changes being depicted over a period of time in which the current and the measured voltage are being measured.
8 . The method of claim 1 , wherein the second electrical device includes an interface that comprises a sixteen-pin connection, where the interface is coupled to the electrical system via a diagnostic port.
9 . The method of claim 1 , wherein the electrical element includes a vehicle fuse.
10 . An electrical testing method, comprising: using a first electrical device to detect at least two parameters of an electrical system, the first electrical device including: a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto; a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system; using a second electrical device to (i) preserve memory settings of the electrical system, and (ii) derive any parasitic draw within the electrical system; using a third electrical device to derive amperage of an electrical element of the electrical system, the deriving determining voltage drop across an in-circuit electrical path passing through the electrical element and accessing impedance data of the electrical element to calculate from the voltage drop and the impedance data amperage of the electrical element.
11 . An electrical testing system, comprising: a first electrical device to detect at least two parameters of an electrical system, the first electrical device comprising: a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto; a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system; a second electrical device for (i) preserving memory settings of the electrical system, and (ii) deriving any parasitic draw within the electrical system, the second electrical device comprising: a first power supply for providing power to the electrical system, which enables the second electrical device to maintain memory of electrical system settings of the electrical system during disconnect of a power source of the electrical system; one or more sensors for detecting presence of at least one parameter and/or flow of the at least one parameter from a power supply of the second electrical device to the electrical system; an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the detection of the at least one parameter; a third electrical device for determining amperage of an electrical element of the electrical system, the third electrical device comprising: a first conductive probe element; a second conductive probe element; a processor in electrical communication with the first conductive probe element and the second conductive probe element; and a data storage location storing impedance data for a list of electrical elements, the list of electrical elements including the electrical element of the electrical system.
12 . The electrical testing system of claim 11 , wherein the electrical element includes a vehicle fuse.
13 . The electrical testing system of claim 11 , wherein the at least two parameters include at least one of circuit continuity, resistance, voltage, current, load impedance, and frequency.
14 . The electrical testing system of claim 11 , wherein the power source is a vehicle battery of a vehicle and the electrical system is associated with the vehicle.
15 . The electrical testing system of claim 11 , wherein the at least one parameter includes at least one of a current and a measured voltage.
16 . The electrical testing system of claim 11 , wherein the third electrical device further includes a first input for selecting a mode associated with the electrical element, a second input for turning on or off a light emitting diode (LED) of the third electrical device, and a third input for adjusting the brightness of the backlight of a display screen of the third electrical device.
17 . The electrical testing system of claim 11 , wherein the third electrical device further includes at least two visual indicators for indicating a status of the electrical element.
18 . An electrical testing kit, comprising: a first electrical device to detect at least two parameters of an electrical system, the first electrical device comprising: a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto; a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system; a second electrical device for (i) preserving memory settings of the electrical system, and (ii) deriving any parasitic draw within the electrical system, the second electrical device comprising: a power supply for providing power to the electrical system, which enables the second electrical device to maintain memory of electrical system settings of the electrical system during disconnect of a power source of the electrical system; one or more sensors for detecting presence of at least one parameter and/or flow of the at least one parameter from the power supply of the second electrical device to the electrical system; an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the detection of the one or more parameters; a third electrical device for determining amperage of an electrical element of the electrical system, the third electrical device comprising: a first conductive probe element; a second conductive probe element; a processor in electrical communication with the first conductive probe element and the second conductive probe element; and a data storage location storing impedance data for a list of electrical elements, the list of electrical elements including the electrical element of the electrical system.
19 . The electrical testing kit of claim 18 , wherein the electrical element includes a vehicle fuse.
20 . The electrical testing kit of claim 18 , wherein the at least two parameters include at least one of circuit continuity, resistance, voltage, current, load impedance, and frequency.

Description

FIELD OF THE INVENTION This invention relates generally to electrical testing, and more particularly, embodiments of the invention relate to an electrical testing methods, systems, and kits. BACKGROUND OF THE INVENTION Motor vehicles such as automobiles and trucks are becoming increasingly technologically sophisticated requiring a correspondingly more sophisticated set of test equipment for maintenance and diagnostic testing. Much of the increased complexity of motor vehicles is due in part to the increased complexity of electrical circuitry and systems incorporated therein. Troubleshooting and diagnosing problems with such electrical systems requires the use of a wide array of complex test equipment. Vehicle technicians use devices and approaches that may have limited applicability to certain vehicle diagnostics and monitoring. In particular, these devices and approaches may not provide the most relevant information or such devices and approaches may be inefficient. Thus, a need exists for improved methods, systems, and kits for resolving these deficiencies and inefficiencies. BRIEF SUMMARY Shortcomings of the prior art are overcome, and additional advantages are provided, through the provision of an electrical testing method that includes powering, via a first power supply, an electrical system, and based thereon performing, via a first electrical device, selective detection of at least two parameters of the electrical system, the powering being selectively provided during detection of the at least two parameters. The first electrical device includes a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto. The first electrical device also includes a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system. The method also includes detecting, via one or more sensors of a second electrical device and based on the second electrical device being coupled to the electrical system, presence of at least one parameter and/or flow of the at least one parameter from a second power supply to the electrical system, the second electrical device including an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the detection of the at least one parameter. In addition, the method includes deriving, via the analyzer of the second electrical device, the parasitic draw of the electrical system from the parameter flowing from the second power supply to the electrical system, and receiving, by a third electrical device, one or more user inputs selecting an electrical element from a list of electrical elements, each electrical element of the list of electrical elements having an impedance associated therewith. The method also includes accessing, from a data storage location associated with the third electrical device, impedance data of the electrical element's impedance, and determining, via the third electrical device, voltage drop across an in-circuit electrical path passing through the electrical element. The method also determines, via the third electrical device and from the voltage drop and the impedance, amperage of the electrical element. An electrical testing method is disclosed that includes using a first electrical device to detect at least two parameters of an electrical system, where the first electrical device includes a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto and a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system. The method also includes using a second electrical device to (i) preserve memory settings of the electrical system, and (ii) derive any parasitic draw within the electrical system. In addition, the method includes using a third electrical device to derive amperage of an electrical element of the electrical system, the deriving determing voltage drop across an in-circuit electrical path passing through the electrical element and accessing impedance data of the electrical element to calculate from the voltage drop and the impedance data amperage of the electrical element. Also disclosed herein is an electrical testing system that includes a first electrical device to detect at least two parameters of an electrical system, the first electrical device comprising a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto, and a processor electrically connected to the conducti