WO-2026092034-A1 - RYDBERG ATOM-BASED LOW-FREQUENCY VOLTAGE MEASUREMENT SIGNAL PROCESSING SYSTEM

WO2026092034A1WO 2026092034 A1WO2026092034 A1WO 2026092034A1WO-2026092034-A1

Abstract

A Rydberg atom-based low-frequency voltage measurement signal processing system, comprising: an ADC data acquisition module used for converting EIT spectrum data into an electrical signal and performing data acquisition; a wavelet transform denoising module used for performing denoising processing on data acquired by the ADC data acquisition module; an automatic peak finding module used for performing automatic peak finding on the denoised data to obtain a peak position difference; and a voltage inversion module used for performing voltage inversion and frequency calculation on the basis of the peak position difference to complete Rydberg atom-based low-frequency voltage measurement. The ADC data acquisition module and the wavelet transform denoising module are implemented by a PL end; and the automatic peak finding module and the voltage inversion module are implemented by a PS end. The system has a simple structure, good stability, and good real-time performance, satisfies the requirements for miniaturization and low power consumption, and lays a foundation for engineering application of the Rydberg atom-based low-frequency voltage measurement system.

Inventors

SONG, Hongtian
FENG, Junhao
CAO, Wangzhang
HU, Shanshan
XIAO, YONG
ZHANG, Wenhan
WANG, Baoshuai
WANG, ZIJUN
LIN, Weibin
JIN, XIN
HUANG, Boyang

Assignees

南方电网科学研究院有限责任公司

Dates

Publication Date: 20260507
Application Date: 20250928
Priority Date: 20241104

Claims (8)

A Rydberg atom low-frequency voltage measurement signal processing system, characterized in that it comprises: The ADC data acquisition module is used to convert the EIT spectrum data from the photodetector into electrical signals and acquire the data. The wavelet transform denoising module is used to denoise the data acquired by the ADC data acquisition module to obtain denoised data. The automatic peak finding module is used to automatically find the peaks in the denoised data and obtain the peak position difference; The voltage inversion module is used to perform voltage inversion and frequency calculation based on the peak position difference, and to complete the low-frequency voltage measurement of the Rydberg atom. The host computer is used to configure the parameters of the wavelet transform denoising module and the voltage inversion module; The ADC data acquisition module and wavelet transform denoising module are implemented by the PL terminal; the automatic peak finding module and voltage inversion module are implemented by the PS terminal.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 1 is characterized in that it further comprises: The DDR3 memory control module is used to control the DDR3 memory and store the voltage inversion results into the specified memory space. The Ethernet communication module is used to send data stored in a specified memory space to the host computer. The phase-locked loop module generates a 100MHz clock for the DDR3 memory control module and a 50MHz clock for other modules. The phase-locked loop module is implemented by the PL terminal; the DDR3 storage control module and the Ethernet communication module are implemented by the PS terminal.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 1 is characterized in that the specific method for denoising the data acquired by the ADC data acquisition module includes the following steps: A1. Perform low-pass filtering and high-pass filtering on the data acquired by the ADC data acquisition module to obtain the first-layer approximation coefficients and the first-layer detail coefficients respectively. A2. The first-level approximation coefficients are decomposed into subbands through iteration; A3. Perform an inverse transformation on each subband to obtain the reconstructed subband; A4. Add all the reconstructed subbands together to obtain the inverse approximation coefficients; A5. Set the noise reduction threshold, and set the first layer detail coefficients that are less than the noise reduction threshold to zero to obtain the noise-reduced detail coefficients. A6. The inverse approximation coefficients and the denoised detail coefficients are merged by inverse wavelet transform to obtain the denoised data, namely the denoised EIT spectrum.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 3 is characterized in that the low-pass filtering and high-pass filtering are implemented by the bior6_8 wavelet function; the number of sub-bands decomposed into the first-level approximation coefficients is 4.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 3 is characterized in that the denoising threshold is configured by a particle swarm optimization algorithm.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 1 is characterized in that the specific method for automatically finding peaks and obtaining peak position differences in the denoised data is as follows: A quadratic polynomial least squares method is used to fit the data points as the width of the fit. The fitted peak amplitude is compared with the amplitude threshold, and the fitted peak amplitudes that are less than the amplitude threshold are removed. The difference between the maximum position value of the peak and the position value corresponding to the maximum amplitude is taken as the peak position difference.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 6 is characterized by the specific method for voltage inversion and frequency calculation based on peak position difference: According to the formula: Obtain the inverted voltage U, which is the low-frequency voltage value of the Rydberg atom; where k′ is the fitting coefficient; ΔStark is the peak position difference; According to the formula: Obtain the frequency f of the low-frequency voltage of the Rydberg atom; where t is the time interval between two consecutive points where the voltage amplitude reaches its maximum value.
The Rydberg atom low-frequency voltage measurement signal processing system according to claim 6 is characterized in that the specific method for configuring the parameters of the wavelet transform denoising module and the voltage inversion module includes the following sub-steps: B1. Conduct a test experiment to observe the peak frequency shift of the EIT spectrum using a standard source with a known electric field, and sample the ADC signal to obtain the field strength test signal; B2. Initially configure the wavelet transform denoising module according to the standard source parameters and field strength test signal; B3. Data is acquired through the ADC data acquisition module, and the data acquired by the ADC data acquisition module is denoised through the wavelet transform denoising module after initial configuration to obtain the denoised data. B4. Within the peak-finding data range set by the host computer, the automatic peak-finding module automatically finds the corresponding peak value from the denoised data. B5. Determine if the number of peaks found by the automatic peak finding module is greater than 1. If yes, proceed to step B6; otherwise, lower the amplitude threshold and return to step B4. B6. Determine whether the number of peaks found by the automatic peak finding module is less than or equal to 3. If yes, proceed to step B7; otherwise, determine that an erroneous peak has been detected, increase the amplitude threshold, and return to step B5. B7. Obtain the difference between the position value corresponding to the maximum value of the peak and the position value corresponding to the maximum value of the amplitude to get the peak position difference; B7. Perform voltage inversion and frequency calculation based on the peak position difference to obtain the measured standard source voltage parameters; B8. Compare the measured standard source voltage parameters with the actual standard source voltage parameters, and adjust the voltage inversion module parameters until the error between the measured standard source voltage parameters and the actual standard source voltage parameters is within the set range.

Description

A Rydberg atom low-frequency voltage measurement signal processing system This application claims priority to Chinese Patent Application No. 202411560445.5, filed on November 4, 2024, entitled "A Rydberg Atom Low-Frequency Voltage Measurement Signal Processing System", the entire contents of which are incorporated herein by reference. Technical Field This invention relates to the field of electromagnetically induced transparency (EIT) spectral line analysis and processing, specifically to a Rydberg atom low-frequency voltage measurement signal processing system. Background Technology Voltage, as a crucial electrical parameter in power systems, reflects the status of transmission lines and the operational status of electrical equipment. Research and development of non-contact, precise voltage measurement are of great significance for monitoring operational status and diagnosing faults in power systems. Rydberg atoms, with their large principal quantum numbers, have attracted considerable attention as a novel quantum sensing medium. Due to their non-metallic, non-invasive, non-contact, high-precision, and high-sensitivity measurement characteristics, quantum measurement techniques based on the Rydberg atom EIT-Stark effect have broad application prospects in power system voltage measurement. The detection and processing of EIT spectral lines is one of the important methods for analyzing the EIT-Stark effect. Meanwhile, many voltage parameters in power systems and related fields are low-frequency voltages. Low-frequency voltage signals are also important indicators of the operating status and faults of power systems. In recent years, many research teams have gradually solved the problems of signal loading and measurement implementation for low-frequency voltage signals. However, in the Rydberg atomic quantum measurement platform in the laboratory, a data acquisition card is usually used in conjunction with a host computer with LabVIEW software to process the measurement signal. The entire signal processing system is redundant and difficult to transfer, making it difficult to adapt to engineering application scenarios outside the laboratory. This is also a point that is usually overlooked in theoretical research and in the study of measurement accuracy, sensitivity, and influencing factors. To realize the engineering application of low-frequency voltage measurement of the Rydberg atom and make the measurement platform adaptable to more application scenarios, higher requirements must be placed on the miniaturization and embedding of the measurement signal processing system, while ensuring the efficiency and real-time performance of signal processing and computation. Summary of the Invention To address the aforementioned shortcomings in the existing technology, the present invention provides a Rydberg atom low-frequency voltage measurement signal processing system that solves the problem that the existing Rydberg atom low-frequency voltage measurement signal processing system has redundant performance and is difficult to migrate, making it difficult to adapt to engineering application scenarios outside the laboratory. To achieve the above-mentioned objectives, the technical solution adopted by this invention is as follows: A low-frequency voltage measurement signal processing system for the Rydberg atom is provided, comprising: The ADC data acquisition module is used to convert the EIT spectrum data from the photodetector into electrical signals and acquire the data. The wavelet transform denoising module is used to denoise the data acquired by the ADC data acquisition module to obtain denoised data. The automatic peak finding module is used to automatically find the peaks in the denoised data and obtain the peak position difference; The voltage inversion module is used to perform voltage inversion and frequency calculation based on the peak position difference, and to complete the low-frequency voltage measurement of the Rydberg atom. The host computer is used to configure the parameters of the wavelet transform denoising module and the voltage inversion module; The ADC data acquisition module and wavelet transform denoising module are implemented by the PL terminal; the automatic peak finding module and voltage inversion module are implemented by the PS terminal. Furthermore, it also includes: The DDR3 memory control module is used to control the DDR3 memory and store the voltage inversion results into the specified memory space. The Ethernet communication module is used to send data stored in a specified memory space to the host computer. The phase-locked loop module generates a 100MHz clock for the DDR3 memory control module and a 50MHz clock for other modules. The phase-locked loop module is implemented by the PL terminal; the DDR3 storage control module and the Ethernet communication module are implemented by the PS terminal. Furthermore, the specific method for denoising the data acquired by the ADC data a