WO-2026091788-A1 - DEFECT DETECTION SENSOR, SYSTEM AND METHOD

WO2026091788A1WO 2026091788 A1WO2026091788 A1WO 2026091788A1WO-2026091788-A1

Abstract

A defect detection sensor, method and system. The defect detection sensor comprises: an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder. The quantum magnetometer is arranged in the magnetic shielding cylinder, and the orthogonal differential detection unit is arranged outside the magnetic shielding cylinder. The orthogonal differential detection unit is used for: collecting a first magnetic field variation signal on the surface of a preset area of a preset component, and transmitting the first magnetic field variation signal to the quantum magnetometer, so as to apply the first magnetic field variation signal to alkali metal atoms of the quantum magnetometer. The quantum magnetometer is used for: when the first magnetic field variation signal is applied to the alkali metal atoms of the quantum magnetometer, generating a second magnetic field variation signal, so as to determine, on the basis of the second magnetic field variation signal, whether a defect is present in the preset area of the preset component.

Inventors

CHEN, Pengchao
DUAN, Jinyao
LI, RUI
FU, Kuan
ZHENG, JIANFENG
WANG, YANAN
GUO, Zhenghong

Assignees

国家石油天然气管网集团有限公司
国家石油天然气管网集团有限公司科学技术研究总院分公司

Dates

Publication Date: 20260507
Application Date: 20250818
Priority Date: 20241101

Claims (20)

A defect detection sensor includes an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder. The quantum magnetometer is disposed inside the magnetic shielding cylinder, and the orthogonal differential detection unit is disposed outside the magnetic shielding cylinder. The orthogonal differential detection unit is used to: collect a first magnetic field change signal on the surface of a preset area of a preset component, and transmit it to the quantum magnetometer, so as to apply the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer; The quantum magnetometer is used to: generate a second magnetic field change signal when the first magnetic field change signal is applied to the alkali metal atoms of the quantum magnetometer, so as to determine whether there is a defect in the preset area of the preset component based on the second magnetic field change signal.
According to claim 1, the defect detection sensor, wherein the quantum magnetometer comprises a laser excitation source and an electromagnetic signal acquisition source, The laser excitation source is used to irradiate the alkali metal atoms with a laser, causing the outer electrons of the alkali metal atoms to become spin polarized, so that when the first magnetic field change signal is applied to the spin polarized alkali metal atoms, the alkali metal atoms will undergo Larmor precession. The electromagnetic signal acquisition source is used to acquire the second magnetic field change signal generated when the alkali metal atoms undergo Larmor precession.
The defect detection sensor according to claim 2 further includes a central controller, which is used to receive a second magnetic field change signal emitted by the quantum magnetometer, analyze the second magnetic field change signal, and determine whether there is a defect in a preset area of the preset component based on the electrical signal amplitude of the second magnetic field change signal.
According to claim 3, the defect detection sensor, wherein the central controller is further configured to: analyze the second magnetic field change signal to determine the defect location when a defect exists in a preset area of the preset component.
According to claim 1, the defect detection sensor, wherein the orthogonal differential detection unit includes three sets of mutually orthogonal detection coils, wherein each coil in each of the three sets of detection coils is placed in parallel and connected in reverse series, and each set of detection coils collects magnetic field change signals in different directions, so that the first magnetic field change signal includes magnetic field change signals in different directions.
According to any one of claims 1-5, in the defect detection sensor, when multiple orthogonal differential detection units are included, the first magnetic field change signal on the surface of different preset regions of the preset component collected by each of the multiple orthogonal differential detection units is transmitted to the quantum magnetometer through a time-division multiplexing module.
The defect detection sensor according to any one of claims 1 to 6 further includes a protective housing, wherein the orthogonal differential detection unit is located within the protective housing.
The defect detection sensor according to any one of claims 1 to 7 further includes a substrate, wherein the substrate is fitted to the preset component by means of conformal bonding.
According to claim 8, the defect detection sensor, wherein the substrate is made of ceramic material.
According to claim 1, the defect detection sensor, wherein the preset component is an oil and gas pipeline.
The defect detection sensor according to claim 10 further includes a substrate, wherein the substrate is arc-shaped to fit the oil and gas pipeline.
According to claim 1, the defect detection sensor wherein the magnetic shielding cylinder is a relative zero magnetic shielding cylinder.
A defect detection method is implemented using a defect detection sensor, wherein the defect detection sensor includes: an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder, the quantum magnetometer being disposed inside the magnetic shielding cylinder, and the orthogonal differential detection unit being disposed outside the magnetic shielding cylinder; the method includes: The orthogonal differential detection unit acquires a first magnetic field change signal on the surface of a preset region of a preset component and transmits it to the quantum magnetometer to apply the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer. When the first magnetic field change signal is applied to the alkali metal atoms of the quantum magnetometer, a second magnetic field change signal is generated, and the presence of a defect in a preset area of the preset component is determined based on the amplitude of the electrical signal of the second magnetic field change signal.
According to the defect detection method of claim 13, the quantum magnetometer includes a laser excitation source and an electromagnetic signal acquisition source, and the method includes: The alkali metal atoms are irradiated with laser by the laser excitation source, causing the outer electrons of the alkali metal atoms to become spin polarized, so that when the first magnetic field change signal is applied to the spin polarized alkali metal atoms, the alkali metal atoms will undergo Larmor precession. The electromagnetic signal acquisition source acquires the signal of the second magnetic field change generated when the alkali metal atoms undergo Larmor precession.
According to the defect detection method of claim 14, wherein the defect detection sensor further includes a central controller, and the method further includes: The central controller receives the second magnetic field change signal emitted by the quantum magnetometer, analyzes the second magnetic field change signal, and determines whether there is a defect in the preset area of the preset component.
According to the defect detection method of claim 15, the central controller is further configured to: analyze the second magnetic field change signal to determine the defect location when a defect exists in a preset area of the preset component.
According to the defect detection method of claim 13, the orthogonal differential detection unit includes three sets of mutually orthogonal detection coils, wherein each coil in each of the three sets of detection coils is placed in parallel and connected in reverse series, and the method further includes: Each set of detection coils collects magnetic field change signals in different directions, so that the first magnetic field change signal includes magnetic field change signals in different directions.
The defect detection method according to any one of claims 13 to 17, wherein when the defect detection sensor comprises a plurality of orthogonal differential detection units, the method comprises: The first magnetic field change signal on the surface of different preset regions of the preset component, collected by each of the multiple orthogonal differential detection units, is transmitted to the quantum magnetometer through the time-division multiplexing module.
A defect detection system includes a defect detection sensor and a communication module. The defect detection sensor includes an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder. The quantum magnetometer is disposed inside the magnetic shielding cylinder, and the orthogonal differential detection unit is disposed outside the magnetic shielding cylinder. The orthogonal differential detection unit is used to: collect a first magnetic field change signal on the surface of a preset area of a preset component, and transmit it to the quantum magnetometer, so as to apply the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer; The quantum magnetometer is used to: generate a second magnetic field change signal when the first magnetic field change signal is applied to the alkali metal atoms of the quantum magnetometer, so as to determine whether there is a defect in a preset area of the preset component based on the second magnetic field change signal; and The communication module is used to send the second magnetic field change signal.
The defect detection system according to claim 19 further includes a personal computer, wherein the personal computer is used to receive a second magnetic field change signal sent by the communication module.

Description

Defect detection sensors, systems and methods This application claims priority to Chinese patent application No. 202411548814.9, filed on November 1, 2024, the entire contents of which are incorporated herein by reference. Technical Field This disclosure relates to the field of detection technology, and in particular to a defect detection sensor and defect detection method based on quantum technology. Background Technology Oil and gas pipelines are crucial infrastructure for national energy transportation, and their safe operation is vital for ensuring energy supply and maintaining national economic stability. However, during long-term operation, oil and gas pipelines may develop various defects, such as corrosion, wear, and cracks, due to factors including geological conditions, environmental factors, and human operations. These defects can lead to pipeline leaks and even serious accidents like explosions. Therefore, regular inspections of oil and gas pipelines are essential. Summary of the Invention In a first aspect, this disclosure provides a defect detection sensor. The defect detection sensor includes: an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder. The quantum magnetometer is disposed inside the magnetic shielding cylinder, and the orthogonal differential detection unit is disposed outside the magnetic shielding cylinder. The orthogonal differential detection unit is used to: acquire a first magnetic field change signal on the surface of a preset area of a preset component, and transmit it to the quantum magnetometer, so as to apply the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer. The quantum magnetometer is used to: generate a second magnetic field change signal when the first magnetic field change signal is applied to the alkali metal atoms of the quantum magnetometer, so as to determine whether a defect exists in the preset area of the preset component based on the second magnetic field change signal. Secondly, this disclosure also provides a defect detection method. The defect detection method includes: acquiring a first magnetic field change signal on the surface of a preset region of a preset component using an orthogonal differential detection unit, and transmitting it to a quantum magnetometer to apply the first magnetic field change signal to alkali metal atoms of the quantum magnetometer; and generating a second magnetic field change signal by applying the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer, thereby determining whether a defect exists in the preset region of the preset component based on the second magnetic field change signal. Thirdly, this disclosure also provides a defect detection system, which includes a defect detection sensor and a communication module. The defect detection sensor includes an orthogonal differential detection unit, a quantum magnetometer, and a magnetic shielding cylinder. The quantum magnetometer is disposed inside the magnetic shielding cylinder, and the orthogonal differential detection unit is disposed outside the magnetic shielding cylinder. The orthogonal differential detection unit is used to: acquire a first magnetic field change signal on the surface of a preset area of a preset component and transmit it to the quantum magnetometer, so as to apply the first magnetic field change signal to the alkali metal atoms of the quantum magnetometer. The quantum magnetometer is used to: generate a second magnetic field change signal when the first magnetic field change signal is applied to the alkali metal atoms of the quantum magnetometer, so as to determine whether a defect exists in the preset area of the preset component based on the second magnetic field change signal. The communication module is used to transmit the second magnetic field change signal. Attached Figure Description Figure 1 is a schematic diagram of the structure of a defect detection sensor based on quantum technology according to an embodiment of the present disclosure. Figure 2 is a block diagram of a defect detection system based on quantum technology according to an embodiment of the present disclosure. Figure 3 is a schematic diagram of the orthogonal differential detection unit. Figure 4 is a schematic diagram of the packaged orthogonal differential detection unit. Figure 5 is a flowchart of a defect detection method according to an embodiment of the present disclosure. Figure 6 is a flowchart of another defect detection method according to an embodiment of the present disclosure. Detailed Implementation To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be described in further detail below with reference to the accompanying drawings. Quantum electromagnetic technology is an emerging high-tech detection technology. Based on atomic magnetometers that measure quantum